Yannick Deshayes

531 total citations
33 papers, 386 citations indexed

About

Yannick Deshayes is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Condensed Matter Physics. According to data from OpenAlex, Yannick Deshayes has authored 33 papers receiving a total of 386 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 8 papers in Condensed Matter Physics. Recurrent topics in Yannick Deshayes's work include Semiconductor Quantum Structures and Devices (10 papers), GaN-based semiconductor devices and materials (8 papers) and Semiconductor materials and devices (7 papers). Yannick Deshayes is often cited by papers focused on Semiconductor Quantum Structures and Devices (10 papers), GaN-based semiconductor devices and materials (8 papers) and Semiconductor materials and devices (7 papers). Yannick Deshayes collaborates with scholars based in France, Canada and Italy. Yannick Deshayes's co-authors include Laurent Béchou, Lionel Canioni, Thierry Cardinal, Arnaud Royon, Kevin Bourhis, Bruno Bousquet, Matthieu Bellec, G. Papon, François Verdier and Yves Ousten and has published in prestigious journals such as Advanced Materials, Journal of Applied Physics and Optics Letters.

In The Last Decade

Yannick Deshayes

33 papers receiving 371 citations

Peers

Yannick Deshayes

EEE

AMPO

C. Smit Netherlands

Andreas Schumacher Germany

Takayuki Miyazaki Japan

S. Habermehl United States

Shinji Hara Japan

Hideo Kaiju Japan

Yiwei Lu United States

A. Bousetta United States

Yukta Timalsina United States

Akio Shima Japan

C. Smit Netherlands

Yannick Deshayes

385 ×2.2

EEE

304 ×2.2

78 ×0.7

190 ×1.9

AMPO

39 ×0.5

Citations per year, relative to Yannick Deshayes Yannick Deshayes (= 1×) peers C. Smit

Countries citing papers authored by Yannick Deshayes

Since Specialization

Citations

This map shows the geographic impact of Yannick Deshayes's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yannick Deshayes with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yannick Deshayes more than expected).

Fields of papers citing papers by Yannick Deshayes

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yannick Deshayes. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yannick Deshayes. The network helps show where Yannick Deshayes may publish in the future.

Co-authorship network of co-authors of Yannick Deshayes

This figure shows the co-authorship network connecting the top 25 collaborators of Yannick Deshayes. A scholar is included among the top collaborators of Yannick Deshayes based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yannick Deshayes. Yannick Deshayes is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Jaouad, Abdelatif, Maïté Volatier, Christopher E. Valdivia, et al.. (2021). Miniaturization of InGaP/InGaAs/Ge solar cells for micro‐concentrator photovoltaics. Progress in Photovoltaics Research and Applications. 29(9). 990–999. 21 indexed citations

Deshayes, Yannick & Laurent Béchou. (2016). Reliability, Robustness and Failure Mechanisms of LED Devices. Elsevier eBooks. 2 indexed citations

Vanzi, M., et al.. (2016). Extended Modal Gain Measurement in DFB Laser Diodes. IEEE Photonics Technology Letters. 29(2). 197–200. 6 indexed citations

Deshayes, Yannick, et al.. (2015). Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes. Microelectronics Reliability. 55(9-10). 1741–1745. 4 indexed citations

Deshayes, Yannick, et al.. (2015). Overview on Sustainability, Robustness, and Reliability of GaN Single-Chip LED Devices. IEEE Transactions on Device and Materials Reliability. 15(4). 621–625. 3 indexed citations

Deshayes, Yannick, et al.. (2014). Accurate electro-optical characterization of high power density GaAs-based laser diodes for screening strategies improvement. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9134. 913423–913423. 1 indexed citations

Mendizabal, L., et al.. (2013). Electro-optical strength assessment of white LEDs multichip modules for automotive forward-lighting application: Failure analysis and packaging influence. European Microelectronics and Packaging Conference. 1–7. 1 indexed citations

Cassidy, Daniel T., et al.. (2013). High-power diode laser bars and shear strain. Optics Letters. 38(10). 1633–1633. 10 indexed citations

Royon, Arnaud, Kevin Bourhis, Matthieu Bellec, et al.. (2010). Silver Clusters Embedded in Glass as a Perennial High Capacity Optical Recording Medium. Advanced Materials. 22(46). 5282–5286. 187 indexed citations

10.

Deshayes, Yannick, et al.. (2010). Failure Mechanisms in Packaged Light-Emitting Diodes Under Gamma Radiations: Piezoelectric Model Based on Stark Effect. IEEE Transactions on Device and Materials Reliability. 11(2). 303–311. 2 indexed citations

11.

Deshayes, Yannick, Laurent Béchou, Thierry Buffeteau, et al.. (2010). Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectronics Reliability. 50(9-11). 1568–1573. 17 indexed citations

12.

Deshayes, Yannick, Laurent Béchou, & Yves Ousten. (2010). Stark Effects Model Used to Highlight Selective Activation of Failure Mechanisms in MQW InGaN/GaN Light-Emitting Diodes. IEEE Transactions on Device and Materials Reliability. 10(1). 164–170. 2 indexed citations

13.

Béchou, Laurent, et al.. (2008). Challenges and potential of new approaches for reliability assessment of nanotechnologies. Comptes Rendus Physique. 9(1). 95–109. 4 indexed citations

14.

Deshayes, Yannick, et al.. (2008). Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. Microelectronics Reliability. 48(8-9). 1354–1360. 3 indexed citations

15.

Deshayes, Yannick, et al.. (2008). Simulations of Thermomechanical Stresses and Optical Misalignment in 1550-nm Transmitter Optoelectronic Modules Using FEM and Process Dispersions. IEEE Transactions on Components and Packaging Technologies. 31(4). 759–766. 6 indexed citations

16.

Béchou, Laurent, et al.. (2006). Performance and reliability predictions of 1550 nm WDM optical transmission links using a system simulator. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6193. 619313–619313. 2 indexed citations

17.

Deshayes, Yannick, et al.. (2005). Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests. Quality and Reliability Engineering International. 21(6). 571–594. 28 indexed citations

18.

Deshayes, Yannick, et al.. (2003). Three-dimensional FEM simulations of thermomechanical stresses in 1.55 μm laser modules. 2610. 51–56. 1 indexed citations

19.

Delétage, Jean-Yves, et al.. (2003). Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectronics Reliability. 43(7). 1137–1144. 6 indexed citations

20.

Tardy, Pascal, et al.. (1999). Study of Ca1−xPrxF2+x solid solution thin films grown on silicon substrates. Thin Solid Films. 347(1-2). 127–132. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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