Immediate Impact

3 standout
Sub-graph 1 of 2

Citing Papers

Stability, Reliability, and Robustness of GaN Power Devices: A Review
2023 Standout
GaN-based power devices: Physics, reliability, and perspectives
2021 Standout
4 intermediate papers

Works of J. Schmidt being referenced

2MeV ion irradiation effects on AlGaN/GaN HFET devices
2008
Proton and Heavy Ion Irradiation Effects on AlGaN/GaN HFET Devices
2006

Author Peers

Author Last Decade Papers Cites
J. Schmidt 62 60 39 9 85
B. Sell 41 31 44 8 84
Rekha Reddy 47 54 30 11 86
Vineet Unni 52 53 23 12 70
Ko‐Tao Lee 72 79 47 12 119
Maurizio Moschetti 72 69 19 7 82
D. Leung 90 66 14 11 101
Jiaming Pan 34 46 26 8 75
F.-W. Yao 143 145 52 6 167
B. Chu-Kung 64 39 17 7 73
Sheng Jiang 93 109 49 13 123

All Works

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Rankless by CCL
2026