B.W. Kempshall

832 total citations
17 papers, 532 citations indexed

About

B.W. Kempshall is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, B.W. Kempshall has authored 17 papers receiving a total of 532 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 9 papers in Materials Chemistry and 6 papers in Surfaces, Coatings and Films. Recurrent topics in B.W. Kempshall's work include Integrated Circuits and Semiconductor Failure Analysis (6 papers), Electron and X-Ray Spectroscopy Techniques (6 papers) and Microstructure and mechanical properties (4 papers). B.W. Kempshall is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (6 papers), Electron and X-Ray Spectroscopy Techniques (6 papers) and Microstructure and mechanical properties (4 papers). B.W. Kempshall collaborates with scholars based in United States and Canada. B.W. Kempshall's co-authors include Lucille A. Giannuzzi, Stephen Schwarz, B. I. Prenitzer, F. A. Stevie, Yongho Sohn, Sabine Schwarz, R. B. Irwin, Chongxuan Liu, John M. Zachara and James P. McKinley and has published in prestigious journals such as Geochimica et Cosmochimica Acta, Acta Materialia and Polymer.

In The Last Decade

B.W. Kempshall

17 papers receiving 514 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
B.W. Kempshall United States	13	202	178	130	96	85	17	532
René de Kloe United States	11	258 1.3×	53 0.3×	187 1.4×	19 0.2×	29 0.3×	25	493
J. L. Pouchou France	11	181 0.9×	79 0.4×	193 1.5×	36 0.4×	55 0.6×	26	469
S. Garbe Germany	15	187 0.9×	170 1.0×	93 0.7×	19 0.2×	19 0.2×	29	548
D. G. Howitt United States	17	686 3.4×	245 1.4×	61 0.5×	162 1.7×	19 0.2×	56	1.1k
R. K. Hart United States	9	262 1.3×	100 0.6×	76 0.6×	54 0.6×	93 1.1×	18	417
B. C. Valek United States	13	377 1.9×	406 2.3×	198 1.5×	23 0.2×	25 0.3×	23	942
R.J. Gaboriaud France	17	581 2.9×	275 1.5×	147 1.1×	95 1.0×	43 0.5×	70	850
John J. Friel United States	10	159 0.8×	50 0.3×	114 0.9×	14 0.1×	34 0.4×	37	453
Ashwin J. Shahani United States	15	478 2.4×	72 0.4×	293 2.3×	21 0.2×	257 3.0×	59	734
Harold E. Burdette United States	11	211 1.0×	38 0.2×	93 0.7×	15 0.2×	42 0.5×	38	413

Countries citing papers authored by B.W. Kempshall

Since Specialization

Citations

This map shows the geographic impact of B.W. Kempshall's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B.W. Kempshall with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B.W. Kempshall more than expected).

Fields of papers citing papers by B.W. Kempshall

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B.W. Kempshall. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B.W. Kempshall. The network helps show where B.W. Kempshall may publish in the future.

Co-authorship network of co-authors of B.W. Kempshall

This figure shows the co-authorship network connecting the top 25 collaborators of B.W. Kempshall. A scholar is included among the top collaborators of B.W. Kempshall based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B.W. Kempshall. B.W. Kempshall is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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17 of 17 papers shown

Henager, Charles H., Yongsoon Shin, Yigal D. Blum, et al.. (2007). Coatings and joining for SiC and SiC-composites for nuclear energy systems. Journal of Nuclear Materials. 367-370. 1139–1143. 40 indexed citations

McKinley, James P., et al.. (2006). Microscale controls on the fate of contaminant uranium in the vadose zone, Hanford Site, Washington. Geochimica et Cosmochimica Acta. 70(8). 1873–1887. 69 indexed citations

Kempshall, B.W., et al.. (2004). A microstructural observation of near-failure thermal barrier coating: a study by photostimulated luminescence spectroscopy and transmission electron microscopy. Thin Solid Films. 466(1-2). 128–136. 18 indexed citations

Subramanian, Ramesh, et al.. (2004). Microstructure of as-coated thermal barrier coatings with varying lifetimes. Surface and Coatings Technology. 177-178. 89–96. 23 indexed citations

Kempshall, B.W., et al.. (2004). Phase transformations of thermally grown oxide on (Ni,Pt)Al bondcoat during electron beam physical vapor deposition and subsequent oxidation. Surface and Coatings Technology. 177-178. 121–130. 30 indexed citations

Schwarz, Stephen, B.W. Kempshall, & Lucille A. Giannuzzi. (2003). Effects of diffusion induced recrystallization on volume diffusion in the copper-nickel system. Acta Materialia. 51(10). 2765–2776. 53 indexed citations

Schwarz, Stephen, et al.. (2003). Avoiding the Curtaining Effect: Backside Milling by FIB INLO. Microscopy and Microanalysis. 9(S02). 116–117. 16 indexed citations

Kempshall, B.W., B. I. Prenitzer, & L. A. Giannuzzi. (2002). Grain boundary segregation: equilibrium and non-equilibrium conditions. Scripta Materialia. 47(7). 447–451. 14 indexed citations

Kempshall, B.W. & Lucille A. Giannuzzi. (2002). In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials. Microscopy and Microanalysis. 8(S02). 390–391. 1 indexed citations

10.

Giannuzzi, Lucille A., et al.. (2002). FIB Lift-Out for Defect Analysis. 3 indexed citations

11.

Schwarz, Sabine, et al.. (2002). Electron backscattering diffraction investigation of focused ion beam surfaces. Journal of Electronic Materials. 31(1). 33–39. 66 indexed citations

12.

Kempshall, B.W., et al.. (2002). Comparative evaluation of protective coatings and focused ion beam chemical vapor deposition processes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 20(1). 286–290. 53 indexed citations

13.

Kempshall, B.W., et al.. (2002). FIB Damage in Silicon: Amorphization or Redeposition?. Microscopy and Microanalysis. 8(S02). 50–51. 28 indexed citations

14.

Kempshall, B.W., et al.. (2001). TEM of Sub-Micrometer Particles using the FIB Lift-Out Technique. Microscopy and Microanalysis. 7(S2). 950–951. 3 indexed citations

15.

Kempshall, B.W., Stephen Schwarz, B. I. Prenitzer, et al.. (2001). Ion channeling effects on the focused ion beam milling of Cu. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(3). 749–754. 73 indexed citations

16.

White, I.H., Yong‐Jin Pu, Miriam Rafailovich, et al.. (2001). Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates. Polymer. 42(4). 1613–1619. 41 indexed citations

17.

Prenitzer, B. I., B.W. Kempshall, Stephen Schwarz, Lucille A. Giannuzzi, & F. A. Stevie. (2000). Practical Aspects of FIB Milling: Understanding Ion Beam/Material Interactions. Microscopy and Microanalysis. 6(S2). 502–503. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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