Graphene Thickness Determination Using Reflection and Contrast Spectroscopy

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This paper, published in 1950, received 949 indexed citations. Written by Zhenhua Ni, Haomin Wang, Johnson Kasim, Haiming Fan, Ting Yu, Yihong Wu, Yuan Ping Feng and Zexiang Shen covering the research area of Materials Chemistry and Computational Mechanics. It is primarily cited by scholars working on Materials Chemistry (773 citations), Biomedical Engineering (384 citations) and Electrical and Electronic Engineering (374 citations). Published in Nano Letters.

Countries where authors are citing Graphene Thickness Determination Using Reflection and Contrast Spectroscopy

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Fields of papers citing Graphene Thickness Determination Using Reflection and Contrast Spectroscopy

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Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of Graphene Thickness Determination Using Reflection and Contrast Spectroscopy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the Graphene Thickness Determination Using Reflection and Contrast Spectroscopy.

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This paper is also available at doi.org/10.1021/nl071254m.

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