Immediate Impact

47 standout
Sub-graph 1 of 23

Citing Papers

Challenges and opportunities for high-quality battery production at scale
2025 Standout
Condition Monitoring using Machine Learning: A Review of Theory, Applications, and Recent Advances
2023 Standout
2 intermediate papers

Works of Richard Good being referenced

Introducing a Unified PCA Algorithm for Model Size Reduction
2010
Semiconductor manufacturing process control and monitoring: A fab-wide framework
2005

Author Peers

Author Last Decade Papers Cites
Richard Good 138 35 111 87 14 241
Chuanfang Zhang 147 22 37 27 21 201
Peter Terwiesch 199 27 32 13 20 298
Junseong Bang 90 32 20 15 15 163
K. Lau 95 37 34 35 12 260
Muhammad Amar 175 24 16 6 11 227
M.L. Visinsky 222 7 39 24 11 270
Lamiaa M. Elshenawy 206 38 7 40 12 259
P.K. Mozumder 30 58 46 60 17 147
Wanxin Jin 77 22 45 5 14 154
Qiang Luo 113 5 15 28 13 169

All Works

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Rankless by CCL
2026