Scott Sills

782 citations
20 papers · 577 indexed · h-index 12

Scott Sills

20 papers receiving 564 citations

Peers

Scott Sills
Comparison fields: 5 of 42
  • Polymers and Plastics 122
  • Electrical and Electronic Engineering 366
  • Atomic and Molecular Physics, and Optics 159
  • Mechanics of Materials 120
  • Cellular and Molecular Neuroscience 77
Replace M. Orłowski with:
M. Orłowski United States
Mirko Fraschke Germany
Nobuyoshi Awaya Japan
S. Hall United Kingdom
D. Wolansky Germany
Kazuya Ishihara Japan
Yuanhai Lin China
T. Witters Belgium
V. Ioannou-Sougleridis Greece
Nicolò Zagni Italy
Scott Sills relative to M. Orłowski United States M. Orłowski's profile →
Citations per field
00.5×3.9×
M. Orłowski · 1×
Citations per year

Countries citing papers authored by Scott Sills

Since Specialization
Citations

This map shows the geographic impact of Scott Sills's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scott Sills with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scott Sills more than expected).

Fields of papers citing papers by Scott Sills

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Scott Sills. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scott Sills. The network helps show where Scott Sills may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Scott Sills, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Scott Sills Line = papers co-authored together Scott Sills links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 201810
2 201633
3 201511
4 201516
5 20152
6 20157
7 201533
8 201513
9 201582
10 201451
11 201432
12 201440
13 20102
14 20071
15 200631
16 20059
17 20059
18 200543
19 200460
20 200392

About Scott Sills

Scott Sills is a scholar working on Materials Chemistry, Polymers and Plastics and Electrical and Electronic Engineering, having authored 20 papers that have together received 577 indexed citations. Recurring topics across this work include Advanced Memory and Neural Computing (11 papers), Ferroelectric and Negative Capacitance Devices (11 papers), Force Microscopy Techniques and Applications (6 papers), Electronic and Structural Properties of Oxides (5 papers), Semiconductor materials and devices (5 papers), Adhesion, Friction, and Surface Interactions (3 papers), Material Dynamics and Properties (3 papers) and Mechanical and Optical Resonators (2 papers). The work is most often cited by research in Polymers and Plastics (122 citations), Electrical and Electronic Engineering (366 citations) and Atomic and Molecular Physics, and Optics (159 citations). Scott Sills has collaborated with scholars based in United States, Italy and Switzerland. Frequent co-authors include René M. Overney, Alessandro Calderoni, Nirmal Ramaswamy, Simone Balatti, Stefano Ambrogio, Zhongqiang Wang, Daniele Ielmini, Jane Frommer, Tomoko Gray and Victor Y. Lee. Their work appears in journals such as The Journal of Chemical Physics, IEEE Transactions on Electron Devices, Journal of Adhesion Science and Technology, Microelectronic Engineering and Tribology Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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