B.T. Murray

1.4k total citations
38 papers, 952 citations indexed

About

B.T. Murray is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Software. According to data from OpenAlex, B.T. Murray has authored 38 papers receiving a total of 952 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Hardware and Architecture, 22 papers in Electrical and Electronic Engineering and 9 papers in Software. Recurrent topics in B.T. Murray's work include VLSI and Analog Circuit Testing (18 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers) and Radiation Effects in Electronics (13 papers). B.T. Murray is often cited by papers focused on VLSI and Analog Circuit Testing (18 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers) and Radiation Effects in Electronics (13 papers). B.T. Murray collaborates with scholars based in United States, United Kingdom and Australia. B.T. Murray's co-authors include John P. Hayes, Krishnendu Chakrabarty, V. Iyengar, Nagarajan Kandasamy, Joseph D’Ambrosio, Vikram Iyengar, Xiaobo Sharon Hu, Jian Liu, Sarah Pennington and Giorgio Rizzoni and has published in prestigious journals such as Computer, IEEE Transactions on Computers and SAE technical papers on CD-ROM/SAE technical paper series.

In The Last Decade

B.T. Murray

36 papers receiving 881 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
B.T. Murray United States	17	751	668	151	151	99	38	952
Jon Pérez Spain	13	313 0.4×	172 0.3×	131 0.9×	53 0.4×	77 0.8×	47	512
Lin Huang China	15	329 0.4×	256 0.4×	303 2.0×	34 0.2×	36 0.4×	48	639
Alberto Puggelli United States	13	195 0.3×	242 0.4×	77 0.5×	51 0.3×	35 0.4×	20	438
Claudio Pinello United States	16	511 0.7×	95 0.1×	206 1.4×	265 1.8×	43 0.4×	30	796
Cédric Wilwert France	4	271 0.4×	132 0.2×	181 1.2×	76 0.5×	18 0.2×	6	390
Philipp Mundhenk Germany	11	158 0.2×	215 0.3×	155 1.0×	49 0.3×	21 0.2×	23	384
Andrea Domenici Italy	10	156 0.2×	182 0.3×	73 0.5×	49 0.3×	30 0.3×	43	329
Abhijit Davare United States	12	347 0.5×	205 0.3×	176 1.2×	43 0.3×	23 0.2×	29	523
Ulf E. Larson Sweden	12	110 0.1×	454 0.7×	309 2.0×	54 0.4×	26 0.3×	26	635
Eric Barszcz United States	9	487 0.6×	112 0.2×	531 3.5×	56 0.4×	30 0.3×	19	703

Countries citing papers authored by B.T. Murray

Since Specialization

Citations

This map shows the geographic impact of B.T. Murray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B.T. Murray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B.T. Murray more than expected).

Fields of papers citing papers by B.T. Murray

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B.T. Murray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B.T. Murray. The network helps show where B.T. Murray may publish in the future.

Co-authorship network of co-authors of B.T. Murray

This figure shows the co-authorship network connecting the top 25 collaborators of B.T. Murray. A scholar is included among the top collaborators of B.T. Murray based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B.T. Murray. B.T. Murray is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Pennington, Sarah, et al.. (2009). Integrity-Checking Framework: An In-situ Testing and Validation Framework for Wireless Sensor and Actuator Networks. 575–579. 7 indexed citations

Murray, B.T., et al.. (2008). Dynamic Duty Cycle Control with Path and Zone Management in Wireless Sensor Networks. 1124–1129. 4 indexed citations

Kandasamy, Nagarajan, John P. Hayes, & B.T. Murray. (2005). Time-constrained failure diagnosis in distributed embedded systems: application to actuator diagnosis. IEEE Transactions on Parallel and Distributed Systems. 16(3). 258–270. 13 indexed citations

D’Ambrosio, Joseph, et al.. (2004). AN ADAPTABLE SOFTWARE SAFETY PROCESS FOR AUTOMOTIVE SAFETY-CRITICAL SYSTEMS. IN: CAE METHODS FOR VEHICLE CRASHWORTHINESS AND OCCUPANT SAFETY, AND SAFETY-CRITICAL SYSTEMS. 1 indexed citations

Hayes, John P., et al.. (2004). Low-cost on-line fault detection using control flow assertions. 137–143. 124 indexed citations

Chakrabarty, Krishnendu, B.T. Murray, & V. Iyengar. (2003). Built-in test pattern generation for high-performance circuits using twisted-ring counters. 22–27. 24 indexed citations

Kandasamy, Nagarajan, John P. Hayes, & B.T. Murray. (2003). Time-constrained failure diagnosis in distributed embedded systems. 449–458. 4 indexed citations

D’Ambrosio, Joseph, et al.. (2003). Identifying and Understanding Relevant System Safety Standards for use in the Automotive Industry. SAE technical papers on CD-ROM/SAE technical paper series. 1. 6 indexed citations

Kandasamy, Nagarajan, John P. Hayes, & B.T. Murray. (2003). Transparent recovery from intermittent faults in time-triggered distributed systems. IEEE Transactions on Computers. 52(2). 113–125. 68 indexed citations

10.

Iyengar, V., Krishnendu Chakrabarty, & B.T. Murray. (2002). Built-in self testing of sequential circuits using precomputed test sets. 418–423. 49 indexed citations

11.

Chakrabarty, Krishnendu, et al.. (2002). Test width compression for built-in self testing. 328–337. 18 indexed citations

12.

Iyengar, V., Krishnendu Chakrabarty, & B.T. Murray. (2002). Test set encoding for efficient sequential circuit testing. 2. 1442–1447.

13.

Murray, B.T., et al.. (2002). Diagnostic Strategies for Advanced Automotive Systems. 4 indexed citations

14.

D’Ambrosio, Joseph, et al.. (2001). A Comprehensive Hazard Analysis Technique for Safety-Critical Automotive Systems. SAE technical papers on CD-ROM/SAE technical paper series. 1. 15 indexed citations

15.

Murray, B.T., et al.. (2000). Smart Sensors for Future Robust Systems.

16.

Chakrabarty, Krishnendu, B.T. Murray, & V. Iyengar. (2000). Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 8(5). 633–636. 29 indexed citations

17.

Hayes, John P., et al.. (1998). Scalable Test Generators for High-Speed Datapath Circuits. Journal of Electronic Testing. 12(1-2). 111–125. 16 indexed citations

18.

Chakrabarty, Krishnendu & B.T. Murray. (1998). Design of built-in test generator circuits using width compression. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 17(10). 1044–1051. 29 indexed citations

19.

Murray, B.T. & John P. Hayes. (1996). Testing ICs: getting to the core of the problem. Computer. 29(11). 32–38. 72 indexed citations

20.

Bhattacharya, D., B.T. Murray, & John P. Hayes. (1989). High-level test generation for VLSI. Computer. 22(4). 16–24. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact