Simon G. Kaplan

893 total citations
58 papers, 660 citations indexed

About

Simon G. Kaplan is a scholar working on Aerospace Engineering, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, Simon G. Kaplan has authored 58 papers receiving a total of 660 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Aerospace Engineering, 18 papers in Electrical and Electronic Engineering and 16 papers in Biomedical Engineering. Recurrent topics in Simon G. Kaplan's work include Calibration and Measurement Techniques (26 papers), Optical Polarization and Ellipsometry (11 papers) and Surface Roughness and Optical Measurements (9 papers). Simon G. Kaplan is often cited by papers focused on Calibration and Measurement Techniques (26 papers), Optical Polarization and Ellipsometry (11 papers) and Surface Roughness and Optical Measurements (9 papers). Simon G. Kaplan collaborates with scholars based in United States, Egypt and India. Simon G. Kaplan's co-authors include John H. Burnett, Leonard M. Hanssen, H. D. Drew, M. Quijada, D. B. Tanner, Ge Xiong, T. Venkatesan, R. Ramesh, C. Kwon and Allan H. Harvey and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Analytica Chimica Acta.

In The Last Decade

Simon G. Kaplan

58 papers receiving 602 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Simon G. Kaplan United States 14 230 182 165 157 150 58 660
R. Espiau de Lamaëstre France 15 287 1.2× 142 0.8× 271 1.6× 58 0.4× 211 1.4× 26 629
K. Shirasawa Japan 14 300 1.3× 106 0.6× 108 0.7× 103 0.7× 198 1.3× 45 610
Solomon I. Woods United States 13 166 0.7× 254 1.4× 170 1.0× 465 3.0× 123 0.8× 49 834
E. Johnson United States 17 583 2.5× 174 1.0× 139 0.8× 223 1.4× 232 1.5× 84 1.3k
Kai-Ming Ho United States 16 182 0.8× 274 1.5× 155 0.9× 124 0.8× 436 2.9× 34 932
K. Mika Germany 13 122 0.5× 166 0.9× 82 0.5× 199 1.3× 205 1.4× 46 605
Evgeny Nazaretski United States 23 286 1.2× 146 0.8× 287 1.7× 193 1.2× 298 2.0× 90 1.5k
J. M. Desvignes France 17 462 2.0× 217 1.2× 109 0.7× 68 0.4× 242 1.6× 81 736
R. Parodi Italy 16 428 1.9× 133 0.7× 243 1.5× 218 1.4× 281 1.9× 92 1.0k
M. J. Goringe United Kingdom 16 192 0.8× 181 1.0× 241 1.5× 385 2.5× 415 2.8× 100 1.1k

Countries citing papers authored by Simon G. Kaplan

Since Specialization
Citations

This map shows the geographic impact of Simon G. Kaplan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Simon G. Kaplan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Simon G. Kaplan more than expected).

Fields of papers citing papers by Simon G. Kaplan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Simon G. Kaplan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Simon G. Kaplan. The network helps show where Simon G. Kaplan may publish in the future.

Co-authorship network of co-authors of Simon G. Kaplan

This figure shows the co-authorship network connecting the top 25 collaborators of Simon G. Kaplan. A scholar is included among the top collaborators of Simon G. Kaplan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Simon G. Kaplan. Simon G. Kaplan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Burnett, John H., et al.. (2016). Refractive index measurements of Ge. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9974. 99740X–99740X. 19 indexed citations
2.
Kaplan, Simon G., et al.. (2013). Dependence of the color brown on the spatial configuration of high luminance surrounds. Investigative Ophthalmology & Visual Science. 54(15). 3021–3021. 1 indexed citations
3.
Woods, Solomon I., et al.. (2011). Characterization of the optical properties of an infrared blocked impurity band detector. Applied Optics. 50(24). 4824–4824. 10 indexed citations
4.
Kaplan, Simon G.. (2009). Index of refraction of high-index lithographic immersion fluids and its variability. Journal of Micro/Nanolithography MEMS and MOEMS. 8(2). 23005–23005. 6 indexed citations
5.
Burnett, John H., Eric C. Benck, Simon G. Kaplan, Gabriel Y. Sirat, & Chris A. Mack. (2009). Birefringence issues with uniaxial crystals as last lens elements for high-index immersion lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7274. 727421–727421. 2 indexed citations
6.
Smith, A. W., et al.. (2008). A sensitive, spatially uniform photodetector for broadband infrared spectrophotometry. Applied Optics. 47(13). 2430–2430. 11 indexed citations
7.
Kaplan, Simon G. & John H. Burnett. (2006). Optical properties of fluids for 248 and 193 nm immersion photolithography. Applied Optics. 45(8). 1721–1721. 20 indexed citations
8.
Synowicki, R. A., Greg K. Pribil, Craig M. Herzinger, et al.. (2004). Fluid refractive index measurements using roughened surface and prism minimum deviation techniques. Journal of Vacuum Science and Technology. 6 indexed citations
9.
Gupta, Rajeev & Simon G. Kaplan. (2003). High accuracy ultraviolet index of refraction measurements using a Fourier transform spectrometer. Journal of Research of the National Institute of Standards and Technology. 108(6). 429–429. 11 indexed citations
10.
Arp, Uwe, Steven Grantham, Simon G. Kaplan, et al.. (2003). 40 Years of Metrology With Synchrotron Radiation at SURF. Synchrotron Radiation News. 16(5). 1 indexed citations
11.
Hanssen, Leonard M. & Simon G. Kaplan. (2003). Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4826. 21–21. 1 indexed citations
12.
Kaplan, Simon G. & Michael E. Thomas. (2002). Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K. 1 indexed citations
13.
Kaplan, Simon G. & Michael E. Thomas. (2002). Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10K to 295K. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4822. 41–41. 6 indexed citations
14.
Hanssen, Leonard M. & Simon G. Kaplan. (2001). Infrared Transmittance Standards-2053, 2054, 2055, and 2056. 1 indexed citations
15.
Hanssen, Leonard M., Simon G. Kaplan, & Sergey Mekhontsev. (2001). Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials. 8 indexed citations
16.
Yang, Di, Michael E. Thomas, William J. Tropf, & Simon G. Kaplan. (2000). Infrared refractive index measurements using a new method. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4103. 42–42. 5 indexed citations
17.
Kaplan, Simon G., Leonard M. Hanssen, Ulf Griesmann, & Rajeev Gupta. (1998). Fourier transform refractometry. Proc SPIE. 3425. 3 indexed citations
18.
Kaplan, Simon G., et al.. (1998). <title>Characterization of high-OD ultrathin infrared neutral density filters</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3425. 56–63. 2 indexed citations
19.
Kaplan, Simon G., Min Chen, H. D. Drew, et al.. (1994). Far-infrared transmission of YBa2Cu3O7−δ thin films with columnar defects. Physica C Superconductivity. 232(1-2). 174–180. 2 indexed citations
20.
Mehrotra, Vivek, Simon G. Kaplan, A. J. Sievers, & Emmanuel P. Giannelis. (1993). Ferroelectric behavior of pulsed laser deposited BaxSr1−xTiO3 thin films. Journal of materials research/Pratt's guide to venture capital sources. 8(6). 1209–1212. 21 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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