S.D. Parker
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 5
-
- Semiconductor Quantum Structures and Devices 11
- Surface and Thin Film Phenomena 5
- Semiconductor materials and interfaces 3
-
- Advanced Semiconductor Detectors and Materials 12
- Integrated Circuits and Semiconductor Failure Analysis 2
- Semiconductor materials and devices 2
- Chalcogenide Semiconductor Thin Films 2
- Co-authors
- R. DroopadG.E. RheadRobin L. WilliamsR. A. StradlingS. N. HolmesPeter J. DobsonD. W. PashleyA. E. Staton-Bevan
- Cited by
- Surfaces, Coatings and FilmsAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Journals
- Semiconductor Science and Technology (7 papers)Surface Science (6 papers)Chemical Physics Letters (1 paper)
- Partner nations
- United KingdomFranceUnited States
In The Last Decade
S.D. Parker
19 papers receiving 408 citations
Peers
Comparison fields: 5 of 28
- Surfaces, Coatings and Films 79
- Atomic and Molecular Physics, and Optics 328
- Electrical and Electronic Engineering 291
- Materials Chemistry 140
- Condensed Matter Physics 27
Countries citing papers authored by S.D. Parker
This map shows the geographic impact of S.D. Parker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.D. Parker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.D. Parker more than expected).
Fields of papers citing papers by S.D. Parker
This network shows the impact of papers produced by S.D. Parker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.D. Parker. The network helps show where S.D. Parker may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S.D. Parker, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 1992 | 16 | |
| 3 | 1991 | 1 | |
| 4 | 1991 | 13 | |
| 5 | 1990 | 25 | |
| 6 | 1990 | 20 | |
| 7 | 1990 | 23 | |
| 8 | 1990 | 15 | |
| 9 | 1990 | 36 | |
| 10 | 1989 | 13 | |
| 11 | 1989 | 16 | |
| 12 | 1989 | 22 | |
| 13 | 1989 | 69 | |
| 14 | 1989 | 31 | |
| 15 | 1986 | 31 | |
| 16 | 1986 | 26 | |
| 17 | 1986 | 27 | |
| 18 | 1986 | 4 | |
| 19 | 1985 | 23 | |
| 20 | 1984 | 16 |
About S.D. Parker
S.D. Parker is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Catalysis and Physical and Theoretical Chemistry, having authored 20 papers that have together received 427 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (12 papers), Semiconductor Quantum Structures and Devices (11 papers), Surface and Thin Film Phenomena (5 papers), Electron and X-Ray Spectroscopy Techniques (5 papers), Semiconductor materials and interfaces (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Semiconductor materials and devices (2 papers) and Chalcogenide Semiconductor Thin Films (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (79 citations), Atomic and Molecular Physics, and Optics (328 citations), Electrical and Electronic Engineering (291 citations), Materials Chemistry (140 citations) and Condensed Matter Physics (27 citations). S.D. Parker has collaborated with scholars based in United Kingdom, France and United States. Frequent co-authors include R. Droopad, G.E. Rhead, Robin L. Williams, R. A. Stradling, S. N. Holmes, Peter J. Dobson, D. W. Pashley, A. E. Staton-Bevan, E. Skuras and R.G. Egdell. Their work appears in journals such as Semiconductor Science and Technology, Surface Science, Chemical Physics Letters, Catalysis Today and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.