W. M. Eden
- Automotive Engineering top 2%
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 5%
- Computer Networks and Communications top 10%
- Artificial Intelligence top 10%
- Co-authors
- Michael PechtKwok‐Leung TsuiYinjiao XingTommy W. S. ChowYu WangXiaohang JinL. L. ChengQiang Miao
- Topics
- Anomaly Detection Techniques and Applications (5 papers)Advanced Battery Technologies Research (4 papers)Fault Detection and Control Systems (2 papers)
- Journals
- Expert Systems with ApplicationsIEEE Transactions on Industrial InformaticsIEEE Transactions on Neural Networks and Learning Systems
- Partner nations
- Hong KongUnited StatesChina
In The Last Decade
W. M. Eden
12 papers receiving 711 citations
Peers
Comparison fields: 5 of 66
- Automotive Engineering 401
- Electrical and Electronic Engineering 390
- Control and Systems Engineering 188
- Computer Networks and Communications 158
- Artificial Intelligence 111
Countries citing papers authored by W. M. Eden
This map shows the geographic impact of W. M. Eden's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. M. Eden with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. M. Eden more than expected).
Fields of papers citing papers by W. M. Eden
This network shows the impact of papers produced by W. M. Eden. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. M. Eden. The network helps show where W. M. Eden may publish in the future.
Co-authorship network of co-authors of W. M. Eden
This figure shows the co-authorship network connecting the top 25 collaborators of W. M. Eden. A scholar is included among the top collaborators of W. M. Eden based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. M. Eden. W. M. Eden is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 8 | |
| 2 | 78 | |
| 3 | 66 | |
| 4 | 78 | |
| 5 | 4 | |
| 6 | 8 | |
| 7 | 2 | |
| 8 | 77 | |
| 9 | 14 | |
| 10 | 1 | |
| 11 | 17 | |
| 12 | 393 |
About W. M. Eden
W. M. Eden is a scholar working on Automotive Engineering, Software and Safety, Risk, Reliability and Quality, having authored 12 papers that have together received 746 indexed citations. Recurring topics across this work include Anomaly Detection Techniques and Applications (5 papers), Advanced Battery Technologies Research (4 papers) and Fault Detection and Control Systems (2 papers). The work is most often cited by research in Automotive Engineering (401 citations), Safety, Risk, Reliability and Quality (75 citations) and Control and Systems Engineering (188 citations). W. M. Eden has collaborated with scholars based in Hong Kong, United States and China. Frequent co-authors include Michael Pecht, Kwok‐Leung Tsui, Yinjiao Xing, Tommy W. S. Chow, Yu Wang, Xiaohang Jin, L. L. Cheng and Qiang Miao. Their work appears in journals such as Expert Systems with Applications, IEEE Transactions on Industrial Informatics and IEEE Transactions on Neural Networks and Learning Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.