A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

469 indexed citations

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This paper, published in 2003, received 469 indexed citations. Written by Daniel E. Weibel, Nicholas P. Lockyer, Paul Blenkinsopp, R. Hill and John C. Vickerman covering the research area of Materials Chemistry, Electrical and Electronic Engineering and Computational Mechanics. It is primarily cited by scholars working on Computational Mechanics (443 citations), Materials Chemistry (231 citations) and Electrical and Electronic Engineering (193 citations). Published in Analytical Chemistry.

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This paper is also available at doi.org/10.1021/ac026338o.

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