Y.‐M. Kim

4.0k total citations
11 papers, 8 citations indexed

About

Y.‐M. Kim is a scholar working on Computer Vision and Pattern Recognition, Mechanical Engineering and Computational Mechanics. According to data from OpenAlex, Y.‐M. Kim has authored 11 papers receiving a total of 8 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Computer Vision and Pattern Recognition, 7 papers in Mechanical Engineering and 4 papers in Computational Mechanics. Recurrent topics in Y.‐M. Kim's work include Optical measurement and interference techniques (8 papers), Advanced Measurement and Metrology Techniques (7 papers) and Surface Roughness and Optical Measurements (3 papers). Y.‐M. Kim is often cited by papers focused on Optical measurement and interference techniques (8 papers), Advanced Measurement and Metrology Techniques (7 papers) and Surface Roughness and Optical Measurements (3 papers). Y.‐M. Kim collaborates with scholars based in South Korea, Japan and United States. Y.‐M. Kim's co-authors include Naohiko Sugita, Yusuke Ito, Kenichi Hibino, Sang Won Lee, Mamoru Mitsuishi, Songkil Kim, Martin Byung‐Guk Jun, T.S. Jang, Chang Ho Lee and Sung‐Tae Kim and has published in prestigious journals such as Journal of Manufacturing Systems, Optik and Precision Engineering.

In The Last Decade

Y.‐M. Kim

5 papers receiving 8 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Y.‐M. Kim South Korea	2	5	4	4	3	1	11	8
Y. T. Zhang Japan	2	3 0.6×	4 1.0×	2 0.5×	2 0.7×	1 1.0×	3	15
Q. Q. Shi China	2	6 1.2×		4 1.0×	2 0.7×		7	14
J. Hu China	2	2 0.4×	3 0.8×	2 0.5×			7	4
N. Lubinsky United States	2	3 0.6×	2 0.5×	1 0.3×	2 0.7×		3	13
S. Q. Qu China	3	4 0.8×	5 1.3×		4 1.3×	3 3.0×	12	17
Leming Xiao China	3	2 0.4×	6 1.5×		4 1.3×		8	18
T. H. Lutz Germany	3	4 0.8×		6 1.5×		1 1.0×	5	17
D. Haitz Germany	4	3 0.6×	11 2.8×	1 0.3×	2 0.7×	1 1.0×	4	16
M. Kim South Korea	1	3 0.6×	3 0.8×				2	7
A. Karjalainen Finland	2	3 0.6×	2 0.5×		2 0.7×	2 2.0×	4	21

Countries citing papers authored by Y.‐M. Kim

Since Specialization

Citations

This map shows the geographic impact of Y.‐M. Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y.‐M. Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y.‐M. Kim more than expected).

Fields of papers citing papers by Y.‐M. Kim

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y.‐M. Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y.‐M. Kim. The network helps show where Y.‐M. Kim may publish in the future.

Co-authorship network of co-authors of Y.‐M. Kim

This figure shows the co-authorship network connecting the top 25 collaborators of Y.‐M. Kim. A scholar is included among the top collaborators of Y.‐M. Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y.‐M. Kim. Y.‐M. Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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11 of 11 papers shown

Kim, Y.‐M., et al.. (2025). Glass thickness testing using Fizeau interferometer with suppression of environmental factors. Precision Engineering. 93. 99–109.

Kim, Sung‐Tae, et al.. (2025). Development of Volumetric Accuracy Enhancement Method for a 5-Axis Machine Tool Based on Sensitivity Analysis and Extraction Algorithm. International Journal of Precision Engineering and Manufacturing. 26(10). 2671–2687.

Lee, Ho‐Jun, et al.. (2025). ChatCNC: Conversational machine monitoring via large language model and real-time data retrieval augmented generation. Journal of Manufacturing Systems. 79. 504–514. 4 indexed citations

Kim, Y.‐M., et al.. (2025). Quality enhancement of interferometric fringe pattern based on deep-learning-based denoising of combined noise. Precision Engineering. 95. 75–88.

Kim, Y.‐M., et al.. (2025). Deep learning-driven virtual phase shifting for enhanced interferometric surface profiling. Precision Engineering. 97. 757–766.

Kim, Hwan, Y.‐M. Kim, Yusuke Ito, Naohiko Sugita, & Mamoru Mitsuishi. (2025). Deep Learning-Based Phase Aberration Estimation for Ultra-Precise Silicon Wafer Metrology. International Journal of Precision Engineering and Manufacturing-Green Technology. 12(6). 1861–1877.

Kim, Hwan, Y.‐M. Kim, Yusuke Ito, & Naohiko Sugita. (2025). Precise Three-Surface Interferometry for Thickness Separation in Blank Masks. International Journal of Precision Engineering and Manufacturing. 26(8). 1921–1934. 1 indexed citations

Kim, Y.‐M., et al.. (2024). Development of Gaussian Window Function for Precision Topography of Silicon-Wafer Surface Using Wavelength-Modulation Interferometry. International Journal of Precision Engineering and Manufacturing. 25(12). 2549–2561. 1 indexed citations

Kim, Y.‐M., Sung‐Tae Kim, Habeom Lee, et al.. (2024). Design of phase-reconstruction algorithm: insensitivity to intensity modulation. Journal of Mechanical Science and Technology. 38(7). 3569–3575. 1 indexed citations

10.

Kim, Hwan, et al.. (2023). Simultaneous interferometric profilometry of surface and thickness of transparent plate using wavelength-modulation. Optik. 295. 171523–171523.

11.

Kim, Sung‐Tae, Y.‐M. Kim, Naohiko Sugita, & Mamoru Mitsuishi. (2023). Assessment and verification of thickness homogeneity in mask blank by utilizing main harmonics of triple-surface interferometry. Precision Engineering. 85. 174–182. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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