Zhonglin Bu
- Materials Chemistry top 5%
- Electrical and Electronic Engineering top 5%
- Civil and Structural Engineering top 5%
- Electronic, Optical and Magnetic Materials top 10%
- Statistical and Nonlinear Physics top 10%
- Topics
- Advanced Thermoelectric Materials and Devices (22 papers)Chalcogenide Semiconductor Thin Films (16 papers)Thermal Radiation and Cooling Technologies (5 papers)
- Journals
- Journal of the American Chemical SocietyEnergy & Environmental ScienceACS Applied Materials & Interfaces
- Partner nations
- ChinaUnited StatesHong Kong
In The Last Decade
Zhonglin Bu
23 papers receiving 1.4k citations
Hit Papers
Peers
Comparison fields: 5 of 29
- Materials Chemistry 1.3k
- Electrical and Electronic Engineering 795
- Civil and Structural Engineering 238
- Electronic, Optical and Magnetic Materials 191
- Statistical and Nonlinear Physics 72
Countries citing papers authored by Zhonglin Bu
This map shows the geographic impact of Zhonglin Bu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Zhonglin Bu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Zhonglin Bu more than expected).
Fields of papers citing papers by Zhonglin Bu
This network shows the impact of papers produced by Zhonglin Bu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Zhonglin Bu. The network helps show where Zhonglin Bu may publish in the future.
Co-authorship network of co-authors of Zhonglin Bu
This figure shows the co-authorship network connecting the top 25 collaborators of Zhonglin Bu. A scholar is included among the top collaborators of Zhonglin Bu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Zhonglin Bu. Zhonglin Bu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 17 | |
| 3 | 1 | |
| 4 | 25 | |
| 5 | 31 | |
| 6 | 20 | |
| 7 | 102 | |
| 8 | 138 | |
| 9 | 128 | |
| 10 | 31 | |
| 11 | 27 | |
| 12 | 12 | |
| 13 | 24 | |
| 14 | 46 | |
| 15 | 100 | |
| 16 | 11 | |
| 17 | 88 | |
| 18 | 49 | |
| 19 | 149 | |
| 20 | 50 |
About Zhonglin Bu
Zhonglin Bu is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Civil and Structural Engineering, having authored 23 papers that have together received 1.4k indexed citations. Recurring topics across this work include Advanced Thermoelectric Materials and Devices (22 papers), Chalcogenide Semiconductor Thin Films (16 papers) and Thermal Radiation and Cooling Technologies (5 papers). The work is most often cited by research in Materials Chemistry (1.3k citations), Electrical and Electronic Engineering (795 citations) and Civil and Structural Engineering (238 citations). Zhonglin Bu has collaborated with scholars based in China, United States and Hong Kong. Frequent co-authors include Yanzhong Pei, Wen Li, Siqi Lin, Zhiwei Chen, Xinyue Zhang, Xinyue Zhang, Yue Chen, Bing Shan, Hongxia Liu and Xuemin Shi. Their work appears in journals such as Journal of the American Chemical Society, Energy & Environmental Science and ACS Applied Materials & Interfaces.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.