Y. Kim
- Computer Vision and Pattern Recognition top 5%
- Radiology, Nuclear Medicine and Imaging top 10%
- Biomedical Engineering
- Artificial Intelligence
- Electrical and Electronic Engineering
- Co-authors
- David R. HaynorP.H. SchimpfM. E. McHenryKatie L. McNernyDavid E. LaughlinMehran MesbahiFred Y. HadaeghDaniel F. Leotta
- Topics
- Medical Imaging Techniques and Applications (5 papers)Neuroscience and Neural Engineering (4 papers)Elasticity and Material Modeling (4 papers)
- Cited by
- Computer Vision and Pattern RecognitionRadiology, Nuclear Medicine and ImagingSignal Processing
- Partner nations
- United StatesSouth Korea
In The Last Decade
Y. Kim
23 papers receiving 476 citations
Peers
Comparison fields: 5 of 80
- Computer Vision and Pattern Recognition 233
- Radiology, Nuclear Medicine and Imaging 169
- Biomedical Engineering 89
- Artificial Intelligence 61
- Electrical and Electronic Engineering 53
Countries citing papers authored by Y. Kim
This map shows the geographic impact of Y. Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Kim more than expected).
Fields of papers citing papers by Y. Kim
This network shows the impact of papers produced by Y. Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Kim. The network helps show where Y. Kim may publish in the future.
Co-authorship network of co-authors of Y. Kim
This figure shows the co-authorship network connecting the top 25 collaborators of Y. Kim. A scholar is included among the top collaborators of Y. Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Y. Kim. Y. Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 3 | |
| 3 | 1 | |
| 4 | 10 | |
| 5 | 3 | |
| 6 | 1 | |
| 7 | 10 | |
| 8 | 3 | |
| 9 | 0 | |
| 10 | 0 | |
| 11 | 2 | |
| 12 | 27 | |
| 13 | 6 | |
| 14 | 19 | |
| 15 | 6 | |
| 16 | 10 | |
| 17 | 38 | |
| 18 | 212 | |
| 19 | 7 | |
| 20 | 24 |
About Y. Kim
Y. Kim is a scholar working on Computer Graphics and Computer-Aided Design, Computer Vision and Pattern Recognition and Radiology, Nuclear Medicine and Imaging, having authored 26 papers that have together received 505 indexed citations. Recurring topics across this work include Medical Imaging Techniques and Applications (5 papers), Neuroscience and Neural Engineering (4 papers) and Elasticity and Material Modeling (4 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (233 citations), Radiology, Nuclear Medicine and Imaging (169 citations) and Signal Processing (32 citations). Y. Kim has collaborated with scholars based in United States and South Korea. Frequent co-authors include David R. Haynor, P.H. Schimpf, M. E. McHenry, Katie L. McNerny, David E. Laughlin, Mehran Mesbahi, Fred Y. Hadaegh, Daniel F. Leotta, E.A. Riskin and Vijay Shamdasani. Their work appears in journals such as Journal of Applied Physics, Proceedings of the IEEE and IEEE Access.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.