Н. Н. Цыбин

474 total citations
37 papers, 310 citations indexed

About

Н. Н. Цыбин is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Radiation. According to data from OpenAlex, Н. Н. Цыбин has authored 37 papers receiving a total of 310 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 13 papers in Atomic and Molecular Physics, and Optics and 9 papers in Radiation. Recurrent topics in Н. Н. Цыбин's work include Advanced X-ray Imaging Techniques (7 papers), Semiconductor materials and interfaces (6 papers) and Advancements in Photolithography Techniques (5 papers). Н. Н. Цыбин is often cited by papers focused on Advanced X-ray Imaging Techniques (7 papers), Semiconductor materials and interfaces (6 papers) and Advancements in Photolithography Techniques (5 papers). Н. Н. Цыбин collaborates with scholars based in Russia, Germany and China. Н. Н. Цыбин's co-authors include Н. Н. Салащенко, A. Ya. Lopatin, В. И. Лучин, Н. И. Чхало, S. Yu. Zuev, А. Е. Пестов, Н. И. Чхало, E. B. Kluenkov, В. Н. Полковников and A. N. Nechay and has published in prestigious journals such as Applied Physics Letters, Optics Express and Thin Solid Films.

In The Last Decade

Н. Н. Цыбин

32 papers receiving 279 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Н. Н. Цыбин Russia 10 162 98 96 76 71 37 310
A. Ya. Lopatin Russia 11 188 1.2× 105 1.1× 117 1.2× 96 1.3× 90 1.3× 42 368
A. N. Nechay Russia 10 146 0.9× 72 0.7× 170 1.8× 90 1.2× 98 1.4× 32 356
Marc Roulliay France 11 144 0.9× 74 0.8× 145 1.5× 96 1.3× 32 0.5× 24 355
В. И. Лучин Russia 8 136 0.8× 81 0.8× 65 0.7× 71 0.9× 99 1.4× 35 352
Peter Gawlitza Germany 10 107 0.7× 65 0.7× 61 0.6× 128 1.7× 50 0.7× 42 320
Yurii P. Pershin Ukraine 12 145 0.9× 84 0.9× 162 1.7× 120 1.6× 47 0.7× 23 394
E. B. Kluenkov Russia 11 136 0.8× 78 0.8× 90 0.9× 106 1.4× 51 0.7× 33 374
Longyu Kuang China 10 84 0.5× 68 0.7× 114 1.2× 88 1.2× 66 0.9× 40 295
Andre Malvezzi Italy 12 127 0.8× 97 1.0× 118 1.2× 45 0.6× 20 0.3× 33 309
Guido Schriever Germany 12 253 1.6× 82 0.8× 184 1.9× 90 1.2× 117 1.6× 33 400

Countries citing papers authored by Н. Н. Цыбин

Since Specialization
Citations

This map shows the geographic impact of Н. Н. Цыбин's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Н. Н. Цыбин with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Н. Н. Цыбин more than expected).

Fields of papers citing papers by Н. Н. Цыбин

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Н. Н. Цыбин. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Н. Н. Цыбин. The network helps show where Н. Н. Цыбин may publish in the future.

Co-authorship network of co-authors of Н. Н. Цыбин

This figure shows the co-authorship network connecting the top 25 collaborators of Н. Н. Цыбин. A scholar is included among the top collaborators of Н. Н. Цыбин based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Н. Н. Цыбин. Н. Н. Цыбин is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Чхало, Н. И., М. Н. Дроздов, A. Ya. Lopatin, et al.. (2023). Study of the temporal stability of the reflection coefficient in the vicinity of 58.4 nm of narrow-band Sc/Al mirrors with Si or ScN interlayers and a MoSi2 protective cap layer. Thin Solid Films. 783. 140047–140047.
2.
Zuev, S. Yu., A. Ya. Lopatin, В. И. Лучин, et al.. (2023). Protective Free-Standing Films for Projection Lithography Installations in the Extreme UV Range. Russian Microelectronics. 52(5). 344–355. 1 indexed citations
3.
Kuzin, Sergey, С. А. Богачев, A. A. Pertsov, et al.. (2023). EUV telescope for a Cubesat nanosatellite. Applied Optics. 62(31). 8462–8462. 1 indexed citations
4.
Zuev, S. Yu., A. Ya. Lopatin, В. И. Лучин, et al.. (2023). Comparative Study of the Thermal Stability of Be-Based Extreme Ultraviolet Pellicles. Technical Physics. 68(S3). S630–S636. 1 indexed citations
5.
Лучин, В. И., et al.. (2022). Search for high-strength multilayer free-standing film filters with high transmittance in the wavelength range of the "water window" (2.3-4.4 nm). Журнал технической физики. 92(8). 949–949.
6.
Nechay, A. N., А. Е. Пестов, В. Н. Полковников, et al.. (2022). Measurements of the absolute values of the radiation intensity in the wavelength range of 6.6-32 nm of stainless steel targets with pulsed laser excitation. Журнал технической физики. 92(13). 2027–2027.
7.
Чхало, Н. И., М. Н. Торопов, А. Е. Пестов, et al.. (2022). High-aperture EUV microscope using multilayer mirrors and a 3D reconstruction algorithm based on z-tomography. Optics Express. 30(26). 47567–47567. 3 indexed citations
8.
Zuev, S. Yu., A. Ya. Lopatin, В. И. Лучин, et al.. (2020). Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation. Technical Physics. 65(11). 1726–1735. 2 indexed citations
9.
Zorina, М. V., А. Е. Пестов, В. Н. Полковников, et al.. (2020). Projection Objective For an EUV-Lithographic Workbench. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 14(3). 562–573. 1 indexed citations
10.
Свечников, М. В., Н. И. Чхало, В. Н. Полковников, et al.. (2019). Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV. Journal of Synchrotron Radiation. 27(1). 75–82. 7 indexed citations
11.
Чхало, Н. И., Evgueni Meltchakov, Franck Delmotte, et al.. (2019). Stable Multilayer Reflective Coatings for λ(HeI) = 58.4 nm for the KORTES Solar Telescope. Technical Physics Letters. 45(2). 85–88. 8 indexed citations
12.
13.
Чхало, Н. И., С. В. Голубев, A. Ya. Lopatin, et al.. (2018). A double-stream Xe:He jet plasma emission in the vicinity of 6.7 nm. Applied Physics Letters. 112(22). 18 indexed citations
14.
Zuev, S. Yu., A. Ya. Lopatin, A. N. Nechay, et al.. (2017). Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5 – 50 nm: description and testing results. Quantum Electronics. 47(4). 385–392. 20 indexed citations
15.
Пестов, А. Е., В. Н. Полковников, Н. Н. Салащенко, et al.. (2016). X-ray optical system for imaging laser plumes with a spatial resolution of up to 70 nm. Quantum Electronics. 46(4). 347–352. 2 indexed citations
16.
Чхало, Н. И., М. Н. Дроздов, E. B. Kluenkov, et al.. (2016). Thin film multilayer filters for solar EUV telescopes. Applied Optics. 55(17). 4683–4683. 30 indexed citations
17.
Гусев, С. А., М. Н. Дроздов, E. B. Kluenkov, et al.. (2012). Thermal stability of a freestanding EUV filter under long-term vacuum annealing at 700–1000°C. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 6(3). 482–486. 3 indexed citations
18.
Чхало, Н. И., М. Н. Дроздов, A. Ya. Lopatin, et al.. (2012). Free-standing spectral purity filters for extreme ultraviolet lithography. Journal of Micro/Nanolithography MEMS and MOEMS. 11(2). 21115–1. 33 indexed citations
19.
Дроздов, М. Н., Yu. N. Drozdov, E. B. Kluenkov, et al.. (2010). SIMS study of annealing effect on element distribution in free-standing Al/Si and Zr/ZrSi2 multilayer films. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 4(3). 405–410. 1 indexed citations
20.
Чхало, Н. И., С. А. Гусев, М. Н. Дроздов, et al.. (2009). Influence of annealing on the structural and optical properties of thin multilayer EUV filters containing Zr, Mo, and silicides of these metals. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7521. 752105–752105. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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