Van Wagner

14 papers receiving 602 citations

Peers

Van Wagner
Comparison fields: 5 of 60
  • Electrical and Electronic Engineering 445
  • Control and Systems Engineering 181
  • Global and Planetary Change 166
  • Electronic, Optical and Magnetic Materials 123
  • Safety, Risk, Reliability and Quality 70
Replace Nguyễn Trung Hiếu with:
Nguyễn Trung Hiếu Vietnam
Saeed Jazebi United States
S. Liu United States
Rodrigo Pereira Brazil
C. S. Jha India
Kangwen Sun China
G. V. Nagesh Kumar India
Fangrong Zhou China
Gareth Lee Australia
Van Wagner relative to Nguyễn Trung Hiếu Vietnam Nguyễn Trung Hiếu's profile →
Citations per field
00.5×4.2×
Nguyễn Trung Hiếu · 1×
Citations per year

Countries citing papers authored by Van Wagner

Since Specialization
Citations

This map shows the geographic impact of Van Wagner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Van Wagner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Van Wagner more than expected).

Fields of papers citing papers by Van Wagner

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Van Wagner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Van Wagner. The network helps show where Van Wagner may publish in the future.

Co-authorship network of co-authors of Van Wagner

This figure shows the co-authorship network connecting the top 25 collaborators of Van Wagner. A scholar is included among the top collaborators of Van Wagner based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Van Wagner. Van Wagner is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 1
3 0
4 1
5 0
6 10
7 6
8 3
9 3
10 0
11 0
12 9
13 3
14 8
15 342
16 85
17
Lines of vision : drawings by contemporary women
0
18
Forest Fire Research--Hindsight and Foresight
4
19
Equations and FORTRAN program for the Canadian Forest Fire Weather Index System
165
20
Flammability of Christmas Trees
17

About Van Wagner

Van Wagner is a scholar working on Safety, Risk, Reliability and Quality, Electrical and Electronic Engineering and Astronomy and Astrophysics, having authored 21 papers that have together received 677 indexed citations. Recurring topics across this work include Power Quality and Harmonics (6 papers), Power System Reliability and Maintenance (4 papers) and Lightning and Electromagnetic Phenomena (3 papers). The work is most often cited by research in Control and Systems Engineering (181 citations), Global and Planetary Change (166 citations) and Electrical and Electronic Engineering (445 citations). Van Wagner has collaborated with scholars based in United States, France and Italy. Frequent co-authors include David Hartmann, Alexander McEachern, W.E. Reid, R.J. Ferraro, Ward Jewell, David Griffith, W.F. Horton, Julián Balda, Elias G. Strangas and L. Lloyd Morgan. Their work appears in journals such as IEEE Transactions on Industry Applications, IEEE Transactions on Power Delivery and IEEE Industry Applications Magazine.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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