Benjamin M. Siegel
- Surfaces, Coatings and Films top 1%
- Structural Biology top 0.5%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics top 10%
- Electrical and Electronic Engineering
- Co-authors
- Timothy K. MaugelD. R. BeamanYoshinori FujiyoshiNatsu UyedaG. HansonE.J. KirklandLee H. VeneklasenEarl J. Kirkland
- Topics
- Electron and X-Ray Spectroscopy Techniques (31 papers)Advanced Electron Microscopy Techniques and Applications (30 papers)Advancements in Photolithography Techniques (14 papers)
- Partner nations
- United StatesSpainJapan
In The Last Decade
Benjamin M. Siegel
70 papers receiving 990 citations
Peers
Comparison fields: 5 of 94
- Surfaces, Coatings and Films 373
- Structural Biology 361
- Materials Chemistry 233
- Atomic and Molecular Physics, and Optics 223
- Electrical and Electronic Engineering 216
Countries citing papers authored by Benjamin M. Siegel
This map shows the geographic impact of Benjamin M. Siegel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Benjamin M. Siegel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Benjamin M. Siegel more than expected).
Fields of papers citing papers by Benjamin M. Siegel
This network shows the impact of papers produced by Benjamin M. Siegel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Benjamin M. Siegel. The network helps show where Benjamin M. Siegel may publish in the future.
Co-authorship network of co-authors of Benjamin M. Siegel
This figure shows the co-authorship network connecting the top 25 collaborators of Benjamin M. Siegel. A scholar is included among the top collaborators of Benjamin M. Siegel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Benjamin M. Siegel. Benjamin M. Siegel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 12 | |
| 4 | 0 | |
| 5 | DESIGN AND PRELIMINARY TEST OF THE 1500 MHZ NSLS-II PASSIVE SUPERCONDUCTING RF CAVITY | 4 |
| 6 | 4 | |
| 7 | 4 | |
| 8 | 15 | |
| 9 | 9 | |
| 10 | 1 | |
| 11 | 1 | |
| 12 | 30 | |
| 13 | 240 | |
| 14 | 3 | |
| 15 | 1 | |
| 16 | 11 | |
| 17 | 19 | |
| 18 | 6 | |
| 19 | 45 | |
| 20 | 11 |
About Benjamin M. Siegel
Benjamin M. Siegel is a scholar working on Structural Biology, Surfaces, Coatings and Films and Radiation, having authored 76 papers that have together received 1.1k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (31 papers), Advanced Electron Microscopy Techniques and Applications (30 papers) and Advancements in Photolithography Techniques (14 papers). The work is most often cited by research in Structural Biology (361 citations), Surfaces, Coatings and Films (373 citations) and Radiation (203 citations). Benjamin M. Siegel has collaborated with scholars based in United States, Spain and Japan. Frequent co-authors include Timothy K. Maugel, D. R. Beaman, Yoshinori Fujiyoshi, Natsu Uyeda, G. Hanson, E.J. Kirkland, Lee H. Veneklasen, Earl J. Kirkland, William Krakow and George C. Ruben. Their work appears in journals such as Journal of the American Chemical Society, Nucleic Acids Research and Nature Communications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.