Simone Pampuri

1.3k total citations · 1 hit paper
24 papers, 947 citations indexed

About

Simone Pampuri is a scholar working on Statistics, Probability and Uncertainty, Industrial and Manufacturing Engineering and Control and Systems Engineering. According to data from OpenAlex, Simone Pampuri has authored 24 papers receiving a total of 947 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Statistics, Probability and Uncertainty, 13 papers in Industrial and Manufacturing Engineering and 9 papers in Control and Systems Engineering. Recurrent topics in Simone Pampuri's work include Advanced Statistical Process Monitoring (13 papers), Industrial Vision Systems and Defect Detection (13 papers) and Fault Detection and Control Systems (9 papers). Simone Pampuri is often cited by papers focused on Advanced Statistical Process Monitoring (13 papers), Industrial Vision Systems and Defect Detection (13 papers) and Fault Detection and Control Systems (9 papers). Simone Pampuri collaborates with scholars based in Italy, Ireland and Austria. Simone Pampuri's co-authors include Andrea Schirru, Gian Antonio Susto, Alessandro Beghi, Seán McLoone, Giuseppe De Nicolao, Cristina De Luca, Giuseppe Fazio, Jian Wan, Matteo Terzi and Chiara Masiero and has published in prestigious journals such as IEEE Transactions on Industrial Informatics, Computers & Operations Research and Control Engineering Practice.

In The Last Decade

Simone Pampuri

24 papers receiving 911 citations

Hit Papers

Machine Learning for Predictive Maintenance: A Multiple C... 2014 2026 2018 2022 2014 100 200 300 400 500

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Simone Pampuri Italy 15 421 388 173 150 136 24 947
Andrea Schirru Italy 14 408 1.0× 377 1.0× 167 1.0× 146 1.0× 133 1.0× 24 926
Symone Gomes Soares Alcalá Brazil 9 296 0.7× 388 1.0× 64 0.4× 263 1.8× 141 1.0× 24 1.1k
Jun‐Geol Baek South Korea 16 290 0.7× 287 0.7× 127 0.7× 244 1.6× 144 1.1× 94 910
Brian A. Weiss United States 15 241 0.6× 374 1.0× 50 0.3× 137 0.9× 174 1.3× 67 898
Huawei Wang China 17 178 0.4× 653 1.7× 90 0.5× 132 0.9× 354 2.6× 67 1.1k
Pierre Dersin France 12 101 0.2× 486 1.3× 70 0.4× 126 0.8× 200 1.5× 48 832
Mohamed-Salah Ouali Canada 13 83 0.2× 302 0.8× 129 0.7× 87 0.6× 151 1.1× 38 726
Khanh T.P. Nguyen France 16 112 0.3× 573 1.5× 146 0.8× 90 0.6× 222 1.6× 57 1.1k
Lee J. Wells United States 16 370 0.9× 157 0.4× 183 1.1× 70 0.5× 139 1.0× 43 833

Countries citing papers authored by Simone Pampuri

Since Specialization
Citations

This map shows the geographic impact of Simone Pampuri's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Simone Pampuri with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Simone Pampuri more than expected).

Fields of papers citing papers by Simone Pampuri

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Simone Pampuri. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Simone Pampuri. The network helps show where Simone Pampuri may publish in the future.

Co-authorship network of co-authors of Simone Pampuri

This figure shows the co-authorship network connecting the top 25 collaborators of Simone Pampuri. A scholar is included among the top collaborators of Simone Pampuri based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Simone Pampuri. Simone Pampuri is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Susto, Gian Antonio, Andrea Schirru, Simone Pampuri, Alessandro Beghi, & Giuseppe De Nicolao. (2018). A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing. Control Engineering Practice. 74. 84–94. 35 indexed citations
2.
Susto, Gian Antonio, Matteo Terzi, Chiara Masiero, Simone Pampuri, & Andrea Schirru. (2018). A Fraud Detection Decision Support System via Human On-Line Behavior Characterization and Machine Learning. Research Padua Archive (University of Padua). 9–14. 5 indexed citations
3.
Susto, Gian Antonio, Andrea Schirru, Simone Pampuri, & Seán McLoone. (2015). Supervised Aggregative Feature Extraction for Big Data Time Series Regression. IEEE Transactions on Industrial Informatics. 12(3). 1243–1252. 56 indexed citations
4.
Kurz, Daniel, Jürgen Pilz, Andrea Schirru, Simone Pampuri, & Cristina De Luca. (2014). A sampling decision system for semiconductor manufacturing - relying on virtual metrology and actual measurements. Proceedings of the Winter Simulation Conference 2014. 2649–2660. 3 indexed citations
5.
Wan, Jian, et al.. (2014). On Regression Methods for Virtual Metrology in Semiconductor Manufacturing. Research Portal (Queen's University Belfast). 380–385. 14 indexed citations
6.
Susto, Gian Antonio, Andrea Schirru, Simone Pampuri, Seán McLoone, & Alessandro Beghi. (2014). Machine Learning for Predictive Maintenance: A Multiple Classifier Approach. IEEE Transactions on Industrial Informatics. 11(3). 812–820. 530 indexed citations breakdown →
7.
Susto, Gian Antonio, Simone Pampuri, Andrea Schirru, Alessandro Beghi, & Giuseppe De Nicolao. (2014). Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach. Computers & Operations Research. 53. 328–337. 59 indexed citations
8.
Susto, Gian Antonio, et al.. (2013). A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation. Research Portal (Queen's University Belfast). 21 indexed citations
9.
Susto, Gian Antonio, et al.. (2013). Prediction of integral type failures in semiconductor manufacturing through classification methods. Research Portal (Queen's University Belfast). 1–4. 22 indexed citations
10.
Pampuri, Simone, Andrea Schirru, Gian Antonio Susto, et al.. (2012). Multistep virtual metrology approaches for semiconductor manufacturing processes. Padua Research Archive (University of Padova). 91–96. 16 indexed citations
11.
Susto, Gian Antonio, Simone Pampuri, Andrea Schirru, & Alessandro Beghi. (2012). Optimal tuning of epitaxy pyrometers. Padua Research Archive (University of Padova). 6. 294–299. 12 indexed citations
12.
Schirru, Andrea, Gian Antonio Susto, Simone Pampuri, & Seán McLoone. (2012). Learning from time series: Supervised Aggregative Feature Extraction. Research Portal (Queen's University Belfast). 5254–5259. 17 indexed citations
13.
Susto, Gian Antonio, Andrea Schirru, Simone Pampuri, & Alessandro Beghi. (2012). A predictive maintenance system based on regularization methods for ion-implantation. Padua Research Archive (University of Padova). 175–180. 18 indexed citations
14.
Susto, Gian Antonio, Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao, & Alessandro Beghi. (2012). An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control. Padua Research Archive (University of Padova). 20. 358–363. 13 indexed citations
15.
Schirru, Andrea, Simone Pampuri, Giuseppe De Nicolao, & Seán McLoone. (2011). Efficient Marginal Likelihood Computation for Gaussian Process Regression. arXiv (Cornell University). 1110. 1 indexed citations
16.
Schirru, Andrea, Simone Pampuri, Cristina De Luca, & Giuseppe De Nicolao. (2011). NONPARAMETRIC VIRTUAL SENSORS FOR SEMICONDUCTOR MANUFACTURING - Using Information Theoretic Learning and Kernel Machines. 349–358. 1 indexed citations
17.
Pampuri, Simone, Andrea Schirru, Giuseppe Fazio, & Giuseppe De Nicolao. (2011). Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing. 244–249. 28 indexed citations
18.
Schirru, Andrea, Simone Pampuri, Cristina De Luca, & Giuseppe De Nicolao. (2011). Multilevel Kernel Methods for Virtual Metrology in Semiconductor Manufacturing. IFAC Proceedings Volumes. 44(1). 11614–11621. 24 indexed citations
19.
Schirru, Andrea, Simone Pampuri, & Giuseppe De Nicolao. (2010). Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing. 12 indexed citations
20.
Schirru, Andrea, Simone Pampuri, & Giuseppe De Nicolao. (2010). Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing. 22 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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