S.C. Choo

777 total citations
41 papers, 602 citations indexed

About

S.C. Choo is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, S.C. Choo has authored 41 papers receiving a total of 602 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 24 papers in Atomic and Molecular Physics, and Optics and 3 papers in Surfaces, Coatings and Films. Recurrent topics in S.C. Choo's work include Silicon and Solar Cell Technologies (19 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers) and Semiconductor materials and interfaces (12 papers). S.C. Choo is often cited by papers focused on Silicon and Solar Cell Technologies (19 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers) and Semiconductor materials and interfaces (12 papers). S.C. Choo collaborates with scholars based in Singapore, United States and Canada. S.C. Choo's co-authors include M.S. Leong, L.S. Tan, Thomas I. Seidman, E.L. Heasell, R. G. Mazur, HuiQi Hong, H. Yamasaki, Linhu Li, Ling Li and Hian Hian See and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and Review of Scientific Instruments.

In The Last Decade

S.C. Choo

41 papers receiving 538 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
S.C. Choo Singapore	13	540	287	77	38	31	41	602
D.H. Navon United States	17	551 1.0×	149 0.5×	70 0.9×	24 0.6×	23 0.7×	43	598
P. Spirito Italy	22	1.2k 2.2×	239 0.8×	93 1.2×	57 1.5×	36 1.2×	109	1.2k
C. H. Bajorek United States	12	208 0.4×	165 0.6×	89 1.2×	80 2.1×	71 2.3×	22	429
R.J. Van Overstraeten Belgium	17	968 1.8×	426 1.5×	184 2.4×	14 0.4×	11 0.4×	43	1.1k
M.S.P. Lucas United States	7	301 0.6×	153 0.5×	30 0.4×	13 0.3×	81 2.6×	19	390
P.L. Hower United States	20	1.0k 1.9×	122 0.4×	239 3.1×	32 0.8×	11 0.4×	47	1.1k
S. Riva-Sanseverino Italy	11	291 0.5×	219 0.8×	68 0.9×	7 0.2×	13 0.4×	27	364
M. Matsuzaki Japan	12	161 0.3×	269 0.9×	104 1.4×	39 1.0×	73 2.4×	22	385
P. Kamiński Poland	14	351 0.7×	140 0.5×	138 1.8×	24 0.6×	55 1.8×	68	455
Katsuaki Saito Japan	12	373 0.7×	116 0.4×	55 0.7×	23 0.6×	22 0.7×	24	425

Countries citing papers authored by S.C. Choo

Since Specialization

Citations

This map shows the geographic impact of S.C. Choo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.C. Choo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.C. Choo more than expected).

Fields of papers citing papers by S.C. Choo

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.C. Choo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.C. Choo. The network helps show where S.C. Choo may publish in the future.

Co-authorship network of co-authors of S.C. Choo

This figure shows the co-authorship network connecting the top 25 collaborators of S.C. Choo. A scholar is included among the top collaborators of S.C. Choo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S.C. Choo. S.C. Choo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Tan, L.S., M.S. Leong, & S.C. Choo. (1998). Theory for the determination of backside contact resistance of semiconductor wafers from surface potential measurements. Solid-State Electronics. 42(4). 589–594. 1 indexed citations

Zhou, Xing, et al.. (1998). Numerical investigation of subpicosecond electrical pulse generation by edge illumination of silicon transmission-line gaps. IEEE Journal of Quantum Electronics. 34(1). 171–178. 2 indexed citations

Choo, S.C.. (1996). On space-charge recombination in pn junctions. Solid-State Electronics. 39(2). 308–310. 10 indexed citations

Choo, S.C., et al.. (1992). Theory of the photovoltage at semiconductor surfaces and its application to diffusion length measurements. Solid-State Electronics. 35(3). 269–283. 21 indexed citations

Leong, M.S., S.C. Choo, & L.S. Tan. (1986). Improved variational method for spreading resistance calculations. Solid-State Electronics. 29(1). 67–74. 3 indexed citations

Choo, S.C., et al.. (1983). An efficient numerical scheme for spreading resistance calculations based on the variational method. Solid-State Electronics. 26(8). 723–730. 9 indexed citations

Leong, M.S., S.C. Choo, & L.S. Tan. (1982). The spreading resistance of a homogeneous slab on a high-resistivity substrate: Mixed boundary value solutions. Solid-State Electronics. 25(9). 877–884. 9 indexed citations

Choo, S.C. & M.S. Leong. (1979). A multilayer exponential model for spreading resistance calculations. Solid-State Electronics. 22(4). 405–415. 4 indexed citations

Leong, M.S., S.C. Choo, & L.S. Tan. (1978). The role of source boundary condition in spreading resistance calculations. Solid-State Electronics. 21(7). 933–941. 20 indexed citations

10.

Choo, S.C., M.S. Leong, HuiQi Hong, Linhu Li, & L.S. Tan. (1978). Spreading resistance calculations by the use of Gauss-Laguerre quadrature. Solid-State Electronics. 21(5). 769–774. 11 indexed citations

11.

Leong, M.S., et al.. (1977). Spreading resistance calculations for graded structures based on the uniform flux source boundary condition. Solid-State Electronics. 20(3). 255–264. 11 indexed citations

12.

Leong, M.S., et al.. (1976). The resistance of an infinite slab with a disc electrode as a mixed boundary value problem. Solid-State Electronics. 19(5). 397–401. 17 indexed citations

13.

Choo, S.C., et al.. (1976). On the calculation of spreading resistance correction factors. Solid-State Electronics. 19(7). 561–565. 31 indexed citations

14.

Choo, S.C.. (1973). Theory of a forward-biased diffused-junction p-L-n rectifier—II. Analytical approximations. Solid-State Electronics. 16(2). 197–211. 14 indexed citations

15.

Seidman, Thomas I. & S.C. Choo. (1972). Iterative scheme for computer simulation of semiconductor devices. Solid-State Electronics. 15(11). 1229–1235. 48 indexed citations

16.

Choo, S.C.. (1971). Numerical analysis of a forward-biased step-junction P-L-N diode. IEEE Transactions on Electron Devices. 18(8). 574–586. 12 indexed citations

17.

Choo, S.C.. (1971). Validity of Small-Signal Analysis of Photoelectromagnetic and Photoconductive Effects inp-Type InSb. Physical review. B, Solid state. 3(2). 560–562. 1 indexed citations

18.

Choo, S.C. & R. G. Mazur. (1970). Open circuit voltage decay behavior of junction devices. Solid-State Electronics. 13(5). 553–564. 31 indexed citations

19.

Choo, S.C.. (1970). Carrier Lifetimes in Semiconductors with Two Interacting or Two Independent Recombination Levels. Physical review. B, Solid state. 1(2). 687–696. 31 indexed citations

20.

Choo, S.C. & E.L. Heasell. (1962). Technique for the Measurement of Short Carrier Lifetimes. Review of Scientific Instruments. 33(12). 1331–1334. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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