You Zheng
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 10%
- Aerospace Engineering top 10%
- Computer Networks and Communications top 10%
- Biomedical Engineering
- Co-authors
- Carlos E. SaavedraHuaicheng YanHao ZhangMeng WangKwok Ho LamYu ZhouXiji ShaoFuming Chen
- Topics
- Radio Frequency Integrated Circuit Design (14 papers)Microwave Engineering and Waveguides (11 papers)Advancements in PLL and VCO Technologies (7 papers)
- Partner nations
- ChinaCanadaUnited States
In The Last Decade
You Zheng
45 papers receiving 654 citations
Peers
Comparison fields: 5 of 73
- Electrical and Electronic Engineering 433
- Control and Systems Engineering 104
- Aerospace Engineering 95
- Computer Networks and Communications 89
- Biomedical Engineering 87
Countries citing papers authored by You Zheng
This map shows the geographic impact of You Zheng's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by You Zheng with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites You Zheng more than expected).
Fields of papers citing papers by You Zheng
This network shows the impact of papers produced by You Zheng. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by You Zheng. The network helps show where You Zheng may publish in the future.
Co-authorship network of co-authors of You Zheng
This figure shows the co-authorship network connecting the top 25 collaborators of You Zheng. A scholar is included among the top collaborators of You Zheng based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with You Zheng. You Zheng is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 1 | |
| 5 | 0 | |
| 6 | 0 | |
| 7 | 7 | |
| 8 | 3 | |
| 9 | 4 | |
| 10 | 2 | |
| 11 | 21 | |
| 12 | 30 | |
| 13 | 92 | |
| 14 | 35 | |
| 15 | 47 | |
| 16 | 49 | |
| 17 | Measurement of novel micro bulk defects in semiconductive materials based on Mie scatter | 2 |
| 18 | 20 | |
| 19 | Compact CMOS VCO using a transistor for frequency control | 3 |
| 20 | 2 |
About You Zheng
You Zheng is a scholar working on Control and Systems Engineering, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 55 papers that have together received 683 indexed citations. Recurring topics across this work include Radio Frequency Integrated Circuit Design (14 papers), Microwave Engineering and Waveguides (11 papers) and Advancements in PLL and VCO Technologies (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (433 citations), Hepatology (49 citations) and Control and Systems Engineering (104 citations). You Zheng has collaborated with scholars based in China, Canada and United States. Frequent co-authors include Carlos E. Saavedra, Huaicheng Yan, Hao Zhang, Meng Wang, Kwok Ho Lam, Yu Zhou, Xiji Shao, Fuming Chen, Xianhua Hou and Jin-Zhu Zhao. Their work appears in journals such as ACS Applied Materials & Interfaces, Optics Express and Expert Systems with Applications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.