Akira Kusano
- Computer Vision and Pattern Recognition
- Media Technology
- Industrial and Manufacturing Engineering
- Civil and Structural Engineering
- Computational Mechanics
- Topics
- Industrial Vision Systems and Defect Detection (5 papers)Image Processing Techniques and Applications (4 papers)Optical measurement and interference techniques (3 papers)
- Cited by
- Media TechnologyIndustrial and Manufacturing EngineeringComputer Vision and Pattern Recognition
- Journals
- Machine Vision and ApplicationsIEEJ Transactions on Industry ApplicationsElectronics and Communications in Japan
- Partner nations
- Japan
In The Last Decade
Akira Kusano
3 papers receiving 7 citations
Peers
Comparison fields: 5 of 7
- Computer Vision and Pattern Recognition 5
- Media Technology 5
- Industrial and Manufacturing Engineering 4
- Civil and Structural Engineering 1
- Computational Mechanics 1
Countries citing papers authored by Akira Kusano
This map shows the geographic impact of Akira Kusano's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Akira Kusano with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Akira Kusano more than expected).
Fields of papers citing papers by Akira Kusano
This network shows the impact of papers produced by Akira Kusano. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Akira Kusano. The network helps show where Akira Kusano may publish in the future.
Co-authorship network of co-authors of Akira Kusano
This figure shows the co-authorship network connecting the top 25 collaborators of Akira Kusano. A scholar is included among the top collaborators of Akira Kusano based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Akira Kusano. Akira Kusano is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 3D Precise Inspection of Electronic Devices by Single Stereo Vision | 1 |
| 5 | 0 | |
| 6 | 0 | |
| 7 | A PROPOSAL OF 3D MEASURING METHOD BY MEANS OF A SINGLE CAMERA AND ITS APPLICATION TO PRECISE BASELINE DETECTION ALGORITHM FOR ELECTRONIC DEVICE INSPECTION | 5 |
About Akira Kusano
Akira Kusano is a scholar working on Industrial and Manufacturing Engineering, Media Technology and Computer Vision and Pattern Recognition, having authored 7 papers that have together received 7 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (5 papers), Image Processing Techniques and Applications (4 papers) and Optical measurement and interference techniques (3 papers). The work is most often cited by research in Media Technology (5 citations), Industrial and Manufacturing Engineering (4 citations) and Computer Vision and Pattern Recognition (5 citations). Akira Kusano has collaborated with scholars based in Japan. Frequent co-authors include Hiroyasu Koshimizu, Takashi Watanabe and Takayuki Fujiwara. Their work appears in journals such as Machine Vision and Applications, IEEJ Transactions on Industry Applications and Electronics and Communications in Japan.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.