A. Fenigstein

501 total citations
23 papers, 279 citations indexed

About

A. Fenigstein is a scholar working on Electrical and Electronic Engineering, Instrumentation and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, A. Fenigstein has authored 23 papers receiving a total of 279 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 5 papers in Instrumentation and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in A. Fenigstein's work include CCD and CMOS Imaging Sensors (9 papers), Advanced Optical Sensing Technologies (5 papers) and Advancements in Semiconductor Devices and Circuit Design (5 papers). A. Fenigstein is often cited by papers focused on CCD and CMOS Imaging Sensors (9 papers), Advanced Optical Sensing Technologies (5 papers) and Advancements in Semiconductor Devices and Circuit Design (5 papers). A. Fenigstein collaborates with scholars based in Israel, Germany and United States. A. Fenigstein's co-authors include R. Turchetta, G. Aglieri Rinella, T. Kugathasan, Nir Tessler, W.L. Chan, M. Mager, F. Reidt, H. Hillemanns, Yakov Roizin and Keith F. Taylor and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Scientific Reports.

In The Last Decade

A. Fenigstein

22 papers receiving 268 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Fenigstein Israel 9 217 66 54 38 36 23 279
C.L. Britton United States 12 240 1.1× 82 1.2× 83 1.5× 18 0.5× 76 2.1× 43 402
M. Valenza France 13 480 2.2× 17 0.3× 8 0.1× 19 0.5× 50 1.4× 46 495
Dandan Hui China 10 124 0.6× 24 0.4× 15 0.3× 33 0.9× 51 1.4× 26 273
Negin Golshani Netherlands 10 398 1.8× 11 0.2× 8 0.1× 21 0.6× 54 1.5× 32 428
Yue Xu China 12 349 1.6× 5 0.1× 10 0.2× 104 2.7× 98 2.7× 60 419
Neil Na Taiwan 10 232 1.1× 10 0.2× 5 0.1× 42 1.1× 34 0.9× 30 336
Emöke Lörincz Hungary 12 116 0.5× 21 0.3× 80 1.5× 5 0.1× 71 2.0× 46 325
J. Barth Netherlands 12 249 1.1× 73 1.1× 20 0.4× 5 0.1× 64 1.8× 33 434
C. Tivarus United States 9 235 1.1× 12 0.2× 9 0.2× 8 0.2× 63 1.8× 18 262
Peyman Yousefi Germany 9 115 0.5× 71 1.1× 33 0.6× 2 0.1× 16 0.4× 15 263

Countries citing papers authored by A. Fenigstein

Since Specialization
Citations

This map shows the geographic impact of A. Fenigstein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Fenigstein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Fenigstein more than expected).

Fields of papers citing papers by A. Fenigstein

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Fenigstein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Fenigstein. The network helps show where A. Fenigstein may publish in the future.

Co-authorship network of co-authors of A. Fenigstein

This figure shows the co-authorship network connecting the top 25 collaborators of A. Fenigstein. A scholar is included among the top collaborators of A. Fenigstein based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Fenigstein. A. Fenigstein is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sofo-Haro, Miguel, Claudio Chavez, Fernando Chierchie, et al.. (2024). Skipper-in-CMOS: Nondestructive Readout With Subelectron Noise Performance for Pixel Detectors. IEEE Transactions on Electron Devices. 71(11). 6843–6849. 4 indexed citations
2.
Worm, S. D., et al.. (2023). Total Ionizing Dose effects on CMOS image sensor for the ULTRASAT space mission. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 1054. 168463–168463.
3.
Fenigstein, A., et al.. (2020). Hybrid image sensor of small molecule organic photodiode on CMOS – Integration and characterization. Scientific Reports. 10(1). 7594–7594. 26 indexed citations
4.
Birk, Yitzhak, et al.. (2019). Passive CMOS Single Photon Avalanche Diode Imager for a Gun Muzzle Flash Detection System. IEEE Sensors Journal. 19(14). 5851–5858. 4 indexed citations
5.
Blank, T., et al.. (2019). Active-Reset for the N+P Single-Ended SPAD Used in the NIR LiDAR Receivers. IEEE Transactions on Electron Devices. 66(12). 5191–5195. 10 indexed citations
6.
7.
Blank, T., et al.. (2018). CMOS Single-Photon Avalanche Diode Pixel Design for a Gun Muzzle Flash Detection Camera. IEEE Transactions on Electron Devices. 65(10). 4407–4412. 1 indexed citations
8.
Snoeys, W., G. Aglieri Rinella, H. Hillemanns, et al.. (2017). A process modification for CMOS monolithic active pixel sensors for enhanced depletion, timing performance and radiation tolerance. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 871. 90–96. 66 indexed citations
9.
Cohen, Doron, et al.. (2016). Development of a ToF Pixel With VOD Shutter Mechanism, High IR QE, Four Storages, and CDS. IEEE Transactions on Electron Devices. 63(7). 2892–2899. 6 indexed citations
10.
Turchetta, R., et al.. (2014). Dead Time Compensation in CMOS Single Photon Avalanche Diodes With Active Quenching and External Reset. IEEE Transactions on Electron Devices. 61(8). 2725–2731. 14 indexed citations
11.
Brouk, Igor, et al.. (2014). Low frequency noise in surface and buried channel nanometric CMOS transistors. 1–5. 2 indexed citations
12.
Crooks, J., et al.. (2013). Kirana: a solid-state megapixel uCMOS image sensor for ultrahigh speed imaging. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8659. 865903–865903. 41 indexed citations
13.
Fenigstein, A., Yakov Roizin, A. Gladkikh, et al.. (2009). Al 2 O 3 – Si O 2 stack with enhanced reliability. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 27(1). 476–481. 8 indexed citations
14.
Fenigstein, A., Yakov Roizin, Igor Levin, et al.. (2006). Si O 2 ∕ Si 3 N 4 ∕ Al 2 O 3 stacks for scaled-down memory devices: Effects of interfaces and thermal annealing. Applied Physics Letters. 89(15). 32 indexed citations
15.
Fenigstein, A., et al.. (2000). Silicon Trenching Using Dry Etch Process for Backside FIB and Probing. Proceedings - International Symposium for Testing and Failure Analysis. 30842. 559–565. 1 indexed citations
16.
Fenigstein, A., E. Finkman, G. Bahir, & S. E. Schacham. (1996). X–Γ indirect intersubband transitions in type II GaAs/AlAs superlattices. Applied Physics Letters. 69(12). 1758–1760. 6 indexed citations
17.
Fenigstein, A., et al.. (1995). Current induced intersubband absorption in GaAs/GaAlAs quantum wells. Applied Physics Letters. 66(19). 2513–2515. 8 indexed citations
18.
Fenigstein, A., E. Finkman, G. Bahir, & S. E. Schacham. (1994). Polarization dependence of spectral transmission and photoconductive response of a p-doped multiple quantum well structure. Journal of Applied Physics. 76(3). 1998–2000. 3 indexed citations
19.
Betser, Y., A. Fenigstein, J. Salzman, & D. Ritter. (1994). Transmission through abrupt heterojunction potential barriers. IEEE Journal of Quantum Electronics. 30(9). 1995–2000. 3 indexed citations
20.
Fenigstein, A., S. E. Schacham, & E. Finkman. (1992). Covered electrode HgCdTe photoconductor under high illumination levels. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(4). 1611–1616. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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