Remco Geurts

599 total citations
24 papers, 484 citations indexed

About

Remco Geurts is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Remco Geurts has authored 24 papers receiving a total of 484 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 10 papers in Biomedical Engineering and 9 papers in Materials Chemistry. Recurrent topics in Remco Geurts's work include Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advanced Electron Microscopy Techniques and Applications (7 papers) and Ion-surface interactions and analysis (5 papers). Remco Geurts is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advanced Electron Microscopy Techniques and Applications (7 papers) and Ion-surface interactions and analysis (5 papers). Remco Geurts collaborates with scholars based in Netherlands, United States and United Kingdom. Remco Geurts's co-authors include J. Ringnalda, L. A. Giannuzzi, Timothy L. Burnett, Philip J. Withers, Sarah J. Haigh, Sara Bals, W. Tirry, D. Schryvers, Zhiqing Yang and Thomas J. A. Slater and has published in prestigious journals such as Chemical Reviews, SHILAP Revista de lepidopterología and Scientific Reports.

In The Last Decade

Remco Geurts

23 papers receiving 471 citations

Peers

Remco Geurts

EEE

J. Ringnalda United States

D. Bultreys France

S. R. Brown United States

HL Fraser United States

Aaron Kobler Germany

Robert Schwarzer Germany

G. Lefranc Germany

A. Tkachuk United States

Arantxa Vilalta‐Clemente United Kingdom

Kentaro Kajiwara Japan

J. Ringnalda United States

Remco Geurts

196 ×1.2

154 ×1.0

EEE

229 ×1.6

121 ×1.0

161 ×1.7

Citations per year, relative to Remco Geurts Remco Geurts (= 1×) peers J. Ringnalda

Countries citing papers authored by Remco Geurts

Since Specialization

Citations

This map shows the geographic impact of Remco Geurts's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Remco Geurts with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Remco Geurts more than expected).

Fields of papers citing papers by Remco Geurts

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Remco Geurts. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Remco Geurts. The network helps show where Remco Geurts may publish in the future.

Co-authorship network of co-authors of Remco Geurts

This figure shows the co-authorship network connecting the top 25 collaborators of Remco Geurts. A scholar is included among the top collaborators of Remco Geurts based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Remco Geurts. Remco Geurts is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Liu, Zhao, Shuang Bai, Sven Burke, et al.. (2025). FIB-SEM: Emerging Multimodal/Multiscale Characterization Techniques for Advanced Battery Development. Chemical Reviews. 125(11). 5228–5281. 5 indexed citations

Geurts, Remco, et al.. (2024). Revolutionizing Electron Microscopy Through Intuitive Language-Driven Interfaces: The Emergence of the EM CoPilot. SHILAP Revista de lepidopterología. 129. 10018–10018.

Lamb, J., Kira M. Pusch, Andrew Polonsky, et al.. (2023). Analysis of the high cracking resistance of a Co Ni superalloy during laser additive manufacturing. Scripta Materialia. 239. 115770–115770. 6 indexed citations

Gholinia, A., Jack Donoghue, Alistair Garner, et al.. (2023). Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy. Ultramicroscopy. 257. 113903–113903. 5 indexed citations

Jiao, Chengge, et al.. (2023). Ultra-short Pulse Laser Ablation for Cross-section of Auto Body Paints. Microscopy and Microanalysis. 29(Supplement_1). 2077–2078. 2 indexed citations

Echlin, McLean P., Andrew Polonsky, W.C. Lenthe, et al.. (2022). Observations of Damage, Defects, and Structuring in Femtosecond Laser Ablated Surfaces. Microscopy and Microanalysis. 28(S1). 872–873. 1 indexed citations

Garner, Alistair, Jack Donoghue, Remco Geurts, et al.. (2022). Large-scale serial sectioning of environmentally assisted cracks in 7xxx Al alloys using femtosecond laser-PFIB. Materials Characterization. 188. 111890–111890. 10 indexed citations

Geurts, Remco. (2022). Preparing High-Quality Cross-Section Surfaces by Ultrashort Pulse Laser Ablation and Plasma FIB. Microscopy and Microanalysis. 28(S1). 874–875. 1 indexed citations

Lamb, J., McLean P. Echlin, Andrew Polonsky, et al.. (2022). Merging Machine Learning and TriBeam Tomography for 3D Defect Detection in an AM CoNi-Based Superalloy. Microscopy and Microanalysis. 28(S1). 862–863. 1 indexed citations

10.

Echlin, McLean P., Andrew Polonsky, J. Lamb, et al.. (2021). Recent Developments in Femtosecond Laser-Enabled TriBeam Systems. JOM. 73(12). 4258–4269. 26 indexed citations

11.

Polonsky, Andrew, Toby Francis, Kira M. Pusch, et al.. (2020). 3D Characterization of a Novel CoNi-superalloy for Additive Manufacturing. Microscopy and Microanalysis. 26(S2). 1688–1690. 1 indexed citations

12.

Winiarski, B., Remco Geurts, Steven Randolph, et al.. (2019). Advances in Multi-Beam and Multi-Ion FIB-SEM for 3D Correlative Microscopy. Microscopy and Microanalysis. 25(S2). 870–871. 2 indexed citations

13.

Randolph, Steven, et al.. (2019). Femtosecond Laser-Enabled TriBeam as a Platform for Analysis of Thermally- and Charge-Sensitive Materials. Microscopy and Microanalysis. 25(S2). 352–353. 5 indexed citations

14.

Slater, Thomas J. A., G. Bertali, Remco Geurts, et al.. (2017). Multiscale correlative tomography: an investigation of creep cavitation in 316 stainless steel. Scientific Reports. 7(1). 7332–7332. 39 indexed citations

15.

Burnett, Timothy L., Samuel McDonald, A. Gholinia, et al.. (2014). Correlative Tomography. Scientific Reports. 4(1). 4711–4711. 126 indexed citations

16.

Burnett, Timothy L., Remco Geurts, H. Jazaeri, et al.. (2014). Multiscale 3D analysis of creep cavities in AISI type 316 stainless steel. Materials Science and Technology. 31(5). 522–534. 25 indexed citations

17.

Bailey, Russell J., et al.. (2013). Evaluating focused ion beam induced damage in soft materials. Micron. 50. 51–56. 35 indexed citations

18.

Bals, Sara, W. Tirry, Remco Geurts, Zhiqing Yang, & D. Schryvers. (2007). High-Quality Sample Preparation by Low kV FIB Thinning for Analytical TEM Measurements. Microscopy and Microanalysis. 13(2). 80–86. 77 indexed citations

19.

Giannuzzi, L. A., Remco Geurts, & J. Ringnalda. (2005). 2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon. Microscopy and Microanalysis. 11(S02). 80 indexed citations

20.

Du, Haishun, P.K. Datta, I.A. Inman, Remco Geurts, & Christian Kübel. (2003). Microscopy of wear affected surface produced during sliding of Nimonic 80A against Stellite 6 at 20 °C. Materials Science and Engineering A. 357(1-2). 412–422. 27 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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