Y.T. Yeow

928 total citations
60 papers, 666 citations indexed

About

Y.T. Yeow is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Y.T. Yeow has authored 60 papers receiving a total of 666 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Electrical and Electronic Engineering, 13 papers in Mechanics of Materials and 10 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Y.T. Yeow's work include Semiconductor materials and devices (36 papers), Advancements in Semiconductor Devices and Circuit Design (27 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Y.T. Yeow is often cited by papers focused on Semiconductor materials and devices (36 papers), Advancements in Semiconductor Devices and Circuit Design (27 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Y.T. Yeow collaborates with scholars based in Australia, United States and Singapore. Y.T. Yeow's co-authors include H. F. Brinson, Sima Dimitrijev, H.B. Harrison, Zhigang Yao, D. H. Morris, C.H. Ling, L. A. Davis, D. R. Lamb, S. D. Brotherton and D. Sweatman and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Materials Science.

In The Last Decade

Y.T. Yeow

56 papers receiving 636 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Y.T. Yeow Australia 17 456 160 125 112 103 60 666
F. Felten Germany 11 210 0.5× 146 0.9× 277 2.2× 66 0.6× 124 1.2× 19 536
Č. Drašar Czechia 9 128 0.3× 184 1.1× 391 3.1× 104 0.9× 88 0.9× 16 610
A. Barzegar Iran 9 210 0.5× 174 1.1× 264 2.1× 49 0.4× 27 0.3× 18 552
Daniela Herman Poland 11 149 0.3× 34 0.2× 102 0.8× 229 2.0× 57 0.6× 29 413
Xinglin Tong China 11 415 0.9× 32 0.2× 134 1.1× 161 1.4× 86 0.8× 48 618
A. Albareda Spain 11 290 0.6× 128 0.8× 501 4.0× 41 0.4× 31 0.3× 50 669
Ben-Lian Zhou China 13 153 0.3× 66 0.4× 207 1.7× 303 2.7× 41 0.4× 26 566
H.-U. Schreiber Germany 15 500 1.1× 67 0.4× 60 0.5× 180 1.6× 138 1.3× 48 718
L. Eyraud France 14 284 0.6× 120 0.8× 435 3.5× 83 0.7× 33 0.3× 63 680
D. Starikov United States 10 111 0.2× 143 0.9× 107 0.9× 59 0.5× 30 0.3× 44 381

Countries citing papers authored by Y.T. Yeow

Since Specialization
Citations

This map shows the geographic impact of Y.T. Yeow's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y.T. Yeow with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y.T. Yeow more than expected).

Fields of papers citing papers by Y.T. Yeow

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y.T. Yeow. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y.T. Yeow. The network helps show where Y.T. Yeow may publish in the future.

Co-authorship network of co-authors of Y.T. Yeow

This figure shows the co-authorship network connecting the top 25 collaborators of Y.T. Yeow. A scholar is included among the top collaborators of Y.T. Yeow based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y.T. Yeow. Y.T. Yeow is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
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Yeow, Y.T., et al.. (2003). Measurement of V/sub T/ and L/sub eff/ using MOSFET gate-substrate capacitance. 152–155. 1 indexed citations
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Yeow, Y.T., et al.. (2001). A new method of threshold voltage extraction via MOSFET gate-to-substrate capacitance measurement. IEEE Transactions on Electron Devices. 48(8). 1742–1744. 16 indexed citations
6.
Yeow, Y.T., et al.. (2001). Extraction of MOSFET threshold voltage, series resistance, effective channel length, and inversion layer mobility from small-signal channel conductance measurement. IEEE Transactions on Electron Devices. 48(12). 2870–2874. 23 indexed citations
7.
Yeow, Y.T., et al.. (2000). Inverse modeling of two-dimensional MOSFET dopant profile via capacitance of the source/drain gated diode. IEEE Transactions on Electron Devices. 47(7). 1385–1392. 9 indexed citations
8.
Yeow, Y.T., et al.. (1999). Teaching semiconductor device physics with two-dimensional numerical solver. IEEE Transactions on Education. 42(1). 50–58. 4 indexed citations
9.
Harrison, H.B., et al.. (1994). <title>High-quality sub-5-nm oxynitride dielectric films grown on silicon in a nitric oxide ambient using rapid thermal processing</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2335. 265–270. 1 indexed citations
10.
Harrison, H.B., et al.. (1994). Dielectrics on Silicon Thermally Grown or Annealed in a Nitrogen Rich Environment. MRS Proceedings. 342. 6 indexed citations
11.
Yeow, Y.T., et al.. (1991). Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement. IEEE Electron Device Letters. 12(7). 366–368. 41 indexed citations
12.
Yeow, Y.T., et al.. (1988). A modification to the Fowler-Nordheim tunneling current calculation for thin MOS structures. Solid-State Electronics. 31(6). 1113–1118. 20 indexed citations
13.
Liang, M.S., et al.. (1983). Creation and termination of substrate deep depletion in thin oxide MOS Capacitors by charge tunneling. IEEE Electron Device Letters. 4(10). 350–352. 32 indexed citations
14.
Liang, M.S., et al.. (1982). MOSFET Degradation due to stressing of thin oxide. 50–53. 7 indexed citations
15.
Davis, L. A., Y.T. Yeow, & P.M. Anderson. (1982). Bulk stiffnesses of metallic glasses. Journal of Applied Physics. 53(7). 4834–4837. 19 indexed citations
16.
Yeow, Y.T.. (1981). Metglas®/epoxy ribbon-reinforced composites. Composites. 12(2). 139–145. 7 indexed citations
17.
Alam, Md. Hasibul & Y.T. Yeow. (1980). Open-circuit voltage of induced-junction solar cells. Applied Physics Letters. 37(5). 469–470. 4 indexed citations
18.
Davis, L. A. & Y.T. Yeow. (1980). Flow and fracture of a Ni-Fe metallic glass. Journal of Materials Science. 15(1). 230–236. 23 indexed citations
19.
Yeow, Y.T., D. H. Morris, & H. F. Brinson. (1979). The fracture behavior of graphite/epoxy laminates. Experimental Mechanics. 19(1). 1–8. 19 indexed citations
20.
Yeow, Y.T., D. R. Lamb, & S. D. Brotherton. (1975). An investigation of the influence of low-temperature annealing treatments on the interface state density at the Si-SiO2. Journal of Physics D Applied Physics. 8(13). 1495–1506. 40 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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