A.E. Ennos
- Structural Biology top 5%
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 3
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- Optical measurement and interference techniques 25
- Computational Mechanics top 2%
- Surface Roughness and Optical Measurements 15
- Media Technology top 2%
- Image Processing Techniques and Applications 5
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- Advanced Measurement and Metrology Techniques 13
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- Optical Polarization and Ellipsometry 4
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- Digital Holography and Microscopy 3
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- Calibration and Measurement Techniques 3
- Co-authors
- E. ArchboldJ.M. BurchB. GaleGuillermo H. KaufmannRosemarie WiltonDudley WilliamsDavid RobinsonK.G. Birch
- Partner nations
- United KingdomUnited StatesGermany
In The Last Decade
A.E. Ennos
47 papers receiving 1.4k citations
Peers
Comparison fields: 5 of 92
- Structural Biology 53
- Surfaces, Coatings and Films 229
- Computer Vision and Pattern Recognition 655
- Computational Mechanics 526
- Media Technology 184
Countries citing papers authored by A.E. Ennos
This map shows the geographic impact of A.E. Ennos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.E. Ennos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.E. Ennos more than expected).
Fields of papers citing papers by A.E. Ennos
This network shows the impact of papers produced by A.E. Ennos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.E. Ennos. The network helps show where A.E. Ennos may publish in the future.
Co-authorship network
The 9 scholars most cited alongside A.E. Ennos, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1994 | 1 | |
| 2 | 1988 | 1 | |
| 3 | 1985 | 9 | |
| 4 | 1982 | 4 | |
| 5 | 1982 | 96 | |
| 6 | Electro-optical read-out system for analysis of speckle photographs (A) | 1979 | 1 |
| 7 | 1978 | 10 | |
| 8 | 1975 | 7 | |
| 9 | 1974 | 1 | |
| 10 | 1970 | 211 | |
| 11 | 1970 | 16 | |
| 12 | 1969 | 1 | |
| 13 | 1969 | 43 | |
| 14 | 1967 | 11 | |
| 15 | 1966 | 162 | |
| 16 | 1963 | 2 | |
| 17 | 1960 | 3 | |
| 18 | 1958 | 4 | |
| 19 | 1954 | 114 | |
| 20 | 1953 | 175 |
About A.E. Ennos
A.E. Ennos is a scholar working on Computer Vision and Pattern Recognition, Media Technology and Surfaces, Coatings and Films, having authored 48 papers that have together received 1.6k indexed citations. Recurring topics across this work include Optical measurement and interference techniques (25 papers), Surface Roughness and Optical Measurements (15 papers), Advanced Measurement and Metrology Techniques (13 papers), Image Processing Techniques and Applications (5 papers), Optical Polarization and Ellipsometry (4 papers), Digital Holography and Microscopy (3 papers), Electron and X-Ray Spectroscopy Techniques (3 papers) and Calibration and Measurement Techniques (3 papers). The work is most often cited by research in Structural Biology (53 citations), Surfaces, Coatings and Films (229 citations) and Computer Vision and Pattern Recognition (655 citations). A.E. Ennos has collaborated with scholars based in United Kingdom, United States and Germany. Frequent co-authors include E. Archbold, J.M. Burch, B. Gale, Guillermo H. Kaufmann, Rosemarie Wilton, Dudley Williams, David Robinson, K.G. Birch and M.E. Haine. Their work appears in journals such as Optics & Laser Technology, Nature, Optics Communications, Wear and Journal of the Optical Society of America A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.