Yanghong Tan
- Electrical and Electronic Engineering
- Control and Systems Engineering top 5%
- Hardware and Architecture top 5%
- Industrial and Manufacturing Engineering top 10%
- Artificial Intelligence
- Topics
- VLSI and Analog Circuit Testing (9 papers)Integrated Circuits and Semiconductor Failure Analysis (8 papers)Optimal Power Flow Distribution (7 papers)
- Cited by
- Hardware and ArchitectureControl and Systems EngineeringElectrical and Electronic Engineering
- Journals
- PLoS ONEEnergiesElectronics Letters
- Partner nations
- ChinaUnited KingdomBangladesh
In The Last Decade
Yanghong Tan
31 papers receiving 369 citations
Peers
Comparison fields: 5 of 50
- Electrical and Electronic Engineering 296
- Control and Systems Engineering 199
- Hardware and Architecture 104
- Industrial and Manufacturing Engineering 39
- Artificial Intelligence 34
Countries citing papers authored by Yanghong Tan
This map shows the geographic impact of Yanghong Tan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yanghong Tan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yanghong Tan more than expected).
Fields of papers citing papers by Yanghong Tan
This network shows the impact of papers produced by Yanghong Tan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yanghong Tan. The network helps show where Yanghong Tan may publish in the future.
Co-authorship network of co-authors of Yanghong Tan
This figure shows the co-authorship network connecting the top 25 collaborators of Yanghong Tan. A scholar is included among the top collaborators of Yanghong Tan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yanghong Tan. Yanghong Tan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 2 | |
| 4 | 12 | |
| 5 | 10 | |
| 6 | 20 | |
| 7 | 3 | |
| 8 | 1 | |
| 9 | 3 | |
| 10 | Multi-objective Optimization of Distributed Generation Considering Economic Benefits | 0 |
| 11 | 66 | |
| 12 | 2 | |
| 13 | 1 | |
| 14 | 22 | |
| 15 | 5 | |
| 16 | 2 | |
| 17 | 58 | |
| 18 | 3 | |
| 19 | 14 | |
| 20 | Neural Network Method of Fault Diagnosis for Large—scale Analogue Circuits | 2 |
About Yanghong Tan
Yanghong Tan is a scholar working on Hardware and Architecture, Control and Systems Engineering and Energy Engineering and Power Technology, having authored 32 papers that have together received 389 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Optimal Power Flow Distribution (7 papers). The work is most often cited by research in Hardware and Architecture (104 citations), Control and Systems Engineering (199 citations) and Electrical and Electronic Engineering (296 citations). Yanghong Tan has collaborated with scholars based in China, United Kingdom and Bangladesh. Frequent co-authors include Yichuang Sun, Yigang He, Haixia Zhang, Jianli Song, Changcai Cui, Xin Yin, Ye Zhou, Lin Jiang, Yigang He and Yigang He. Their work appears in journals such as PLoS ONE, Energies and Electronics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.