W. Tsai
- Software top 10%
- Software Reliability and Analysis Research 1
- Mechanics of Materials top 10%
- Metal and Thin Film Mechanics 13
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- Copper Interconnects and Reliability 7
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- Semiconductor materials and devices 11
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- Ion-surface interactions and analysis 6
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- Diamond and Carbon-based Materials Research 4
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- Physics of Superconductivity and Magnetism 2
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- Semiconductor materials and interfaces 2
- Journals
- Journal of Applied Physics (6 papers)Thin Solid Films (3 papers)Applied Physics Letters (2 papers)
- Partner nations
- United StatesCanadaTaiwan
In The Last Decade
W. Tsai
19 papers receiving 353 citations
Peers
Comparison fields: 5 of 38
- Software 51
- Mechanics of Materials 149
- Electronic, Optical and Magnetic Materials 74
- Electrical and Electronic Engineering 202
- Surfaces, Coatings and Films 21
Countries citing papers authored by W. Tsai
This map shows the geographic impact of W. Tsai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Tsai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Tsai more than expected).
Fields of papers citing papers by W. Tsai
This network shows the impact of papers produced by W. Tsai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Tsai. The network helps show where W. Tsai may publish in the future.
Co-authorship network
The 18 scholars most cited alongside W. Tsai, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 1 | |
| 2 | 1996 | 4 | |
| 3 | 1995 | 44 | |
| 4 | 1994 | 4 | |
| 5 | 1994 | 11 | |
| 6 | 1994 | 11 | |
| 7 | 1993 | 27 | |
| 8 | 1993 | 8 | |
| 9 | 1993 | 42 | |
| 10 | 1993 | 15 | |
| 11 | 1993 | 9 | |
| 12 | 1993 | 17 | |
| 13 | 1992 | 36 | |
| 14 | 1992 | 10 | |
| 15 | 1992 | 0 | |
| 16 | 1992 | 14 | |
| 17 | 1992 | 5 | |
| 18 | 1991 | 2 | |
| 19 | 1991 | 57 | |
| 20 | 1988 | 52 |
About W. Tsai
W. Tsai is a scholar working on Mechanics of Materials, Electronic, Optical and Magnetic Materials, Computational Mechanics, Software and Condensed Matter Physics, having authored 21 papers that have together received 369 indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (13 papers), Semiconductor materials and devices (11 papers), Copper Interconnects and Reliability (7 papers), Ion-surface interactions and analysis (6 papers), Diamond and Carbon-based Materials Research (4 papers), Physics of Superconductivity and Magnetism (2 papers), Semiconductor materials and interfaces (2 papers) and Software Reliability and Analysis Research (1 paper). The work is most often cited by research in Software (51 citations), Mechanics of Materials (149 citations), Electronic, Optical and Magnetic Materials (74 citations), Electrical and Electronic Engineering (202 citations) and Surfaces, Coatings and Films (21 citations). W. Tsai has collaborated with scholars based in United States, Canada and Taiwan. Frequent co-authors include M. Delfino, D. Hodul, J. A. Fair, T. Smy, Michael J. Brett, S. Salimian, S. K. Dew, C. B. Cooper, M. Riaziat and A. R. Ellingboe. Their work appears in journals such as Journal of Applied Physics, Thin Solid Films, Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.