C. E. Wickersham

1.1k total citations
39 papers, 823 citations indexed

About

C. E. Wickersham is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Mechanics of Materials. According to data from OpenAlex, C. E. Wickersham has authored 39 papers receiving a total of 823 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Materials Chemistry, 18 papers in Electrical and Electronic Engineering and 13 papers in Mechanics of Materials. Recurrent topics in C. E. Wickersham's work include Metal and Thin Film Mechanics (12 papers), Ion-surface interactions and analysis (8 papers) and Semiconductor materials and devices (7 papers). C. E. Wickersham is often cited by papers focused on Metal and Thin Film Mechanics (12 papers), Ion-surface interactions and analysis (8 papers) and Semiconductor materials and devices (7 papers). C. E. Wickersham collaborates with scholars based in United States, Switzerland and Israel. C. E. Wickersham's co-authors include J. E. Greene, J. E. Greene, J. L. Zilko, G. Bajor, Charles M. Macal, Thierry Emonet, Michael North, Philippe Cluzel, Dan Mao and Markus Gloeckler and has published in prestigious journals such as Nano Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

C. E. Wickersham

39 papers receiving 773 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. E. Wickersham United States 16 362 359 172 158 155 39 823
B. N. Chapman United Kingdom 12 293 0.8× 510 1.4× 306 1.8× 75 0.5× 93 0.6× 23 894
S. Fujiwara Japan 20 469 1.3× 204 0.6× 181 1.1× 53 0.3× 171 1.1× 77 1.1k
Julien Godet France 21 540 1.5× 411 1.1× 113 0.7× 225 1.4× 332 2.1× 51 1.2k
T. Farrell United Kingdom 18 268 0.7× 489 1.4× 69 0.4× 99 0.6× 568 3.7× 59 1.1k
V. P. Popov Russia 16 491 1.4× 608 1.7× 67 0.4× 230 1.5× 286 1.8× 221 1.2k
R. W. Pryor United States 13 729 2.0× 336 0.9× 242 1.4× 23 0.1× 135 0.9× 34 1.0k
Hao Su China 20 517 1.4× 322 0.9× 74 0.4× 82 0.5× 60 0.4× 50 977
B. Gale United Kingdom 15 206 0.6× 113 0.3× 127 0.7× 59 0.4× 107 0.7× 39 619
Mykhaylo Evstigneev Canada 18 226 0.6× 282 0.8× 165 1.0× 125 0.8× 450 2.9× 66 951
Daniel J. Ehrlich United States 22 183 0.5× 402 1.1× 136 0.8× 328 2.1× 165 1.1× 61 1.6k

Countries citing papers authored by C. E. Wickersham

Since Specialization
Citations

This map shows the geographic impact of C. E. Wickersham's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. E. Wickersham with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. E. Wickersham more than expected).

Fields of papers citing papers by C. E. Wickersham

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. E. Wickersham. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. E. Wickersham. The network helps show where C. E. Wickersham may publish in the future.

Co-authorship network of co-authors of C. E. Wickersham

This figure shows the co-authorship network connecting the top 25 collaborators of C. E. Wickersham. A scholar is included among the top collaborators of C. E. Wickersham based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. E. Wickersham. C. E. Wickersham is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wickersham, C. E. & Everett A. Lipman. (2018). Tracking DNA Synthesis with Single-Molecule Strand Displacement. The Journal of Physical Chemistry B. 122(49). 11546–11553. 1 indexed citations
2.
Mao, Dan, C. E. Wickersham, & Markus Gloeckler. (2014). Measurement of Chlorine Concentrations at CdTe Grain Boundaries. IEEE Journal of Photovoltaics. 4(6). 1655–1658. 30 indexed citations
3.
Wickersham, C. E., Kevin J. Cash, Shawn H. Pfeil, et al.. (2010). Tracking a Molecular Motor with a Nanoscale Optical Encoder. Nano Letters. 10(3). 1022–1027. 11 indexed citations
4.
Wickersham, C. E., et al.. (2010). Synthesis of Extended Nanoscale Optical Encoders. Bioconjugate Chemistry. 21(12). 2234–2238. 3 indexed citations
5.
Wickersham, C. E., et al.. (2006). Effect of grain orientation on tantalum magnetron sputtering yield. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 24(4). 1107–1111. 15 indexed citations
6.
Emonet, Thierry, Charles M. Macal, Michael North, C. E. Wickersham, & Philippe Cluzel. (2005). AgentCell: a digital single-cell assay for bacterial chemotaxis. Computer applications in the biosciences. 21(11). 2714–2721. 102 indexed citations
7.
Wickersham, C. E. & Zhiguo Zhang. (2005). Measurement of angular emission trajectories for magnetron-sputtered tantalum. Journal of Electronic Materials. 34(12). 1474–1479. 10 indexed citations
8.
Wickersham, C. E., et al.. (2001). Measurements of the critical inclusion size for arcing and macroparticle ejection from aluminum sputtering targets. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 19(6). 2767–2772. 10 indexed citations
9.
Wickersham, C. E., et al.. (1992). Particle contamination during sputter deposition of W–Ti films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 1713–1717. 12 indexed citations
10.
Wickersham, C. E., et al.. (1989). Drift in film thickness uniformity arising from sputtering target recrystallization. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 7(3). 2355–2358. 2 indexed citations
11.
Parikh, N.R., et al.. (1987). Characterization of titanium nitride films sputter deposited from a high-purity titanium nitride target. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 5(6). 1741–1747. 43 indexed citations
12.
Wickersham, C. E.. (1987). Crystallographic target effects in magnetron sputtering. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 5(4). 1755–1758. 25 indexed citations
13.
Wickersham, C. E., et al.. (1986). Impurity effects in magnetron sputter deposited tungsten films. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 4(6). 1339–1343. 9 indexed citations
14.
Wickersham, C. E., et al.. (1985). Summary Abstract: The effect of target temperature on reactive sputtering parameters. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 3(3). 581–582. 1 indexed citations
15.
Koba, R. & C. E. Wickersham. (1982). Temperature and thickness effects on the explosive crystallization of amorphous germanium films. Applied Physics Letters. 40(8). 672–675. 22 indexed citations
16.
Wickersham, C. E., G. Bajor, & J. E. Greene. (1978). Impulse stimulated “explosive” crystallization of sputter deposited amorphous (In,Ga)Sb films. Solid State Communications. 27(1). 17–20. 57 indexed citations
17.
Eltoukhy, A. H., J. L. Zilko, C. E. Wickersham, & J. E. Greene. (1977). Interlayer diffusion in InSb/GaSb superlattice structure grown by multitarget rf sputtering. Applied Physics Letters. 31(3). 156–158. 11 indexed citations
18.
Greene, J. E. & C. E. Wickersham. (1976). Structural and electrical characteristics of InSb thin films grown by rf sputtering. Journal of Applied Physics. 47(8). 3630–3639. 43 indexed citations
19.
Greene, J. E., C. E. Wickersham, J. L. Zilko, L. B. Welsh, & F. R. Szofran. (1976). Morphological and electrical properties of rf sputtered Y2O3-doped ZrO2 thin films. Journal of Vacuum Science and Technology. 13(1). 72–75. 25 indexed citations
20.
Greene, J. E., C. E. Wickersham, & J. L. Zilko. (1976). Growth of In1−xGaxSb and In1−xAlxSb films by mulsti target R.F. sputtering. Thin Solid Films. 32(1). 51–54. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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