S. Vandenberghe

413 total citations
39 papers, 192 citations indexed

About

S. Vandenberghe is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, S. Vandenberghe has authored 39 papers receiving a total of 192 indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 4 papers in Biomedical Engineering. Recurrent topics in S. Vandenberghe's work include Radio Frequency Integrated Circuit Design (14 papers), Electromagnetic Compatibility and Noise Suppression (10 papers) and Microwave and Dielectric Measurement Techniques (10 papers). S. Vandenberghe is often cited by papers focused on Radio Frequency Integrated Circuit Design (14 papers), Electromagnetic Compatibility and Noise Suppression (10 papers) and Microwave and Dielectric Measurement Techniques (10 papers). S. Vandenberghe collaborates with scholars based in Belgium, United States and Netherlands. S. Vandenberghe's co-authors include Dominique Schreurs, Bart Nauwelaers, E.P. Vandamme, Jan Verspecht, G. Carchon, W. De Raedt, David De Roest, Karen Maex, G. Borghs and Erik De Win and has published in prestigious journals such as IEEE Transactions on Microwave Theory and Techniques, Physics Letters A and IEEE Electron Device Letters.

In The Last Decade

S. Vandenberghe

35 papers receiving 166 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Vandenberghe Belgium 8 180 27 27 18 8 39 192
A. Birafane Canada 9 306 1.7× 49 1.8× 19 0.7× 9 0.5× 27 311
Andrea Ghilioni Italy 11 411 2.3× 12 0.4× 24 0.9× 32 1.8× 16 414
J.L. Tauritz Netherlands 10 247 1.4× 26 1.0× 22 0.8× 45 2.5× 47 258
P. Weger Germany 13 467 2.6× 25 0.9× 44 1.6× 63 3.5× 45 472
James Victory United States 11 315 1.8× 13 0.5× 12 0.4× 31 1.7× 31 327
W. McFarland United States 8 309 1.7× 26 1.0× 8 0.3× 44 2.4× 15 315
Wenfeng Liang China 9 206 1.1× 11 0.4× 28 1.0× 17 0.9× 15 217
R. Williams United States 9 400 2.2× 6 0.2× 23 0.9× 26 1.4× 2 0.3× 22 409
Robert F. Kalman United States 9 281 1.6× 18 0.7× 93 3.4× 13 0.7× 1 0.1× 23 295
Chung-Hsun Lin United States 12 304 1.7× 6 0.2× 14 0.5× 28 1.6× 1 0.1× 26 322

Countries citing papers authored by S. Vandenberghe

Since Specialization
Citations

This map shows the geographic impact of S. Vandenberghe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Vandenberghe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Vandenberghe more than expected).

Fields of papers citing papers by S. Vandenberghe

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Vandenberghe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Vandenberghe. The network helps show where S. Vandenberghe may publish in the future.

Co-authorship network of co-authors of S. Vandenberghe

This figure shows the co-authorship network connecting the top 25 collaborators of S. Vandenberghe. A scholar is included among the top collaborators of S. Vandenberghe based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Vandenberghe. S. Vandenberghe is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Schreurs, Dominique, et al.. (2005). Time domain rf characterisation of a thin-film metamorphic hemt under modulated backside illumination. 21. 53–58. 1 indexed citations
2.
Schreurs, Dominique, et al.. (2004). Influence of De-Embedding on the Extraction Sensitivity of SiGe HBT. 83–86. 2 indexed citations
3.
Vandenberghe, S., Dominique Schreurs, G. Carchon, Bart Nauwelaers, & W. De Raedt. (2004). Identifying error-box parameters from the twelve-term vector network analyzer error model. 157–165. 7 indexed citations
4.
Schreurs, Dominique, et al.. (2003). Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements. 2. 753–756. 1 indexed citations
5.
Vandenberghe, S., Dominique Schreurs, G. Carchon, Bart Nauwelaers, & W. De Raedt. (2002). S-parameter Reciprocity Relations, Normalization, and TLR Error Box Completion. 1 indexed citations
6.
Nauwelaers, Bart, et al.. (2002). Accurate analytic expressions for frequency-dependent inductance and resistance of single on-chip interconnects on conductive silicon substrate. Physics Letters A. 293(3-4). 195–198. 6 indexed citations
7.
Schreurs, Dominique, et al.. (2002). ANN Model For SiGe HBTs Constructed From Time-Domain Large-Signal Measurements. AMS Acta (University of Bologna). 47(11). 85–88. 9 indexed citations
8.
Roest, David De, S. Vandenberghe, Michele Stucchi, et al.. (2002). Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate. IEEE Electron Device Letters. 23(2). 103–104. 1 indexed citations
9.
Schreurs, Dominique, S. Vandenberghe, G. Carchon, et al.. (2002). Evaluation of non-linear modelling techniques for MOSFETs based on vectorial large-signal measurements. 2. 429–432. 2 indexed citations
10.
Schreurs, Dominique, et al.. (2002). Critical look at direct extraction of small signal equivalent circuit models for Si/SiGe HBT. 1 indexed citations
11.
Schreurs, Dominique, et al.. (2002). Optical Control of a Backside Illuminated Thin-Film Metamorphic HEMT. AMS Acta (University of Bologna). 6 indexed citations
12.
Nauwelaers, Bart, et al.. (2002). Frequency-dependent internal inductance associated with silicon substrate of on-chip interconnects. 1 indexed citations
13.
Schreurs, Dominique, S. Vandenberghe, & E.P. Vandamme. (2001). Thorough verification of large-signal RF MOSFET models by means of vectorial large-signal measurements. International Conference Mixed Design of Integrated Circuits and Systems. 41–44.
14.
Nauwelaers, Bart, et al.. (2001). CAD-oriented analytic formulas for self and mutual capacitance of interconnects on an Si-SiO2 substrate. 1 indexed citations
15.
Vandenberghe, S., Dominique Schreurs, G. Carchon, Bart Nauwelaers, & W. De Raedt. (2001). Characteristic impedance extraction using calibration comparison. IEEE Transactions on Microwave Theory and Techniques. 49(12). 2573–2579. 9 indexed citations
16.
Carchon, G., P. Pieters, S. Brebels, et al.. (2000). Design-oriented measurement-based scaleable models for multilayer MCM-D integrated passives. Implementation in a design libary offering automated layout. 196–201. 14 indexed citations
17.
Schreurs, Dominique, E.P. Vandamme, S. Vandenberghe, G. Carchon, & Bart Nauwelaers. (2000). Verification of Non-Linear MOSFET Models by Intermodulation Measurements Under Loadpull Conditions. 1–5. 1 indexed citations
18.
Schreurs, Dominique, et al.. (1999). IM3 Suppression Using a Technology Independent Method Based on Vectorial Large-Signal Measurements. 1–7. 1 indexed citations
19.
Carchon, G., Bart Nauwelaers, S. Vandenberghe, & Dominique Schreurs. (1998). Simultaneous Power and Noise Optimization of Active Circulators. 385–390. 2 indexed citations
20.
Bosselaers, Antoon, et al.. (1996). A fast software implementation for arithmetic operations in GF$(2^n)$. Lecture notes in computer science. 1163. 65–76. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by A. Birafane Breakdown of academic impact, for papers by Andrea Ghilioni Breakdown of academic impact, for papers by J.L. Tauritz Breakdown of academic impact, for papers by P. Weger Breakdown of academic impact, for papers by James Victory Breakdown of academic impact, for papers by W. McFarland Breakdown of academic impact, for papers by Wenfeng Liang Breakdown of academic impact, for papers by R. Williams Breakdown of academic impact, for papers by Robert F. Kalman Breakdown of academic impact, for papers by Chung-Hsun Lin
Rankless by CCL
2026