Ruey-Lin Chern
- Atomic and Molecular Physics, and Optics top 5%
- Electronic, Optical and Magnetic Materials top 5%
- Biomedical Engineering top 10%
- Electrical and Electronic Engineering
- Aerospace Engineering top 5%
- Co-authors
- Chien C. ChangChien‐Cheng ChangHoang Yan LinChia-Hung LinXingxiang LiuYu-Tang ChenChien-Cheng ChangPo‐Han Chang
- Topics
- Metamaterials and Metasurfaces Applications (34 papers)Photonic Crystals and Applications (29 papers)Plasmonic and Surface Plasmon Research (27 papers)
In The Last Decade
Ruey-Lin Chern
69 papers receiving 924 citations
Peers
Comparison fields: 5 of 55
- Atomic and Molecular Physics, and Optics 510
- Electronic, Optical and Magnetic Materials 484
- Biomedical Engineering 416
- Electrical and Electronic Engineering 244
- Aerospace Engineering 218
Countries citing papers authored by Ruey-Lin Chern
This map shows the geographic impact of Ruey-Lin Chern's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ruey-Lin Chern with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ruey-Lin Chern more than expected).
Fields of papers citing papers by Ruey-Lin Chern
This network shows the impact of papers produced by Ruey-Lin Chern. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ruey-Lin Chern. The network helps show where Ruey-Lin Chern may publish in the future.
Co-authorship network of co-authors of Ruey-Lin Chern
This figure shows the co-authorship network connecting the top 25 collaborators of Ruey-Lin Chern. A scholar is included among the top collaborators of Ruey-Lin Chern based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ruey-Lin Chern. Ruey-Lin Chern is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 6 | |
| 5 | 7 | |
| 6 | 7 | |
| 7 | 6 | |
| 8 | 3 | |
| 9 | 5 | |
| 10 | 5 | |
| 11 | 3 | |
| 12 | 7 | |
| 13 | 3 | |
| 14 | 4 | |
| 15 | 12 | |
| 16 | 35 | |
| 17 | 6 | |
| 18 | 16 | |
| 19 | 59 | |
| 20 | 29 |
About Ruey-Lin Chern
Ruey-Lin Chern is a scholar working on Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films, having authored 72 papers that have together received 991 indexed citations. Recurring topics across this work include Metamaterials and Metasurfaces Applications (34 papers), Photonic Crystals and Applications (29 papers) and Plasmonic and Surface Plasmon Research (27 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (484 citations), Atomic and Molecular Physics, and Optics (510 citations) and Surfaces, Coatings and Films (105 citations). Ruey-Lin Chern has collaborated with scholars based in Taiwan, Hong Kong and China. Frequent co-authors include Chien C. Chang, Chien‐Cheng Chang, Hoang Yan Lin, Chia-Hung Lin, Xingxiang Liu, Yu-Tang Chen, Chien-Cheng Chang, Po‐Han Chang, Yung‐Chiang Lan and Chih‐Yu Kuo. Their work appears in journals such as Journal of Applied Physics, Journal of Fluid Mechanics and Physical Review B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.