Wenyong Yu
- Industrial and Manufacturing Engineering top 2%
- Computer Vision and Pattern Recognition top 5%
- Artificial Intelligence top 10%
- Mechanical Engineering
- Control and Systems Engineering top 10%
- Topics
- Industrial Vision Systems and Defect Detection (15 papers)Anomaly Detection Techniques and Applications (7 papers)Optical measurement and interference techniques (6 papers)
In The Last Decade
Wenyong Yu
31 papers receiving 459 citations
Peers
Comparison fields: 5 of 76
- Industrial and Manufacturing Engineering 174
- Computer Vision and Pattern Recognition 156
- Artificial Intelligence 137
- Mechanical Engineering 78
- Control and Systems Engineering 74
Countries citing papers authored by Wenyong Yu
This map shows the geographic impact of Wenyong Yu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wenyong Yu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wenyong Yu more than expected).
Fields of papers citing papers by Wenyong Yu
This network shows the impact of papers produced by Wenyong Yu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wenyong Yu. The network helps show where Wenyong Yu may publish in the future.
Co-authorship network of co-authors of Wenyong Yu
This figure shows the co-authorship network connecting the top 25 collaborators of Wenyong Yu. A scholar is included among the top collaborators of Wenyong Yu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wenyong Yu. Wenyong Yu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 3 | |
| 3 | 8 | |
| 4 | 9 | |
| 5 | 12 | |
| 6 | 8 | |
| 7 | 15 | |
| 8 | 6 | |
| 9 | 20 | |
| 10 | 29 | |
| 11 | 16 | |
| 12 | 12 | |
| 13 | 25 | |
| 14 | 2 | |
| 15 | 24 | |
| 16 | Research on the Way of On-line Quality Inspection of Commerce Note Printing | 1 |
| 17 | Study on technology of glass image real-time sampling and synchronization | 1 |
| 18 | Processing Algorithm of High Speed Printing Image | 1 |
| 19 | 82 | |
| 20 | 15 |
About Wenyong Yu
Wenyong Yu is a scholar working on Industrial and Manufacturing Engineering, Computer Vision and Pattern Recognition and Media Technology, having authored 35 papers that have together received 478 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (15 papers), Anomaly Detection Techniques and Applications (7 papers) and Optical measurement and interference techniques (6 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (174 citations), Computer Vision and Pattern Recognition (156 citations) and Media Technology (38 citations). Wenyong Yu has collaborated with scholars based in China and Croatia. Frequent co-authors include Haiming Yao, Wei Luo, Youping Chen, Zude Zhou, Guodong Sun, Wenlong Li, Kunming Zheng, Xue Wang, Youmin Hu and Donghao Luo. Their work appears in journals such as Analytical Chemistry, The Science of The Total Environment and Sensors.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.