A. Saïdane
- Software top 5%
-
- Silicon Carbide Semiconductor Technologies 8
- Semiconductor materials and devices 6
- Electromagnetic Simulation and Numerical Methods 5
- Advancements in Semiconductor Devices and Circuit Design 5
- Integrated Circuits and Semiconductor Failure Analysis 4
- Statistics and Probability top 10%
-
- Induction Heating and Inverter Technology 7
-
- Semiconductor materials and interfaces 6
-
- Thermoelastic and Magnetoelastic Phenomena 6
A. Saïdane
45 papers receiving 725 citations
Peers
Comparison fields: 5 of 99
- Software 86
- Safety, Risk, Reliability and Quality 170
- Statistics, Probability and Uncertainty 112
- Electrical and Electronic Engineering 306
- Statistics and Probability 43
Countries citing papers authored by A. Saïdane
This map shows the geographic impact of A. Saïdane's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Saïdane with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Saïdane more than expected).
Fields of papers citing papers by A. Saïdane
This network shows the impact of papers produced by A. Saïdane. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Saïdane. The network helps show where A. Saïdane may publish in the future.
Co-authorship network
The 17 scholars most cited alongside A. Saïdane, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 1 | |
| 2 | 2018 | 1 | |
| 3 | 2018 | 3 | |
| 4 | 2018 | 1 | |
| 5 | 2017 | 37 | |
| 6 | 2015 | 0 | |
| 7 | Transmission Line Matrix: A Tool for ModelingThermo-Electric properties of Materials and Devices | 2012 | 0 |
| 8 | 2011 | 36 | |
| 9 | Applications of InAs Hall Effect Sensors | 2010 | 0 |
| 10 | 2009 | 12 | |
| 11 | 2008 | 2 | |
| 12 | 2004 | 3 | |
| 13 | 2003 | 1 | |
| 14 | 2002 | 6 | |
| 15 | 2001 | 3 | |
| 16 | 2001 | 2 | |
| 17 | 2001 | 200 | |
| 18 | 2000 | 0 | |
| 19 | 2000 | 12 | |
| 20 | 1998 | 3 |
About A. Saïdane
A. Saïdane is a scholar working on General Energy, Ceramics and Composites and Electrical and Electronic Engineering, having authored 50 papers that have together received 757 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (8 papers), Induction Heating and Inverter Technology (7 papers), Semiconductor materials and interfaces (6 papers), Thermoelastic and Magnetoelastic Phenomena (6 papers), Semiconductor materials and devices (6 papers), Electromagnetic Simulation and Numerical Methods (5 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). The work is most often cited by research in Software (86 citations), Safety, Risk, Reliability and Quality (170 citations) and Statistics, Probability and Uncertainty (112 citations). A. Saïdane has collaborated with scholars based in Algeria, United Kingdom and France. Frequent co-authors include S.H. Pulko, S. Mimouni, A. Boudghène Stambouli, Jorlandio F. Felix, M. Henini, D.L. Kirk, A.J. Wilkinson, A. Mesli, J. M. Saiter and A. Hamou. Their work appears in journals such as Microelectronic Engineering, Journal of Heat Transfer, Journal of Applied Sciences, Burns and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.