chemistry of extended defects in non-metallic solids
Impact in
- Authors
- LeRoy EyringM. O’Keeffe
In The Last Decade
doi.org/w49115186 →Countries where authors are citing chemistry of extended defects in non-metallic solids
This map shows the geographic impact of chemistry of extended defects in non-metallic solids. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by chemistry of extended defects in non-metallic solids with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites chemistry of extended defects in non-metallic solids more than expected).
Fields of papers citing chemistry of extended defects in non-metallic solids
This network shows the impact of chemistry of extended defects in non-metallic solids. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the chemistry of extended defects in non-metallic solids.
About chemistry of extended defects in non-metallic solids
This paper, published in 1970, received 548 indexed citations . Written by LeRoy Eyring and M. O’Keeffe. It is primarily cited by scholars working on Materials Chemistry (379 citations), Electrical and Electronic Engineering (126 citations), Mechanical Engineering (123 citations), Condensed Matter Physics (91 citations) and Electronic, Optical and Magnetic Materials (89 citations).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.
This paper is also available at doi.org/w49115186.