Ye Han
- Mechanical Engineering
- Civil and Structural Engineering top 10%
- Industrial and Manufacturing Engineering top 5%
- Computer Vision and Pattern Recognition top 10%
- Media Technology top 10%
- Co-authors
- Zhigang LiuZhiwei HanJunping ZhongWenxuan ZhangGuinan ZhangDah-Jye LeeWenqiang LiuChangjiang Li
- Topics
- Infrastructure Maintenance and Monitoring (4 papers)Vehicle License Plate Recognition (3 papers)Railway Engineering and Dynamics (3 papers)
- Cited by
- Industrial and Manufacturing EngineeringCivil and Structural EngineeringComputer Vision and Pattern Recognition
- Journals
- Expert Systems with ApplicationsNeurocomputingIEEE Transactions on Instrumentation and Measurement
- Partner nations
- ChinaUnited States
In The Last Decade
Ye Han
10 papers receiving 316 citations
Peers
Comparison fields: 5 of 52
- Mechanical Engineering 158
- Civil and Structural Engineering 119
- Industrial and Manufacturing Engineering 112
- Computer Vision and Pattern Recognition 102
- Media Technology 42
Countries citing papers authored by Ye Han
This map shows the geographic impact of Ye Han's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ye Han with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ye Han more than expected).
Fields of papers citing papers by Ye Han
This network shows the impact of papers produced by Ye Han. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ye Han. The network helps show where Ye Han may publish in the future.
Co-authorship network of co-authors of Ye Han
This figure shows the co-authorship network connecting the top 25 collaborators of Ye Han. A scholar is included among the top collaborators of Ye Han based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ye Han. Ye Han is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 44 | |
| 4 | 135 | |
| 5 | 26 | |
| 6 | 30 | |
| 7 | 36 | |
| 8 | 26 | |
| 9 | 18 | |
| 10 | Insulator Fault Detection Based on Curvelet Coefficients Morphology and Zonal Energy Method | 3 |
About Ye Han
Ye Han is a scholar working on Media Technology, Signal Processing and Industrial and Manufacturing Engineering, having authored 10 papers that have together received 321 indexed citations. Recurring topics across this work include Infrastructure Maintenance and Monitoring (4 papers), Vehicle License Plate Recognition (3 papers) and Railway Engineering and Dynamics (3 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (112 citations), Civil and Structural Engineering (119 citations) and Computer Vision and Pattern Recognition (102 citations). Ye Han has collaborated with scholars based in China and United States. Frequent co-authors include Zhigang Liu, Zhiwei Han, Junping Zhong, Wenxuan Zhang, Guinan Zhang, Dah-Jye Lee, Wenqiang Liu, Changjiang Li, Wenxuan Zhang and Zhiqiang Ma. Their work appears in journals such as Expert Systems with Applications, Neurocomputing and IEEE Transactions on Instrumentation and Measurement.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.