Wei-En Fu

551 total citations
31 papers, 449 citations indexed

About

Wei-En Fu is a scholar working on Biomedical Engineering, Electrical and Electronic Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Wei-En Fu has authored 31 papers receiving a total of 449 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Biomedical Engineering, 12 papers in Electrical and Electronic Engineering and 7 papers in Surfaces, Coatings and Films. Recurrent topics in Wei-En Fu's work include Advanced Surface Polishing Techniques (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Force Microscopy Techniques and Applications (6 papers). Wei-En Fu is often cited by papers focused on Advanced Surface Polishing Techniques (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Force Microscopy Techniques and Applications (6 papers). Wei-En Fu collaborates with scholars based in Taiwan, United States and Australia. Wei-En Fu's co-authors include Chao‐Chang A. Chen, Chun‐Yen Lin, Mei‐Lin Ho, Shou-Chieh Huang, Hwei‐Fang Cheng, Vincent A. Hackley, Jui‐Che Lin, Shan‐hui Hsu, Chiu-Hun Su and Andreas F. Thünemann and has published in prestigious journals such as Applied Physics Letters, Biochemical and Biophysical Research Communications and Applied Surface Science.

In The Last Decade

Wei-En Fu

31 papers receiving 437 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Wei-En Fu Taiwan 12 165 164 102 65 63 31 449
Alan R. Jacob Greece 15 240 1.5× 166 1.0× 70 0.7× 51 0.8× 62 1.0× 21 584
Jacob John India 11 110 0.7× 194 1.2× 130 1.3× 46 0.7× 83 1.3× 27 499
Junjie Yang China 14 163 1.0× 171 1.0× 58 0.6× 58 0.9× 229 3.6× 48 666
Aleš Mráček Czechia 15 94 0.6× 241 1.5× 70 0.7× 126 1.9× 42 0.7× 42 599
Mincong Liu China 14 97 0.6× 108 0.7× 140 1.4× 26 0.4× 66 1.0× 25 453
Jun Sun China 16 275 1.7× 267 1.6× 189 1.9× 94 1.4× 65 1.0× 50 800
Saeid Biria United States 14 122 0.7× 165 1.0× 339 3.3× 42 0.6× 87 1.4× 26 718
Sun‐Hyung Kim South Korea 16 218 1.3× 146 0.9× 334 3.3× 71 1.1× 128 2.0× 40 805
Enric Santanach‐Carreras France 13 143 0.9× 180 1.1× 92 0.9× 32 0.5× 92 1.5× 31 592
Yonghwan Kwon South Korea 14 197 1.2× 82 0.5× 94 0.9× 23 0.4× 28 0.4× 31 724

Countries citing papers authored by Wei-En Fu

Since Specialization
Citations

This map shows the geographic impact of Wei-En Fu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wei-En Fu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wei-En Fu more than expected).

Fields of papers citing papers by Wei-En Fu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wei-En Fu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wei-En Fu. The network helps show where Wei-En Fu may publish in the future.

Co-authorship network of co-authors of Wei-En Fu

This figure shows the co-authorship network connecting the top 25 collaborators of Wei-En Fu. A scholar is included among the top collaborators of Wei-En Fu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wei-En Fu. Wei-En Fu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Pandey, Gaurav, Wei-En Fu, Chunyu Liu, Chao-Ching Ho, & Liang-Chia Chen. (2025). Emerging x-ray metrology techniques with evolving front-end-of-line high-technology IC nodes. 45–45. 1 indexed citations
2.
Lee, Han, et al.. (2023). Label-free SERS method with size-matched selectivity for analytes of varying sizes. Surfaces and Interfaces. 44. 103821–103821. 8 indexed citations
3.
Fu, Wei-En, et al.. (2023). The intensity enhancement of transmission small angle x-ray scattering from nanostructures with a high aspect ratio. Surface Topography Metrology and Properties. 11(2). 24008–24008. 4 indexed citations
4.
Sun, Chiao-Yin, et al.. (2022). Dysregulated HIC1 and RassF1A expression in vitro alters the cell cytoskeleton and exosomal Piwi-interacting RNA. Biochemical and Biophysical Research Communications. 594. 109–116. 1 indexed citations
5.
Chang, Alice Chinghsuan, et al.. (2022). Evaluation of Three Sample Introduction Systems for Impurity Analysis of an Ultrapure Reagent Using a Scanning Mobility Particle Sizer. ACS Omega. 7(16). 13622–13628. 4 indexed citations
6.
Fu, Wei-En, et al.. (2017). Methodology for sample preparation and size measurement of commercial ZnO nanoparticles. Journal of Food and Drug Analysis. 26(2). 628–636. 70 indexed citations
7.
Friedman, Lawrence H., et al.. (2017). Reflective small angle electron scattering to characterize nanostructures on opaque substrates. Applied Physics Letters. 111(12). 1 indexed citations
8.
Fu, Wei-En, et al.. (2015). Calibrating the Z-magnification of atomic force microscope below 10 nm by single-atom steps. Thin Solid Films. 584. 372–377. 5 indexed citations
9.
Hsu, Shan‐hui, Kun‐Che Hung, Chiu-Hun Su, et al.. (2014). Water-based synthesis and processing of novel biodegradable elastomers for medical applications. Journal of Materials Chemistry B. 2(31). 5083–5092. 78 indexed citations
10.
Fu, Wei-En, et al.. (2013). Determination of Young's modulus and Poisson's ratio of thin films by X-ray methods. Thin Solid Films. 544. 201–205. 11 indexed citations
11.
Fu, Wei-En, et al.. (2013). Surface mechanical property assessment of ultra-thin HfO2 films. Thin Solid Films. 544. 212–217. 7 indexed citations
12.
Stefaniak, Aleksandr B., Vincent A. Hackley, Gert Roebben, et al.. (2012). Nanoscale reference materials for environmental, health and safety measurements: needs, gaps and opportunities. Nanotoxicology. 7(8). 1325–1337. 81 indexed citations
13.
Fu, Wei-En, et al.. (2012). Material removal mechanism of Cu-CMP studied by nano-scratching under various environmental conditions. Wear. 278-279. 87–93. 24 indexed citations
14.
Fu, Wei-En, et al.. (2012). Deformation of polystyrene nanoparticles under different AFM tapping loads. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8378. 83780G–83780G. 6 indexed citations
15.
Fu, Wei-En, et al.. (2011). Passivation layer effect on surface integrity induced by Cu-CMP. Thin Solid Films. 519(15). 4874–4879. 7 indexed citations
16.
17.
Fu, Wei-En, David G. Seiler, Alain C. Diebold, et al.. (2011). Thickness Variation of HfO[sub 2] Films Under Post-Deposition Annealing Investigated By X-ray Reflectivity and X-ray Photoelectron Spectroscopy. AIP conference proceedings. 188–192. 1 indexed citations
18.
Fu, Wei-En, et al.. (2009). Surface qualities after chemical–mechanical polishing on thin films. Thin Solid Films. 517(17). 4909–4915. 14 indexed citations
19.
Wang, Chengqing, Wei-En Fu, Derek Ho, et al.. (2008). CD-SAXS measurements using laboratory-based and synchrotron-based instruments. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6922. 69222E–69222E. 5 indexed citations
20.
Zhang, Bi, et al.. (1997). A Linear Piezomotor of High Stiffness and Nanometer Resolution. CIRP Annals. 46(1). 305–308. 17 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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