Takashi Aigo

GaAs nano-ridge laser diodes fully fabricated in a 300-mm CMOS pilot line

Predictive models for the surface roughness and subsurface damage depth of semiconductor materials in precision grinding

Development of Lapping and Polishing Technologies of 4H-SiC Wafers for Power Device Applications

High uniformity of threshold voltage for GaAs/AlGaAs high electron mobility transistors grown on a Si substrate