M. Dammann

Review and Outlook on GaN and SiC Power Devices: Industrial State-of-the-Art, Applications, and Perspectives

Advances and significances of nanoparticles in semiconductor applications – A review

Generation of traps in AlGaN/GaN HEMTs during RF-and DC-stress test

Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs