A.P. Kobzev

504 total citations
61 papers, 394 citations indexed

About

A.P. Kobzev is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Computational Mechanics. According to data from OpenAlex, A.P. Kobzev has authored 61 papers receiving a total of 394 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Materials Chemistry, 25 papers in Electrical and Electronic Engineering and 15 papers in Computational Mechanics. Recurrent topics in A.P. Kobzev's work include Semiconductor materials and devices (16 papers), Ion-surface interactions and analysis (14 papers) and Thin-Film Transistor Technologies (9 papers). A.P. Kobzev is often cited by papers focused on Semiconductor materials and devices (16 papers), Ion-surface interactions and analysis (14 papers) and Thin-Film Transistor Technologies (9 papers). A.P. Kobzev collaborates with scholars based in Russia, Slovakia and Poland. A.P. Kobzev's co-authors include J. Huran, A.D. Pogrebnjak, Yu. N. Tyurin, M. Turek, D. Machajdı́k, О.В. Колисниченко, Yu. F. Ivanov, G. N. Dudkin, Yu. Zh. Tuleushev and Š. Gaži and has published in prestigious journals such as Journal of Applied Physics, Applied Surface Science and Thin Solid Films.

In The Last Decade

A.P. Kobzev

58 papers receiving 378 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A.P. Kobzev Russia 12 160 112 103 75 64 61 394
Runze Qi China 12 118 0.7× 111 1.0× 86 0.8× 127 1.7× 82 1.3× 65 394
Masao Hashiba Japan 10 259 1.6× 93 0.8× 69 0.7× 42 0.6× 77 1.2× 49 430
Ryoya Ishigami Japan 10 136 0.8× 124 1.1× 40 0.4× 78 1.0× 104 1.6× 63 412
Peter Karduck Germany 12 339 2.1× 73 0.7× 117 1.1× 69 0.9× 36 0.6× 42 508
M. Stadlbauer Germany 12 129 0.8× 66 0.6× 245 2.4× 47 0.6× 122 1.9× 21 359
L. Funk United States 11 231 1.4× 63 0.6× 60 0.6× 70 0.9× 60 0.9× 25 408
D. Nir Israel 12 193 1.2× 81 0.7× 187 1.8× 62 0.8× 114 1.8× 40 439
J. Le Héricy France 11 152 0.9× 102 0.9× 99 1.0× 46 0.6× 142 2.2× 20 395
R. S. Brusa Italy 12 145 0.9× 173 1.5× 164 1.6× 25 0.3× 84 1.3× 31 367
T. Rao United States 14 106 0.7× 261 2.3× 30 0.3× 121 1.6× 215 3.4× 54 643

Countries citing papers authored by A.P. Kobzev

Since Specialization
Citations

This map shows the geographic impact of A.P. Kobzev's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.P. Kobzev with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.P. Kobzev more than expected).

Fields of papers citing papers by A.P. Kobzev

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.P. Kobzev. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.P. Kobzev. The network helps show where A.P. Kobzev may publish in the future.

Co-authorship network of co-authors of A.P. Kobzev

This figure shows the co-authorship network connecting the top 25 collaborators of A.P. Kobzev. A scholar is included among the top collaborators of A.P. Kobzev based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.P. Kobzev. A.P. Kobzev is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Huran, J., et al.. (2017). HWCVD of B-doped silicon carbide thin films for SHJ solar cell technology. Integrated ferroelectrics. 184(1). 23–31. 1 indexed citations
2.
Khiem, L. H., et al.. (2016). Analytical Possibilities of Rutherford Backscattering Spectrometry and Elastic Recoil Detection Analysis Methods. Communications in Physics. 26(1). 83–83. 2 indexed citations
3.
Шилова, О. А., et al.. (2016). Composition, structure, and morphology of the surface of nanodimensional platinum-containing films obtained from sols. Glass Physics and Chemistry. 42(1). 78–86. 5 indexed citations
4.
Huran, J., et al.. (2014). Transmission photocathodes based on stainless steel mesh coated with deuterated diamond like carbon films. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 753. 14–18. 2 indexed citations
5.
Kobzev, A.P.. (2014). On the radiation mechanism of a uniformly moving charge. Physics of Particles and Nuclei. 45(3). 628–653. 7 indexed citations
6.
Bystritsky, V. M., A.P. Kobzev, A. R. Krylov, et al.. (2013). Study of the d(p, γ)3He reaction at ultralow energies using a zirconium deuteride target. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 737. 248–252. 14 indexed citations
7.
8.
Bystritsky, V. M., G. N. Dudkin, M. Filipowicz, et al.. (2012). Measurement of astrophysical S factors and electron screening potentials for d(d, n)3He reaction In ZrD2, TiD2, D2O, and CD2 targets in the ultralow energy region using plasma accelerators. Physics of Atomic Nuclei. 75(1). 53–62. 14 indexed citations
9.
Krzyżanowska, Halina, et al.. (2008). Hydrogen and oxygen concentration analysis of porous silicon. Journal of Non-Crystalline Solids. 354(35-39). 4367–4374. 4 indexed citations
10.
11.
Fröhlich, K., K. Hušeková, D. Machajdı́k, et al.. (2004). Preparation of SrRuO3 films for advanced CMOS metal gates. Materials Science in Semiconductor Processing. 7(4-6). 265–269. 12 indexed citations
12.
Kobzev, A.P., et al.. (2003). RBS and ERD study of epitaxial RuO2 films deposited on different single crystal substrates. Vacuum. 70(2-3). 313–317. 2 indexed citations
13.
Pogrebnyak, A. D., Yu. N. Tyurin, & A.P. Kobzev. (2001). High-speed plasma jet modification and doping of α-Fe. Technical Physics Letters. 27(8). 619–621. 9 indexed citations
14.
Данилова, Е. А., et al.. (2000). Nuclear-physical investigations of the accumulation of elements in some types of plants. Atomic Energy. 88(1). 70–73. 1 indexed citations
15.
Kobzev, A.P.. (1999). Element depth profiling of implanted samples. Nukleonika. 44(2). 309–316. 1 indexed citations
16.
Данилова, Е. А., et al.. (1999). Nuclear-physical investigations of the elemental composition of soils in several preserved territories in Uzbekistan. Atomic Energy. 86(1). 74–78. 3 indexed citations
17.
Pogrebnjak, A.D., et al.. (1999). Effect of Fe and Zr Ion Implantation and High-Current Electron Beam Treatment on Chemical and Mechanical Properties of Ti–V–Al Alloy. Japanese Journal of Applied Physics. 38(3A). L248–L248. 7 indexed citations
18.
Kobzev, A.P., et al.. (1994). Changes in depth profiles of oxygen and copper in Y-Ba-Cu-O film under annealing. Microchimica Acta. 114-115(1). 239–245. 1 indexed citations
19.
20.
Kobzev, A.P. & I.M. Frank. (1980). SPECTRAL DEPENDENCE OF HALF WIDTH OF ANGULAR DISTRIBUTIONS OF VAVILOV-CERENKOV RADIATION. (IN RUSSIAN). 31. 1253–1258. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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