Nonlinear Microwave and RF Circuits
- Authors
- S.A. Maas
- Journal
- TU Digital Collections (Thammasat University)
In The Last Decade
doi.org/w38186165 →Countries where authors are citing Nonlinear Microwave and RF Circuits
This map shows the geographic impact of Nonlinear Microwave and RF Circuits. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nonlinear Microwave and RF Circuits with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nonlinear Microwave and RF Circuits more than expected).
Fields of papers citing Nonlinear Microwave and RF Circuits
This network shows the impact of Nonlinear Microwave and RF Circuits. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the Nonlinear Microwave and RF Circuits.
About Nonlinear Microwave and RF Circuits
This paper, published in 2003, received 484 indexed citations . Written by S.A. Maas covering the research area of Electrical and Electronic Engineering. It is primarily cited by scholars working on Electrical and Electronic Engineering (438 citations), Atomic and Molecular Physics, and Optics (78 citations), Biomedical Engineering (54 citations), Condensed Matter Physics (49 citations) and Astronomy and Astrophysics (48 citations). Published in TU Digital Collections (Thammasat University).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.
This paper is also available at doi.org/w38186165.