X. F. St. Onge
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 5%
- Mechanical Engineering
- Electronic, Optical and Magnetic Materials
- Astronomy and Astrophysics
- Co-authors
- S. A. SalehE. OzkopLiuchen ChangBasim AlsayidSergio PanettaEduardo Castillo-GuerraErik SchemeJulian Meng
- Topics
- Advanced DC-DC Converters (8 papers)Multilevel Inverters and Converters (8 papers)Microgrid Control and Optimization (7 papers)
- Cited by
- Control and Systems EngineeringElectrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
In The Last Decade
X. F. St. Onge
19 papers receiving 415 citations
Peers
Comparison fields: 5 of 31
- Electrical and Electronic Engineering 400
- Control and Systems Engineering 222
- Mechanical Engineering 58
- Electronic, Optical and Magnetic Materials 37
- Astronomy and Astrophysics 25
Countries citing papers authored by X. F. St. Onge
This map shows the geographic impact of X. F. St. Onge's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by X. F. St. Onge with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites X. F. St. Onge more than expected).
Fields of papers citing papers by X. F. St. Onge
This network shows the impact of papers produced by X. F. St. Onge. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by X. F. St. Onge. The network helps show where X. F. St. Onge may publish in the future.
Co-authorship network of co-authors of X. F. St. Onge
This figure shows the co-authorship network connecting the top 25 collaborators of X. F. St. Onge. A scholar is included among the top collaborators of X. F. St. Onge based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with X. F. St. Onge. X. F. St. Onge is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 21 | |
| 2 | 28 | |
| 3 | 15 | |
| 4 | 44 | |
| 5 | 65 | |
| 6 | 25 | |
| 7 | 86 | |
| 8 | 5 | |
| 9 | 7 | |
| 10 | 4 | |
| 11 | 22 | |
| 12 | 16 | |
| 13 | 41 | |
| 14 | 1 | |
| 15 | 5 | |
| 16 | 1 | |
| 17 | 25 | |
| 18 | 4 | |
| 19 | 23 |
About X. F. St. Onge
X. F. St. Onge is a scholar working on Control and Systems Engineering, Electrical and Electronic Engineering and Astronomy and Astrophysics, having authored 19 papers that have together received 438 indexed citations. Recurring topics across this work include Advanced DC-DC Converters (8 papers), Multilevel Inverters and Converters (8 papers) and Microgrid Control and Optimization (7 papers). The work is most often cited by research in Control and Systems Engineering (222 citations), Electrical and Electronic Engineering (400 citations) and Electronic, Optical and Magnetic Materials (37 citations). X. F. St. Onge has collaborated with scholars based in Canada and Türkiye. Frequent co-authors include S. A. Saleh, E. Ozkop, Liuchen Chang, Basim Alsayid, Sergio Panetta, Eduardo Castillo-Guerra, Erik Scheme and Julian Meng. Their work appears in journals such as IEEE Transactions on Industrial Electronics, IEEE Access and IEEE Transactions on Industry Applications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.