Xiaoyuan He
- Computer Vision and Pattern Recognition top 2%
- Electrical and Electronic Engineering
- Aerospace Engineering top 10%
- Media Technology top 2%
- Mechanical Engineering
- Co-authors
- Botao FengChenggen QuanC.J. TayChow‐Yen‐Desmond SimJui‐Ching ChengFujun YangXin KangH.M. Shang
- Topics
- Optical measurement and interference techniques (36 papers)Advanced Measurement and Metrology Techniques (13 papers)Surface Roughness and Optical Measurements (10 papers)
- Partner nations
- ChinaSingaporeUnited States
In The Last Decade
Xiaoyuan He
57 papers receiving 649 citations
Peers
Comparison fields: 5 of 66
- Computer Vision and Pattern Recognition 366
- Electrical and Electronic Engineering 253
- Aerospace Engineering 179
- Media Technology 150
- Mechanical Engineering 149
Countries citing papers authored by Xiaoyuan He
This map shows the geographic impact of Xiaoyuan He's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xiaoyuan He with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xiaoyuan He more than expected).
Fields of papers citing papers by Xiaoyuan He
This network shows the impact of papers produced by Xiaoyuan He. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xiaoyuan He. The network helps show where Xiaoyuan He may publish in the future.
Co-authorship network of co-authors of Xiaoyuan He
This figure shows the co-authorship network connecting the top 25 collaborators of Xiaoyuan He. A scholar is included among the top collaborators of Xiaoyuan He based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Xiaoyuan He. Xiaoyuan He is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 5 | |
| 4 | 44 | |
| 5 | 2 | |
| 6 | 2 | |
| 7 | 11 | |
| 8 | 1 | |
| 9 | 7 | |
| 10 | 25 | |
| 11 | 4 | |
| 12 | 2 | |
| 13 | 5 | |
| 14 | 30 | |
| 15 | Method for Eliminating zero-order Image in Digital Holography | 5 |
| 16 | 29 | |
| 17 | 17 | |
| 18 | New Method for Measuring High Field Electrostrictive Response of Barium Titanate/Polyurethane Elastomer | 2 |
| 19 | 11 | |
| 20 | 2 |
About Xiaoyuan He
Xiaoyuan He is a scholar working on Computer Vision and Pattern Recognition, Media Technology and Geology, having authored 60 papers that have together received 681 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (36 papers), Advanced Measurement and Metrology Techniques (13 papers) and Surface Roughness and Optical Measurements (10 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (366 citations), Media Technology (150 citations) and Geology (44 citations). Xiaoyuan He has collaborated with scholars based in China, Singapore and United States. Frequent co-authors include Botao Feng, Chenggen Quan, C.J. Tay, Chow‐Yen‐Desmond Sim, Jui‐Ching Cheng, Fujun Yang, Xin Kang, H.M. Shang, Hongjian Shi and Feipeng Zhu. Their work appears in journals such as ACS Applied Materials & Interfaces, Optics Letters and Optics Express.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.