C. Tuijn
- Mechanical Engineering top 10%
- Intermetallics and Advanced Alloy Properties 6
- High Temperature Alloys and Creep 5
- Thermodynamic and Structural Properties of Metals and Alloys 3
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- Microstructure and mechanical properties 4
- Aerospace Engineering top 10%
- Aluminum Alloy Microstructure Properties 3
- General Materials Science top 10%
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- Semiconductor materials and interfaces 4
- Surface and Thin Film Phenomena 4
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- Advanced Materials Characterization Techniques 4
C. Tuijn
26 papers receiving 426 citations
Peers
Comparison fields: 5 of 44
- Mechanical Engineering 296
- Materials Chemistry 254
- Aerospace Engineering 109
- Metals and Alloys 10
- General Materials Science 12
Countries citing papers authored by C. Tuijn
This map shows the geographic impact of C. Tuijn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Tuijn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Tuijn more than expected).
Fields of papers citing papers by C. Tuijn
This network shows the impact of papers produced by C. Tuijn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Tuijn. The network helps show where C. Tuijn may publish in the future.
Co-authorship network
The 5 scholars most cited alongside C. Tuijn, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 1 | |
| 2 | 2002 | 3 | |
| 3 | 2002 | 1 | |
| 4 | 2002 | 1 | |
| 5 | 2002 | 18 | |
| 6 | 2002 | 0 | |
| 7 | 2002 | 2 | |
| 8 | 2002 | 2 | |
| 9 | 2002 | 2 | |
| 10 | 2001 | 8 | |
| 11 | 2001 | 10 | |
| 12 | 1998 | 4 | |
| 13 | 1997 | 9 | |
| 14 | 1997 | 7 | |
| 15 | 1997 | 4 | |
| 16 | 1993 | 1 | |
| 17 | 1992 | 6 | |
| 18 | 1990 | 1 | |
| 19 | 1989 | 8 | |
| 20 | 1988 | 10 |
About C. Tuijn
C. Tuijn is a scholar working on Mechanical Engineering, Atomic and Molecular Physics, and Optics, Atmospheric Science, Fluid Flow and Transfer Processes and Materials Chemistry, having authored 28 papers that have together received 439 indexed citations. Recurring topics across this work include Intermetallics and Advanced Alloy Properties (6 papers), High Temperature Alloys and Creep (5 papers), Microstructure and mechanical properties (4 papers), Semiconductor materials and interfaces (4 papers), Advanced Materials Characterization Techniques (4 papers), Surface and Thin Film Phenomena (4 papers), Thermodynamic and Structural Properties of Metals and Alloys (3 papers) and Aluminum Alloy Microstructure Properties (3 papers). The work is most often cited by research in Mechanical Engineering (296 citations), Materials Chemistry (254 citations), Aerospace Engineering (109 citations), Metals and Alloys (10 citations) and General Materials Science (12 citations). C. Tuijn has collaborated with scholars based in Netherlands and Germany. Frequent co-authors include Gerhard Neumann, G. Neumann, H. Bakker, G. de Vries and Bob W. Kooi. Their work appears in journals such as Physica B Condensed Matter, Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum, physica status solidi (b), Journal of Physics Condensed Matter and Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.