Shuai Lu
- Computer Vision and Pattern Recognition top 10%
- Industrial and Manufacturing Engineering top 5%
- Artificial Intelligence
- Radiology, Nuclear Medicine and Imaging
- Computer Networks and Communications top 10%
- Topics
- Industrial Vision Systems and Defect Detection (14 papers)Image Processing Techniques and Applications (11 papers)Retinal Imaging and Analysis (9 papers)
- Journals
- Journal of Materials Chemistry AIEEE Transactions on Image ProcessingExpert Systems with Applications
- Partner nations
- ChinaUnited StatesHong Kong
In The Last Decade
Shuai Lu
36 papers receiving 432 citations
Peers
Comparison fields: 5 of 62
- Computer Vision and Pattern Recognition 134
- Industrial and Manufacturing Engineering 118
- Artificial Intelligence 90
- Radiology, Nuclear Medicine and Imaging 87
- Computer Networks and Communications 82
Countries citing papers authored by Shuai Lu
This map shows the geographic impact of Shuai Lu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shuai Lu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shuai Lu more than expected).
Fields of papers citing papers by Shuai Lu
This network shows the impact of papers produced by Shuai Lu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shuai Lu. The network helps show where Shuai Lu may publish in the future.
Co-authorship network of co-authors of Shuai Lu
This figure shows the co-authorship network connecting the top 25 collaborators of Shuai Lu. A scholar is included among the top collaborators of Shuai Lu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shuai Lu. Shuai Lu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 6 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 3 | |
| 5 | 1 | |
| 6 | 9 | |
| 7 | 1 | |
| 8 | 9 | |
| 9 | 1 | |
| 10 | 21 | |
| 11 | 10 | |
| 12 | 16 | |
| 13 | 5 | |
| 14 | 7 | |
| 15 | 33 | |
| 16 | Phone Position Independent Recognition of FineWalking Modes with Phone Sensors. | 1 |
| 17 | 8 | |
| 18 | 11 | |
| 19 | 1 | |
| 20 | 27 |
About Shuai Lu
Shuai Lu is a scholar working on Media Technology, Industrial and Manufacturing Engineering and Computer Vision and Pattern Recognition, having authored 41 papers that have together received 457 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (14 papers), Image Processing Techniques and Applications (11 papers) and Retinal Imaging and Analysis (9 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (118 citations), Modeling and Simulation (36 citations) and Ophthalmology (62 citations). Shuai Lu has collaborated with scholars based in China, United States and Hong Kong. Frequent co-authors include Le Yao, Huiqi Li, Sergei V. Pereverzev, Xiang Xu, Hanruo Liu, Ningli Wang, Yongli Xu, Qun Li, Bo Sheng and Chiu C. Tan. Their work appears in journals such as Journal of Materials Chemistry A, IEEE Transactions on Image Processing and Expert Systems with Applications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.