U. Welzel

3.0k total citations · 1 hit paper
93 papers, 2.6k citations indexed

About

U. Welzel is a scholar working on Materials Chemistry, Mechanics of Materials and Mechanical Engineering. According to data from OpenAlex, U. Welzel has authored 93 papers receiving a total of 2.6k indexed citations (citations by other indexed papers that have themselves been cited), including 53 papers in Materials Chemistry, 49 papers in Mechanics of Materials and 36 papers in Mechanical Engineering. Recurrent topics in U. Welzel's work include Metal and Thin Film Mechanics (39 papers), Microstructure and mechanical properties (34 papers) and Microstructure and Mechanical Properties of Steels (22 papers). U. Welzel is often cited by papers focused on Metal and Thin Film Mechanics (39 papers), Microstructure and mechanical properties (34 papers) and Microstructure and Mechanical Properties of Steels (22 papers). U. Welzel collaborates with scholars based in Germany, China and Italy. U. Welzel's co-authors include E. J. Mittemeijer, P. Lamparter, Arnold C. Vermeulen, M. Wohlschlögel, Matteo Leoni, W. Hügel, Yener Kuru, Gayatri Rane, Mohan Kumar Anand Raj and J. Chakraborty and has published in prestigious journals such as Nano Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

U. Welzel

92 papers receiving 2.5k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

2005 492 citations U. Welzel, P. Lamparter et al. profile →

Peers

Countries citing papers authored by U. Welzel

Since Specialization

Citations

This map shows the geographic impact of U. Welzel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by U. Welzel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites U. Welzel more than expected).

Fields of papers citing papers by U. Welzel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by U. Welzel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by U. Welzel. The network helps show where U. Welzel may publish in the future.

Co-authorship network of co-authors of U. Welzel

This figure shows the co-authorship network connecting the top 25 collaborators of U. Welzel. A scholar is included among the top collaborators of U. Welzel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with U. Welzel. U. Welzel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Qualitative Model Describing Hot Tear Above VIPPO and Numerous Other Design Elements 2020 ·(unknown), U. Welzel, (unknown), (unknown)	1
2	The Role of Silver in Mitigation of Whisker Formation on Thin Tin Films 2014 ·Journal of Electronic Materials ·(unknown), (unknown), U. Welzel, (unknown), E. J. Mittemeijer	4
3	Modern Diffraction Methods 2012 ·CERN Document Server (European Organization for Nuclear Research) ·E. J. Mittemeijer, U. Welzel	48
4	Nanoscale planar faulting in nanocrystalline Ni–W thin films: Grain growth, segregation, and residual stress 2011 ·Journal of materials research/Pratt's guide to venture capital sources ·U. Welzel, Johannes Kümmel, E. Bischoff, (unknown), E. J. Mittemeijer	15
5	Tailoring the stress-depth profile in thin films; the case of γ’-Fe4N1-x 2011 ·Thin Solid Films ·M. Wohlschlögel, U. Welzel, E. J. Mittemeijer	4
6	Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling 2011 ·Max Planck Institute for Plasma Physics ·Gayatri Rane, Daniel Apel, U. Welzel, E. J. Mittemeijer	1
7	Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements 2009 ·Powder Diffraction ·Yener Kuru, M. Wohlschlögel, U. Welzel, E. J. Mittemeijer	3
8	Extremely anisotropic, direction-dependent elastic grain interaction: The case of ultrathin films 2009 ·Applied Physics Letters ·U. Welzel, Mohan Kumar Anand Raj, E. J. Mittemeijer	21
9	Stacking and twin faults in close-packed crystal structures: exact description of random faulting statistics for the full range of faulting probabilities 2008 ·Acta Crystallographica Section A Foundations of Crystallography ·E. Estevez‐Rams, U. Welzel, (unknown), E. J. Mittemeijer	18
10	Interdiffusion, phase formation, and stress development in Cu–Pd thin-film diffusion couples: Interface thermodynamics and mechanisms 2008 ·Journal of Applied Physics ·J. Chakraborty, U. Welzel, E. J. Mittemeijer	42
11	Unexpected formation of ε iron nitride by gas nitriding of nanocrystalline α-Fe films 2007 ·Applied Physics Letters ·M. Wohlschlögel, U. Welzel, E. J. Mittemeijer	25
12	The analysis of homogeneously and inhomogeneously anisotropic microstructures by X-ray diffraction 2005 ·Powder Diffraction ·U. Welzel, E. J. Mittemeijer	11
13	Polycapillary optics for materials science studies: Instrumental effects and their correction 2004 ·Journal of Research of the National Institute of Standards and Technology ·Matteo Leoni, U. Welzel, Paolo Scardi	29
14	European Powder Diffraction EPDIC 8 2004 ·Trans Tech Publications Ltd. eBooks ·Yvonne Andersson, E. J. Mittemeijer, U. Welzel	5
15	Applicability of the Crystallite Group Method to Fibre Textured Specimens 2004 ·Materials science forum ·U. Welzel, E. J. Mittemeijer	13
16	The determination of stresses in thin films; modelling elastic grain interaction 2003 ·The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics ·U. Welzel, Matteo Leoni, E. J. Mittemeijer	66
17	Stress, texture, and microstructure in niobium thin films sputter deposited onto amorphous substrates 2003 ·Journal of Applied Physics ·B. Okolo, P. Lamparter, U. Welzel, E. J. Mittemeijer	35
18	Stress in thin films; Diffraction elastic constants and grain interaction 2002 ·Journal of Material Science and Technology ·U. Welzel, Matteo Leoni, P. Lamparter, E. J. Mittemeijer	1
19	Changes in Stress and Microstructure in Sputter Deposited Copper Films Due to Substrate Surface Effects 2002 ·Materials science forum ·B. Okolo, P. Lamparter, U. Welzel, Thomas Wagner, E. J. Mittemeijer	2
20	Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: Theoretical basis and simulation 2001 ·Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties ·Matteo Leoni, U. Welzel, P. Lamparter, E. J. Mittemeijer, J.-D. Kamminga	39

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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