Abhijit Gurav

995 total citations · 1 hit paper
29 papers, 799 citations indexed

About

Abhijit Gurav is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Abhijit Gurav has authored 29 papers receiving a total of 799 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Electrical and Electronic Engineering, 19 papers in Materials Chemistry and 6 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Abhijit Gurav's work include Semiconductor materials and devices (18 papers), Ferroelectric and Piezoelectric Materials (12 papers) and Copper Interconnects and Reliability (6 papers). Abhijit Gurav is often cited by papers focused on Semiconductor materials and devices (18 papers), Ferroelectric and Piezoelectric Materials (12 papers) and Copper Interconnects and Reliability (6 papers). Abhijit Gurav collaborates with scholars based in United States, Greece and Finland. Abhijit Gurav's co-authors include Toivo T. Kodas, Yun Xiong, Tammy Pluym, Clive A. Randall, Elizabeth C. Dickey, Esko I. Kauppinen, Philip Lessner, J. Joutsensaari, Pascal Pinceloup and T Valmari and has published in prestigious journals such as Chemistry of Materials, IEEE Transactions on Industrial Electronics and Chemical Physics Letters.

In The Last Decade

Abhijit Gurav

25 papers receiving 731 citations

Hit Papers

Aerosol Processing of Materials 1993 2026 2004 2015 1993 100 200 300 400
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Aerosol Processing of Materials
    1993 460 citations Abhijit Gurav, Toivo T. Kodas et al. Aerosol Science and Technology profile →

Peers

Abhijit Gurav
Adrian Camenzind Switzerland
Florian Meierhofer Germany
Sergey D. Shandakov Russia
Rainer Jossen Switzerland
Mikko Aromaa Finland
Esther Hontañón Spain
Benoît Lescop France
Dezhao Huang United States
Martin C. Heine Switzerland
Barbara Kościelska Poland
Adrian Camenzind Switzerland
Abhijit Gurav
Citations per year, relative to Abhijit Gurav Abhijit Gurav (= 1×) peers Adrian Camenzind

Countries citing papers authored by Abhijit Gurav

Since Specialization
Citations

This map shows the geographic impact of Abhijit Gurav's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Abhijit Gurav with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Abhijit Gurav more than expected).

Fields of papers citing papers by Abhijit Gurav

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Abhijit Gurav. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Abhijit Gurav. The network helps show where Abhijit Gurav may publish in the future.

Co-authorship network of co-authors of Abhijit Gurav

This figure shows the co-authorship network connecting the top 25 collaborators of Abhijit Gurav. A scholar is included among the top collaborators of Abhijit Gurav based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Abhijit Gurav. Abhijit Gurav is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gurav, Abhijit, et al.. (2018). Robust Reliability of Ceramic Capacitors for Power Electronics. Additional Conferences (Device Packaging HiTEC HiTEN & CICMT). 2018(HiTEC). 138–142. 2 indexed citations
2.
Templeton, Allen C., et al.. (2017). A Comparison Between Solders & Transient Liquid Phase Sintered Interconnects in High Temperature Multilayer Ceramic Capacitors. Journal of Microelectronics and Electronic Packaging. 14(4). 150–157. 2 indexed citations
3.
Gurav, Abhijit, et al.. (2016). C0G and X7R Ceramic Capacitors for High Temperature Applications. Additional Conferences (Device Packaging HiTEC HiTEN & CICMT). 2016(HiTEC). 290–298. 1 indexed citations
4.
Gurav, Abhijit, et al.. (2015). Advances in Ceramic Capacitors for High Temperature Applications. Additional Conferences (Device Packaging HiTEC HiTEN & CICMT). 2015(HiTEN). 134–141. 2 indexed citations
5.
Gurav, Abhijit, et al.. (2014). Class-I and Class-II Ceramic Capacitors for High Temperature Applications. Additional Conferences (Device Packaging HiTEC HiTEN & CICMT). 2014(HITEC). 121–128.
6.
Gurav, Abhijit, et al.. (2014). Stacked Ceramic Capacitors for High Temperatures (≥200°C). Journal of Microelectronics and Electronic Packaging. 11(4). 166–173. 5 indexed citations
7.
Gurav, Abhijit, et al.. (2013). High Temperature Ceramic Capacitors for Deep Well Applications. 8 indexed citations
8.
Torres, Glenda, et al.. (2013). High Voltage Multi-Layer Ceramic Capacitors for Use at High Temperatures. 3 indexed citations
9.
Gurav, Abhijit, et al.. (2011). Electrode Defects in Multilayer Capacitors Part I: Modeling the Effect of Electrode Roughness and Porosity on Electric Field Enhancement and Leakage Current. Journal of the American Ceramic Society. 95(1). 257–263. 46 indexed citations
10.
Gurav, Abhijit, et al.. (2010). Robust BME Class-I MLCCs for Harsh-Environment Applications. IEEE Transactions on Industrial Electronics. 58(7). 2636–2643. 47 indexed citations
11.
Gurav, Abhijit, et al.. (2009). Robust Class-I Dielectric for High Temperature Applications. 9–21. 8 indexed citations
12.
Polotai, Anton V., et al.. (2008). Effect of Cr additions on the electrical properties of Ni–BaTiO3 ultra-thin multilayer capacitors. Journal of Electroceramics. 23(1). 6–12. 16 indexed citations
13.
Gurav, Abhijit, et al.. (2008). Advances in Class-I C0G MLCC and SMD Film Capacitors. 8 indexed citations
14.
Pinceloup, Pascal, et al.. (2006). High Reliability Thin Layer BME X7R Dielectric with Only Few Core-Shell Grains. 1. 17–20. 1 indexed citations
15.
Gurav, Abhijit, et al.. (2003). Lifetime Modeling of Sub 2 Micron Dielectric Thickness BME MLCC. 10 indexed citations
16.
Gurav, Abhijit. (1998). Aerosol processing of materials: Aerosol dynamics and microstructure evolution. PhDT. 4 indexed citations
17.
Kauppinen, Esko I., T Valmari, Petri Ahonen, et al.. (1998). The ash formation during co-combustion of wood and sludge in industrial fluidized bed boilers. Fuel Processing Technology. 54(1-3). 79–94. 35 indexed citations
18.
Gurav, Abhijit, et al.. (1995). Gas-phase particle size distributions and lead loss during spray pyrolysis of (Bi,Pb)–Sr–Ca–Cu–O. Journal of materials research/Pratt's guide to venture capital sources. 10(7). 1644–1652. 6 indexed citations
19.
Gurav, Abhijit, Toivo T. Kodas, Tammy Pluym, & Yun Xiong. (1993). Aerosol Processing of Materials. Aerosol Science and Technology. 19(4). 411–452. 460 indexed citations breakdown →
20.
Gurav, Abhijit, et al.. (1993). Synthesis of fullerene-rhodium nanocomposites via aerosol decomposition. Chemistry of Materials. 5(2). 214–216. 25 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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