A.E. Ennos

2.5k total citations
48 papers, 1.6k citations indexed

About

A.E. Ennos is a scholar working on Computer Vision and Pattern Recognition, Computational Mechanics and Mechanical Engineering. According to data from OpenAlex, A.E. Ennos has authored 48 papers receiving a total of 1.6k indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Computer Vision and Pattern Recognition, 16 papers in Computational Mechanics and 13 papers in Mechanical Engineering. Recurrent topics in A.E. Ennos's work include Optical measurement and interference techniques (25 papers), Surface Roughness and Optical Measurements (15 papers) and Advanced Measurement and Metrology Techniques (13 papers). A.E. Ennos is often cited by papers focused on Optical measurement and interference techniques (25 papers), Surface Roughness and Optical Measurements (15 papers) and Advanced Measurement and Metrology Techniques (13 papers). A.E. Ennos collaborates with scholars based in United Kingdom, United States and Germany. A.E. Ennos's co-authors include E. Archbold, J.M. Burch, B. Gale, Guillermo H. Kaufmann, Rosemarie Wilton, Dudley Williams, David Robinson, K.G. Birch and M.E. Haine and has published in prestigious journals such as Nature, Wear and Journal of the Optical Society of America A.

In The Last Decade

A.E. Ennos

47 papers receiving 1.4k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
A.E. Ennos United Kingdom	16	655	526	453	411	403	48	1.6k
John H. Bruning United States	11	888 1.4×	301 0.6×	520 1.1×	477 1.2×	615 1.5×	30	1.7k
R. S. Sirohi India	19	737 1.1×	273 0.5×	329 0.7×	378 0.9×	731 1.8×	143	1.5k
James E. Harvey United States	24	528 0.8×	978 1.9×	607 1.3×	372 0.9×	648 1.6×	141	2.1k
Tomoaki Eiju Japan	13	689 1.1×	264 0.5×	285 0.6×	395 1.0×	384 1.0×	46	1.2k
Mourad Idir United States	26	878 1.3×	414 0.8×	603 1.3×	779 1.9×	496 1.2×	140	2.4k
A. D. White Japan	12	835 1.3×	236 0.4×	522 1.2×	456 1.1×	632 1.6×	26	1.5k
Johannes Schwider Germany	24	1.7k 2.6×	633 1.2×	692 1.5×	1.0k 2.5×	882 2.2×	145	2.5k
Giuseppe Molesini Italy	15	270 0.4×	184 0.3×	237 0.5×	247 0.6×	232 0.6×	107	851
Peter Lehmann Germany	23	655 1.0×	459 0.9×	299 0.7×	746 1.8×	280 0.7×	152	1.7k
Dov Rosenfeld Australia	10	943 1.4×	247 0.5×	220 0.5×	427 1.0×	414 1.0×	18	1.4k

Countries citing papers authored by A.E. Ennos

Since Specialization

Citations

This map shows the geographic impact of A.E. Ennos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.E. Ennos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.E. Ennos more than expected).

Fields of papers citing papers by A.E. Ennos

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.E. Ennos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.E. Ennos. The network helps show where A.E. Ennos may publish in the future.

Co-authorship network of co-authors of A.E. Ennos

This figure shows the co-authorship network connecting the top 25 collaborators of A.E. Ennos. A scholar is included among the top collaborators of A.E. Ennos based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.E. Ennos. A.E. Ennos is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Ennos, A.E.. (1994). Speckle metrology. Optics & Laser Technology. 26(5). 371–372. 1 indexed citations

Ennos, A.E.. (1988). Practical holography II. Optics & Laser Technology. 20(4). 216–216. 1 indexed citations

Ennos, A.E., David Robinson, & Dudley Williams. (1985). Automatic Fringe Analysis in Holographic Interferometry. Journal of Modern Optics. 32(2). 135–145. 9 indexed citations

Ennos, A.E., et al.. (1982). Laser Speckle Photography As A Practical Alternative To Holographic Interferometry For Measuring Plate Deformation. Optical Engineering. 21(3). 4 indexed citations

Kaufmann, Guillermo H., et al.. (1979). Electro-optical read-out system for analysis of speckle photographs (A). Journal of the Optical Society of America A. 69. 1422. 1 indexed citations

Archbold, E., et al.. (1978). <title>Speckle Photography For Strain Measurement - A Critical Assessment</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 136. 258–265. 10 indexed citations

Ennos, A.E., et al.. (1975). Laser photography to measure the deformation of weld cracks under load. Non-Destructive Testing. 8(4). 181–184. 7 indexed citations

Archbold, E., J.M. Burch, & A.E. Ennos. (1970). Recording of In-plane Surface Displacement by Double-exposure Speckle Photography. Optica Acta International Journal of Optics. 17(12). 883–898. 211 indexed citations

Archbold, E., et al.. (1970). A Laser Speckle Interferometer for the Detection of Surface Movements and Vibration. 265. 2 indexed citations

10.

Ennos, A.E. & K.G. Birch. (1969). Symposium on Applications of Coherent Light. Optica Acta International Journal of Optics. 16(2). 259–263. 1 indexed citations

11.

Ennos, A.E.. (1969). Holography-State of the Art Review 1969. Optica Acta International Journal of Optics. 16(6). 811–811. 2 indexed citations

12.

Ennos, A.E.. (1968). Optics. Journal of Physics E Scientific Instruments. 1(8). 805–807. 1 indexed citations

13.

Ennos, A.E.. (1967). Holography and its applications. Contemporary Physics. 8(2). 153–170. 11 indexed citations

14.

Ennos, A.E.. (1966). Stresses Developed in Optical Film Coatings. Applied Optics. 5(1). 51–51. 162 indexed citations

15.

Ennos, A.E.. (1963). A simple variable retardation plate for polarized light. Journal of Scientific Instruments. 40(6). 316–317. 2 indexed citations

16.

Ennos, A.E.. (1960). Preparation of Phase Diffraction Gratings by Vacuum Evaporation. Journal of the Optical Society of America. 50(1). 14–14. 3 indexed citations

17.

Haine, M.E., et al.. (1958). Image intensifier for the electron microscope. Journal of Scientific Instruments. 35(12). 466–467. 4 indexed citations

18.

Ennos, A.E.. (1957). Highly-conducting gold films prepared by vacuum evaporation. British Journal of Applied Physics. 8(3). 113–117. 37 indexed citations

19.

Ennos, A.E.. (1954). The sources of electron-induced contamination in kinetic vacuum systems. British Journal of Applied Physics. 5(1). 27–31. 114 indexed citations

20.

Ennos, A.E.. (1953). The origin of specimen contamination in the electron microscope. British Journal of Applied Physics. 4(4). 101–106. 175 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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