J.M. Burch

About

J.M. Burch is a scholar working on Computer Vision and Pattern Recognition, Mechanical Engineering and Electrical and Electronic Engineering. According to data from OpenAlex, J.M. Burch has authored 33 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Computer Vision and Pattern Recognition, 9 papers in Mechanical Engineering and 7 papers in Electrical and Electronic Engineering. Recurrent topics in J.M. Burch’s work include Optical measurement and interference techniques (13 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (6 papers). J.M. Burch is often cited by papers focused on Optical measurement and interference techniques (13 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (6 papers). J.M. Burch collaborates with scholars based in United Kingdom, United States and China. J.M. Burch's co-authors include Walter Stiles, A.E. Ennos, E. Archbold, Andrea Di Falco, C. Forno, Ifor D. W. Samuel, Jonathon R. Harwell, Malte C. Gather, D. C. Williams and Xianzhong Chen and has published in prestigious journals such as Nature, ACS Nano and Applied Physics Letters.

In The Last Decade

Co-authorship network of co-authors of J.M. Burch i

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Fields of papers citing papers by J.M. Burch

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.M. Burch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.M. Burch. The network helps show where J.M. Burch may publish in the future.

Countries citing papers authored by J.M. Burch

Since Specialization

Citations

This map shows the geographic impact of J.M. Burch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.M. Burch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.M. Burch more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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