Immediate Impact
3 standout
Citing Papers
Stability, Reliability, and Robustness of GaN Power Devices: A Review
2023 Standout
GaN-based power devices: Physics, reliability, and perspectives
2021 Standout
Works of J. Schmidt being referenced
2MeV ion irradiation effects on AlGaN/GaN HFET devices
2008
Proton and Heavy Ion Irradiation Effects on AlGaN/GaN HFET Devices
2006
Author Peers
| Author | Last Decade | Papers | Cites | |||
|---|---|---|---|---|---|---|
| J. Schmidt | 62 | 60 | 39 | 9 | 85 | |
| B. Sell | 41 | 31 | 44 | 8 | 84 | |
| Rekha Reddy | 47 | 54 | 30 | 11 | 86 | |
| Vineet Unni | 52 | 53 | 23 | 12 | 70 | |
| Ko‐Tao Lee | 72 | 79 | 47 | 12 | 119 | |
| Maurizio Moschetti | 72 | 69 | 19 | 7 | 82 | |
| D. Leung | 90 | 66 | 14 | 11 | 101 | |
| Jiaming Pan | 34 | 46 | 26 | 8 | 75 | |
| F.-W. Yao | 143 | 145 | 52 | 6 | 167 | |
| B. Chu-Kung | 64 | 39 | 17 | 7 | 73 | |
| Sheng Jiang | 93 | 109 | 49 | 13 | 123 |
All Works
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