Arthur J. Learn

679 total citations
37 papers, 538 citations indexed

About

Arthur J. Learn is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Arthur J. Learn has authored 37 papers receiving a total of 538 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 14 papers in Electronic, Optical and Magnetic Materials and 12 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Arthur J. Learn's work include Semiconductor materials and devices (22 papers), Copper Interconnects and Reliability (14 papers) and Semiconductor materials and interfaces (10 papers). Arthur J. Learn is often cited by papers focused on Semiconductor materials and devices (22 papers), Copper Interconnects and Reliability (14 papers) and Semiconductor materials and interfaces (10 papers). Arthur J. Learn collaborates with scholars based in United States. Arthur J. Learn's co-authors include I. H. Khan, T. I. Kamins, C. J. Dell'Oca, Ronald S. Nowicki, Dennis W. Hess, W.H. Shepherd, E. C. Crittenden, Robert W. Wallace, F.W. Schmidlin and James N. Cooper and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Proceedings of the IEEE.

In The Last Decade

Arthur J. Learn

37 papers receiving 471 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Arthur J. Learn United States 13 450 267 149 111 106 37 538
J.C. Blair United States 10 368 0.8× 211 0.8× 177 1.2× 104 0.9× 68 0.6× 14 442
Ronald S. Nowicki United States 10 255 0.6× 98 0.4× 150 1.0× 97 0.9× 125 1.2× 19 366
E. Andideh United States 14 461 1.0× 188 0.7× 149 1.0× 136 1.2× 127 1.2× 25 599
Ilan A. Blech United States 10 268 0.6× 78 0.3× 132 0.9× 159 1.4× 130 1.2× 16 453
T. Marieb United States 12 323 0.7× 321 1.2× 84 0.6× 143 1.3× 166 1.6× 45 522
S. Nishino Japan 11 403 0.9× 121 0.5× 62 0.4× 135 1.2× 66 0.6× 39 493
M. Mäenpää United States 14 378 0.8× 87 0.3× 264 1.8× 179 1.6× 107 1.0× 25 567
Andrew J. Trunek United States 13 488 1.1× 143 0.5× 120 0.8× 122 1.1× 57 0.5× 53 596
M. F. C. Willemsen Netherlands 13 429 1.0× 51 0.2× 124 0.8× 189 1.7× 139 1.3× 22 539
J. L. Farvacque France 15 354 0.8× 160 0.6× 325 2.2× 274 2.5× 78 0.7× 72 683

Countries citing papers authored by Arthur J. Learn

Since Specialization
Citations

This map shows the geographic impact of Arthur J. Learn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Arthur J. Learn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Arthur J. Learn more than expected).

Fields of papers citing papers by Arthur J. Learn

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Arthur J. Learn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Arthur J. Learn. The network helps show where Arthur J. Learn may publish in the future.

Co-authorship network of co-authors of Arthur J. Learn

This figure shows the co-authorship network connecting the top 25 collaborators of Arthur J. Learn. A scholar is included among the top collaborators of Arthur J. Learn based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Arthur J. Learn. Arthur J. Learn is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Learn, Arthur J., et al.. (1986). Deposition properties of silicon films formed from silane in a vertical-flow reactor. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 4(5). 1182–1186. 24 indexed citations
2.
Learn, Arthur J., et al.. (1985). Growth of borosilicate and borophosphosilicate films at low pressure and temperature. Thin Solid Films. 130(1-2). 103–111. 11 indexed citations
3.
Learn, Arthur J.. (1985). Phosphorus Incorporation Effects in Silicon Dioxide Grown at Low Pressure and Temperature. Journal of The Electrochemical Society. 132(2). 405–409. 9 indexed citations
4.
Learn, Arthur J. & Ronald S. Nowicki. (1979). Methods for minimizing silicon regrowth in aluminum films. Applied Physics Letters. 35(8). 611–614. 9 indexed citations
5.
Hess, Dennis W. & Arthur J. Learn. (1977). Effects of oxidation and nitrogen annealing on ion-implantation-induced interface states in the silicon–silicon dioxide system. Journal of Applied Physics. 48(2). 834–836. 1 indexed citations
6.
Learn, Arthur J. & Dennis W. Hess. (1977). Effects of ion implantation on charges in the silicon–silicon dioxide system. Journal of Applied Physics. 48(1). 308–312. 11 indexed citations
7.
Learn, Arthur J.. (1975). Effects of MOS Metallization Geometry and Processing on Mobile Impurities. Journal of The Electrochemical Society. 122(8). 1127–1132. 5 indexed citations
8.
Learn, Arthur J.. (1974). Electromigration effects in aluminum alloy metallization. Journal of Electronic Materials. 3(2). 531–552. 44 indexed citations
9.
Learn, Arthur J. & W.H. Shepherd. (1971). Reduction of Electromigration-Induced Failure in Aluminum Metallization Through Anodization. 129–134. 9 indexed citations
10.
Learn, Arthur J.. (1971). Effect of Redundant Microstructure on Electromigration-Induced Failure. Applied Physics Letters. 19(8). 292–295. 20 indexed citations
11.
Dell'Oca, C. J. & Arthur J. Learn. (1971). Anodization of aluminum to inhibit hillock growth during high temperature processing. Thin Solid Films. 8(5). R47–R50. 16 indexed citations
12.
Learn, Arthur J., et al.. (1970). LOW-TEMPERATURE EPITAXY OF β-SiC BY REACTIVE DEPOSITION. Applied Physics Letters. 17(1). 26–29. 25 indexed citations
13.
Learn, Arthur J., et al.. (1969). Chemical Processes in SiC Formation by Reactive Deposition and Chemical Conversion. Journal of Applied Physics. 40(1). 431–431. 16 indexed citations
14.
Khan, I. H. & Arthur J. Learn. (1969). FORMATION OF EPITAXIAL β-SiC FILMS ON SAPPHIRE. Applied Physics Letters. 15(12). 410–414. 14 indexed citations
15.
Learn, Arthur J., et al.. (1969). Reactive Deposition of Cubic Silicon Carbide. Journal of Applied Physics. 40(1). 430–430. 9 indexed citations
16.
Learn, Arthur J., et al.. (1968). Mobility studies of degenerate, indium-doped CdS evaporated films. Journal of Physics and Chemistry of Solids. 29(11). 2065–2068. 2 indexed citations
17.
Learn, Arthur J., et al.. (1968). Thin-Film CdS Diodes Heat Treated in Various Ambients. Journal of Applied Physics. 39(5). 2480–2482. 2 indexed citations
18.
Learn, Arthur J., et al.. (1968). Rectifying contacts under evaporated CdS. Proceedings of the IEEE. 56(1). 68–68. 1 indexed citations
19.
Learn, Arthur J., et al.. (1964). Superconductivity of Highly Agglomerated Indium Films. Journal of Applied Physics. 35(12). 3507–3511. 3 indexed citations
20.
Learn, Arthur J., et al.. (1963). Vapor Sources for Vacuum Deposition of Superconductive Thin-Film Circuitry. Review of Scientific Instruments. 34(2). 179–182. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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