M.S. Liang

Two-dimensional perovskite oxide as a photoactive high-κ gate dielectric

Wurtzite and fluorite ferroelectric materials for electronic memory

Effect of polycrystalline-silicon gate types on the opposite flatband voltage shift in n-type and p-type metal–oxide–semiconductor field-effect transistors for high-k-HfO2 dielectric

Temperature-accelerated dielectric breakdown in ultrathin gate oxides