Satoshi Gonda

1.4k total citations
82 papers, 1.1k citations indexed

About

Satoshi Gonda is a scholar working on Atomic and Molecular Physics, and Optics, Mechanical Engineering and Computational Mechanics. According to data from OpenAlex, Satoshi Gonda has authored 82 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Atomic and Molecular Physics, and Optics, 34 papers in Mechanical Engineering and 26 papers in Computational Mechanics. Recurrent topics in Satoshi Gonda's work include Advanced Measurement and Metrology Techniques (33 papers), Force Microscopy Techniques and Applications (28 papers) and Surface Roughness and Optical Measurements (26 papers). Satoshi Gonda is often cited by papers focused on Advanced Measurement and Metrology Techniques (33 papers), Force Microscopy Techniques and Applications (28 papers) and Surface Roughness and Optical Measurements (26 papers). Satoshi Gonda collaborates with scholars based in Japan, China and Germany. Satoshi Gonda's co-authors include Ichiko Misumi, Tomizo Kurosawa, Mamoru Yoshimoto, Hirotoshi Nagata, Tadashi Tsukahara, Hideomi Koinuma, Kiyoshi Takamasu, Kentaro Sugawara, Akiko Hirai and Qiangxian Huang and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Satoshi Gonda

80 papers receiving 1.0k citations

Peers

Satoshi Gonda
Ludger Koenders Germany
Hans‐Ulrich Danzebrink Germany
Ndubuisi G. Orji United States
Tsukasa Watanabe Japan
J. Grzanna Germany
Shaowei Zhu China
Masahiro Okaji Japan
Florian Pollinger Germany
Takeshi Araki Japan
Glenn M. Beheim United States
Ludger Koenders Germany
Satoshi Gonda
Citations per year, relative to Satoshi Gonda Satoshi Gonda (= 1×) peers Ludger Koenders

Countries citing papers authored by Satoshi Gonda

Since Specialization
Citations

This map shows the geographic impact of Satoshi Gonda's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Satoshi Gonda with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Satoshi Gonda more than expected).

Fields of papers citing papers by Satoshi Gonda

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Satoshi Gonda. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Satoshi Gonda. The network helps show where Satoshi Gonda may publish in the future.

Co-authorship network of co-authors of Satoshi Gonda

This figure shows the co-authorship network connecting the top 25 collaborators of Satoshi Gonda. A scholar is included among the top collaborators of Satoshi Gonda based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Satoshi Gonda. Satoshi Gonda is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hori, Y. & Satoshi Gonda. (2023). Error investigation for SI traceable pitch calibration of one-dimensional grating by grazing-incidence small-angle X-ray scattering. Measurement. 225. 114036–114036. 2 indexed citations
2.
Misumi, Ichiko, et al.. (2023). Developmental framework of line edge roughness reference standards for next-generation functional micro-/nanostructures. Precision Engineering. 83. 152–158. 2 indexed citations
3.
Misumi, Ichiko, et al.. (2023). Photoresist shrinkage observation by a metrological tilting-AFM. 3–3. 1 indexed citations
4.
Misumi, Ichiko, et al.. (2023). Effect of white noise on roughness measurements of self-affine fractals. Measurement Science and Technology. 34(10). 105003–105003. 1 indexed citations
5.
Misumi, Ichiko, et al.. (2021). Evaluating SEM-based LER metrology using a metrological tilting-AFM. 35–35. 1 indexed citations
6.
Misumi, Ichiko, et al.. (2020). A standard used for probe-tip diameter evaluation in surface roughness measurements using metrological atomic force microscope. Measurement Science and Technology. 31(9). 94005–94005. 3 indexed citations
7.
Takahashi, Kayori, John A. Kramar, Natalia Farkas, et al.. (2019). Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instruments. Metrologia. 56(5). 55002–55002. 15 indexed citations
8.
9.
Misumi, Ichiko, et al.. (2019). Extension of the range of profile surface roughness measurements using metrological atomic force microscope. Precision Engineering. 56. 321–329. 17 indexed citations
10.
Takahashi, Kayori, et al.. (2014). Recent activity of international comparison for nanoparticle size measurement. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9232. 92320L–92320L. 8 indexed citations
11.
Gonda, Satoshi, et al.. (2012). Accurate measurement of orthogonality of equal-period, two-dimensional gratings by an interferometric method. Metrologia. 49(3). 236–244. 14 indexed citations
12.
Sugawara, Kentaro, et al.. (2011). Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJ. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8036. 80360U–80360U. 1 indexed citations
13.
Gonda, Satoshi, et al.. (2006). Critical-Dimension Measurement using Multi-Angle-Scanning Method in Atomic Force Microscope. Japanese Journal of Applied Physics. 45(7R). 5928–5928. 20 indexed citations
14.
Huang, Qiangxian, et al.. (2005). Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement. Sensors and Actuators A Physical. 125(2). 590–596. 5 indexed citations
15.
Gonda, Satoshi, et al.. (2005). Simple, real-time method for removing the cyclic error of a homodyne interferometer with a quadrature detector system. Applied Optics. 44(17). 3492–3492. 52 indexed citations
16.
Misumi, Ichiko, Satoshi Gonda, Tomizo Kurosawa, et al.. (2005). Reliability of parameters of associated base straight line in step height samples: Uncertainty evaluation in step height measurements using nanometrological AFM. Precision Engineering. 30(1). 13–22. 29 indexed citations
17.
Jin, Jonghan, Ichiko Misumi, Satoshi Gonda, & Tomizo Kurosawa. (2004). Pitch Measurement of 150 ㎚ 1D-grating Standards Using an Nano-metrological Atomic Force Microscope. International Journal of Precision Engineering and Manufacturing. 5(3). 19–25. 2 indexed citations
18.
Gonda, Satoshi, et al.. (1999). Accurate topographic images using a measuring atomic force microscope. Applied Surface Science. 144-145. 505–509. 20 indexed citations
19.
20.
Tsukahara, Tadashi, Mamoru Yoshimoto, Hirotoshi Nagata, et al.. (1991). Preparation of SrCuO film in ultra-high vacuum system. Solid State Ionics. 49. 183–186. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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