Alfredo Pasquarello
About
In The Last Decade
Alfredo Pasquarello
349 papers receiving 18.5k citations
Hit Papers
Peers
Comparison fields: 5 of 117
- Materials Chemistry 11.2k
- Electrical and Electronic Engineering 8.9k
- Atomic and Molecular Physics, and Optics 5.8k
- Electronic, Optical and Magnetic Materials 2.5k
- Ceramics and Composites 2.4k
Countries citing papers authored by Alfredo Pasquarello
This map shows the geographic impact of Alfredo Pasquarello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alfredo Pasquarello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alfredo Pasquarello more than expected).
Fields of papers citing papers by Alfredo Pasquarello
This network shows the impact of papers produced by Alfredo Pasquarello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alfredo Pasquarello. The network helps show where Alfredo Pasquarello may publish in the future.
Co-authorship network of co-authors of Alfredo Pasquarello
This figure shows the co-authorship network connecting the top 25 collaborators of Alfredo Pasquarello. A scholar is included among the top collaborators of Alfredo Pasquarello based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alfredo Pasquarello. Alfredo Pasquarello is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 8 | |
| 3 | 8 | |
| 4 | 3 | |
| 5 | 11 | |
| 6 | 9 | |
| 7 | 20 | |
| 8 | 64 | |
| 9 | 4 | |
| 10 | 4 | |
| 11 | 54 | |
| 12 | Energy levels of candidate defects at SiC/SiO$_2$ interfaces | 2 |
| 13 | 145 | |
| 14 | 1 | |
| 15 | 59 | |
| 16 | 57 | |
| 17 | 121 | |
| 18 | 304 | |
| 19 | Pressure Induced Transitions in SiO_2 | 0 |
| 20 | Cu(001)表面におけるCuアドアトムの拡散機構 | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.